| A propagation concept of negative bias temperature instability along the channel length in p-type metal oxide field effect transistor B Djezzar, H Tahi, A Benabdelmoumene, A Chenouf Solid-state electronics 82, 46-53, 2013 | 32 | 2013 |
| Experimental investigation of NBTI degradation in power VDMOS transistors under low magnetic field H Tahi, C Tahanout, M Boubaaya, B Djezzar, SM Merah, B Nadji, ... IEEE Transactions on Device and Materials Reliability 17 (1), 99-105, 2017 | 25 | 2017 |
| Investigation of interface, shallow and deep oxide traps under NBTI stress using charge pumping technique H Tahi, B Djezzar, A Benabdelmoumene, A Chenouf, M Goudjil Microelectronics Reliability 54 (5), 882-888, 2014 | 20 | 2014 |
| A new procedure for eliminating the geometric component from charge pumping: Application for NBTI and radiation issues H Tahi, B Djezzar, A Benabdelmoumene Microelectronics Reliability 53 (4), 513-519, 2013 | 19 | 2013 |
| Reliability study of a system dedicated to renewable energies by using stochastic petri nets: application to photovoltaic (PV) system I Mahdi, S Chalah, B Nadji Energy Procedia 136, 513-520, 2017 | 18 | 2017 |
| On the permanent component profiling of the negative bias temperature instability in p-MOSFET devices B Djezzar, H Tahi, A Benabdelmoumene, A Chenouf, M Goudjil, Y Kribes Solid-State Electronics 106, 54-62, 2015 | 15 | 2015 |
| A new method for negative bias temperature instability assessment in P-channel metal oxide semiconductor transistors B Djezzar, H Tahi, A Benabdelmoumene, A Chenouf, Y Kribes Japanese Journal of Applied Physics 51 (11R), 116602, 2012 | 15 | 2012 |
| Radiation Effect Evaluation in Effective Short and Narrow Channel of LDD-Transistor with LOCOS-Isolation Using OTCP Method, BDBN H.TAHI. IEEE Trans. Device Mater.Rel.,Vol no1, ISSN : 1530-4388 10 (01), pp.108-115, 2010 | 15 | 2010 |
| Using oxide-trap charge-pumping method in radiation-reliability analysis of short lightly doped drain transistor B Djezzar, H Tahi IEEE Transactions on Device and Materials Reliability 10 (1), 18-25, 2009 | 15 | 2009 |
| Modeling and Simulation of Charge- Pumping Characteristics for LDD-MOSFET Devices with LOCOS Isolation H. TAHI, B. DJEZZAR, and B. NADJI IEEE Trans. Elec. Dev, ISSN: 0018-9383 57 (No.11,), pp. 2892 - 2901, 2010 | 12* | 2010 |
| Geometric component in constant-amplitude charge-pumping characteristics of LOCOS-and LDD-MOSFET devices H Tahi, B Djezzar, A Benabdelmoumen, B Nadji, Y Kribes IEEE Transactions on Device and Materials Reliability 11 (1), 131-140, 2010 | 10 | 2010 |
| Study of the reliability of static converter for photovoltaic application F Khelifi, B Nadji, Y Chelali Energy Procedia 74, 564-574, 2015 | 9 | 2015 |
| Reliability analysis of CMOS inverter subjected to AC & DC NBTI stresses A Chenouf, B Djezzar, A Benadelmoumene, H Tahi, M Goudjil 2014 9th International Design and Test Symposium (IDT), 142-146, 2014 | 8 | 2014 |
| Investigation of NBTI degradation on power VDMOS transistors under magnetic field H Tahi, K Benmessai, JM Le Floch, M Boubaaya, C Tahanout, B Djezzar, ... 2014 IEEE International Integrated Reliability Workshop Final Report (IIRW …, 2014 | 8 | 2014 |
| Deep experimental investigation of NBTI impact on CMOS inverter reliability A Chenouf, B Djezzar, A Benadelmoumene, H Tahi 2012 24th International Conference on Microelectronics (ICM), 1-4, 2012 | 8 | 2012 |
| Low magnetic field Impact on NBTI degradation SM Merah, B Nadji, H Tahi Microelectronics Reliability 55 (9-10), 1460-1463, 2015 | 7 | 2015 |
| Does PMOS Vth shift wholly capture the degradation of CMOS inverter circuit under DC NBTI? A Chenouf, B Djezzar, A Benabedelmoumene, H Tahi 2012 IEEE International Integrated Reliability Workshop Final Report, 191-194, 2012 | 7 | 2012 |
| Contribution To The Functional And Dysfunctional Analysis Of The Photovoltaic Systems NB MAHDI. I the 3rd International Renewable & Sustainable Energy Conference (IRSEC’2015 …, 2015 | 6 | 2015 |
| Universal low/medium speed I/sup 2/C-slave transceiver: a detailed VLSI implementation AK Oudjida, A Liacha, D Benamrouche, M Goudjil, R Tiar, A Ouchabane International Conference on Design and Test of Integrated Systems in …, 2006 | 6 | 2006 |
| Development and design of Helmholtz coil for NBTI degradation studies SM Merah, B Nadji 2017 5th International Conference on Electrical Engineering-Boumerdes (ICEE …, 2017 | 5 | 2017 |
