المؤلفون
Bernard Paquette, Bouraoui Ilahi, Vincent Aimez, Richard Arès
تاريخ النشر
2013/11/15
مجلة
Journal of Crystal Growth
المجلد
383
الصفحات
30-35
الناشر
North-Holland
الوصف
Abstract The surface morphology and incorporation behavior of heavily Te-doped GaAs
were studied for various growth parameters by chemical beam epitaxy (CBE). The Te
precursor, DIPTe (diisopropyl telluride), acts as a volatile dopant in the growth temperature
range of 475–595 C. Electrical activation of Te is increased for lower growth temperatures.
The Te surfactant effect was shown to lead to three-dimensional growth, which greatly
affected the resulting surface morphology. We have shown that growth parameters can be …
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