| A study of tapered 3-D TSVs for power and thermal integrity A Todri, S Kundu, P Girard, A Bosio, L Dilillo, A Virazel IEEE Transactions on Very Large Scale Integration (VLSI) Systems 21 (2), 306-319, 2012 | 77 | 2012 |
| Advanced test methods for SRAMs: effective solutions for dynamic fault detection in nanoscaled technologies A Bosio, L Dilillo, P Girard, S Pravossoudovitch, A Virazel Springer Science & Business Media, 2009 | 74* | 2009 |
| Using TMR architectures for yield improvement J Vial, A Bosio, P Girard, C Landrault, S Pravossoudovitch, A Virazel 2008 IEEE International Symposium on Defect and Fault Tolerance of VLSI …, 2008 | 68 | 2008 |
| Lifting: A flexible open-source fault simulator A Bosio, G Di Natale 2008 17th Asian Test Symposium, 35-40, 2008 | 53 | 2008 |
| March AB, March AB1: new March tests for unlinked dynamic memory faults A Benso, A Bosio, S Di Carlo, G Di Natale, P Prinetto IEEE International Conference on Test, 2005., 8 pp.-841, 2005 | 45 | 2005 |
| Multiple cell upset classification in commercial SRAMs G Tsiligiannis, L Dilillo, A Bosio, P Girard, S Pravossoudovitch, A Todri, ... IEEE Transactions on Nuclear Science 61 (4), 1747-1754, 2014 | 40 | 2014 |
| Statistical reliability estimation of microprocessor-based systems A Savino, S Di Carlo, G Politano, A Benso, A Bosio, G Di Natale IEEE Transactions on Computers 61 (11), 1521-1534, 2011 | 39 | 2011 |
| A functional verification based fault injection environment A Benso, A Bosio, S Di Carlo, R Mariani 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI …, 2007 | 32 | 2007 |
| Testing a commercial MRAM under neutron and alpha radiation in dynamic mode G Tsiligiannis, L Dilillo, A Bosio, P Girard, A Todri, A Virazel, SS McClure, ... IEEE Transactions on Nuclear Science 60 (4), 2617-2622, 2013 | 31 | 2013 |
| Derric: A tool for unified logic diagnosis A Rousset, A Bosio, P Girard, C Landrault, S Pravossoudovitch, A Virazel 12th IEEE European Test Symposium (ETS'07), 13-20, 2007 | 30 | 2007 |
| Automatic March tests generation for static and dynamic faults in SRAMs A Benso, A Bosio, S Di Carlo, G Di Natale, P Prinetto European Test Symposium (ETS'05), 122-127, 2005 | 30 | 2005 |
| A functional power evaluation flow for defining test power limits during at-speed delay testing M Valka, A Bosio, L Dilillo, P Girard, S Pravossoudovitch, A Virazel, ... 2011 Sixteenth IEEE European Test Symposium, 153-158, 2011 | 24 | 2011 |
| Is triple modular redundancy suitable for yield improvement? J Vial, A Virazel, A Bosio, P Girard, C Landrault, S Pravossoudovitch IET computers & digital techniques 3 (6), 581-592, 2009 | 24 | 2009 |
| Dynamic test methods for COTS SRAMs G Tsiligiannis, L Dilillo, V Gupta, A Bosio, P Girard, A Virazel, H Puchner, ... IEEE Transactions on Nuclear Science 61 (6), 3095-3102, 2014 | 23 | 2014 |
| Cross-layer system reliability assessment framework for hardware faults A Vallero, A Savino, G Politano, S Di Carlo, A Chatzidimitriou, S Tselonis, ... 2016 IEEE International Test Conference (ITC), 1-10, 2016 | 22 | 2016 |
| Analysis of resistive-bridging defects in SRAM core-cells: A comparative study from 90nm down to 40nm technology nodes RA Fonseca, L Dilillo, A Bosio, P Girard, S Pravossoudovitch, A Virazel, ... 2010 15th IEEE European Test Symposium, 132-137, 2010 | 22 | 2010 |
| March test generation revealed A Benso, A Bosio, S Di Carlo, G Di Natale, P Prinetto IEEE Transactions on Computers 57 (12), 1704-1713, 2008 | 22 | 2008 |
| Exploring the impact of functional test programs re-used for power-aware testing A Touati, A Bosio, L Dilillo, P Girard, A Virazel, P Bernardi, MS Reorda 2015 Design, Automation & Test in Europe Conference & Exhibition (DATE …, 2015 | 21 | 2015 |
| A modular memory BIST for optimized memory repair P Öhler, A Bosio, G Di Natale, S Hellebrand 2008 14th IEEE International On-Line Testing Symposium, 171-172, 2008 | 21 | 2008 |
| Globally constrained locally optimized 3-D power delivery networks A Todri-Sanial, S Kundu, P Girard, A Bosio, L Dilillo, A Virazel IEEE Transactions on very large scale Integration (VLSI) Systems 22 (10 …, 2013 | 19 | 2013 |
