Structural Fingerprints in Temperature-dependent Hall Measurements after Ion Implantation Amorphization and Recrystallization of InGaAsP/InP
المؤلفون
Richard Arès André Fekecs, Bouraoui Ilahi, Martin Chicoine
تاريخ النشر
2013
المؤتمر
The 25th International Conference on Amorphous and Nano-crystalline Semiconductors August 18–23, 2013 Toronto, Ontario Canada
الناشر
http://www.icans25.org/Program/Tu-B3/