Fernanda Lima Kastensmidt
Fernanda Lima Kastensmidt
Professor de Ciência da Computação, Universidade Federal do Rio Grande do Sul
Adresse e-mail validée de inf.ufrgs.br - Page d'accueil
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Fault-tolerance techniques for SRAM-based FPGAs
FL Kastensmidt, L Carro, RA da Luz Reis
Springer, 2006
2842006
On the optimal design of triple modular redundancy logic for SRAM-based FPGAs
FL Kastensmidt, L Sterpone, L Carro, MS Reorda
Design, Automation and Test in Europe, 1290-1295, 2005
2682005
Designing fault tolerant systems into SRAM-based FPGAs
F Lima, L Carro, R Reis
Design Automation Conference, 2003. Proceedings, 650-655, 2003
1842003
Included in Your Digital Subscription Designing fault tolerant systems into SRAM-based FPGAs
F Lima, L Carro, R Reis
Design Automation Conference, 2003. Proceedings, 650-655, 2003
184*2003
Designing fault-tolerant techniques for SRAM-based FPGAs
FG de Lima Kastensmidt, G Neuberger, RF Hentschke, L Carro, R Reis
IEEE Design & Test of Computers 21 (6), 552-562, 2004
1592004
A fault injection analysis of Virtex FPGA TMR design methodology
F Lima, C Carmichael, J Fabula, R Padovani, R Reis
Radiation and Its Effects on Components and Systems, 2001. 6th European …, 2001
1542001
Analyzing area and performance penalty of protecting different digital modules with Hamming code and triple modular redundancy
R Hentschke, F Marques, F Lima, L Carro, A Susin, R Reis
Integrated Circuits and Systems Design, 2002. Proceedings. 15th Symposium on …, 2002
1372002
Using bulk built-in current sensors to detect soft errors
EH Neto, I Ribeiro, M Vieira, G Wirth, FL Kastensmidt
Ieee Micro 26 (5), 10-18, 2006
1212006
A high-fault-coverage approach for the test of data, control and handshake interconnects in mesh networks-on-chip
É Cota, FL Kastensmidt, M Cassel, M Hervé, P Almeida, P Meirelles, ...
IEEE Transactions on Computers 57 (9), 1202-1215, 2008
872008
Single event transients in logic circuits—load and propagation induced pulse broadening
G Wirth, FL Kastensmidt, I Ribeiro
IEEE Transactions on Nuclear Science 55 (6), 2928-2935, 2008
792008
Dependable network-on-chip router able to simultaneously tolerate soft errors and crosstalk
AP Frantz, FL Kastensmidt, L Carro, E Cota
2006 IEEE International Test Conference, 1-9, 2006
742006
An automatic technique for optimizing Reed-Solomon codes to improve fault tolerance in memories
G Neuberger, FG de Lima Kastensmidt, R Reis
IEEE design & test of computers 22 (1), 50-58, 2005
592005
Using benchmarks for radiation testing of microprocessors and FPGAs
H Quinn, WH Robinson, P Rech, M Aguirre, A Barnard, M Desogus, ...
IEEE Transactions on Nuclear Science 62 (6), 2547-2554, 2015
572015
Synchronizing triple modular redundant designs in dynamic partial reconfiguration applications
C Pilotto, JR Azambuja, FL Kastensmidt
Proceedings of the 21st annual symposium on Integrated circuits and system …, 2008
562008
Designing and testing fault-tolerant techniques for sram-based fpgas
FL Kastensmidt, G Neuberger, L Carro, R Reis
Proceedings of the 1st conference on Computing frontiers, 419-432, 2004
552004
Crosstalk-and SEU-aware networks on chips
AP Frantz, M Cassel, FL Kastensmidt, É Cota, L Carro
IEEE Design & Test of Computers 24 (4), 340-350, 2007
512007
Analyzing the impact of single-event-induced charge sharing in complex circuits
S Pagliarini, F Kastensmidt, L Entrena, A Lindoso, E San Millan
IEEE Transactions on Nuclear Science 58 (6), 2768-2775, 2011
492011
Detecting SEEs in microprocessors through a non-intrusive hybrid technique
JR Azambuja, Â Lapolli, L Rosa, FL Kastensmidt
IEEE Transactions on Nuclear Science 58 (3), 993-1000, 2011
452011
Reconfigurable routers for low power and high performance
D Matos, C Concatto, M Kreutz, F Kastensmidt, L Carro, A Susin
IEEE Transactions on very large scale integration (VLSI) systems 19 (11 …, 2010
442010
Modeling the sensitivity of CMOS circuits to radiation induced single event transients
GI Wirth, MG Vieira, EH Neto, FL Kastensmidt
Microelectronics reliability 48 (1), 29-36, 2008
422008
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