| Electromagnetic fault injection: towards a fault model on a 32-bit microcontroller N Moro, A Dehbaoui, K Heydemann, B Robisson, E Encrenaz 2013 Workshop on Fault Diagnosis and Tolerance in Cryptography, 77-88, 2013 | 217 | 2013 |
| When clocks fail: On critical paths and clock faults M Agoyan, JM Dutertre, D Naccache, B Robisson, A Tria International conference on smart card research and advanced applications …, 2010 | 210 | 2010 |
| Electromagnetic transient faults injection on a hardware and a software implementations of AES A Dehbaoui, JM Dutertre, B Robisson, A Tria 2012 Workshop on Fault Diagnosis and Tolerance in Cryptography, 7-15, 2012 | 207 | 2012 |
| A proposition for correlation power analysis enhancement TH Le, J Clédière, C Canovas, B Robisson, C Servière, JL Lacoume International Workshop on Cryptographic Hardware and Embedded Systems, 174-186, 2006 | 153 | 2006 |
| Contactless electromagnetic active attack on ring oscillator based true random number generator P Bayon, L Bossuet, A Aubert, V Fischer, F Poucheret, B Robisson, ... International Workshop on Constructive Side-Channel Analysis and Secure …, 2012 | 146 | 2012 |
| Formal verification of a software countermeasure against instruction skip attacks N Moro, K Heydemann, E Encrenaz, B Robisson Journal of Cryptographic Engineering 4 (3), 145-156, 2014 | 106 | 2014 |
| Differential behavioral analysis B Robisson, P Manet International Workshop on Cryptographic Hardware and Embedded Systems, 413-426, 2007 | 78 | 2007 |
| Injection of transient faults using electromagnetic pulses Practical results on a cryptographic system A Dehbaoui, JM Dutertre, B Robisson, P Orsatelli, P Maurine, A Tria ACR Cryptology ePrint Archive (2012), 2012 | 77 | 2012 |
| Local and direct em injection of power into cmos integrated circuits F Poucheret, K Tobich, M Lisarty, L Chusseauz, B Robissonx, P Maurine 2011 Workshop on Fault Diagnosis and Tolerance in Cryptography, 100-104, 2011 | 62 | 2011 |
| A side-channel and fault-attack resistant AES circuit working on duplicated complemented values M Doulcier-Verdier, JM Dutertre, J Fournier, JB Rigaud, B Robisson, ... 2011 IEEE International Solid-State Circuits Conference, 274-276, 2011 | 57 | 2011 |
| A DFA on AES based on the entropy of error distributions R Lashermes, G Reymond, JM Dutertre, J Fournier, B Robisson, A Tria 2012 Workshop on Fault Diagnosis and Tolerance in Cryptography, 34-43, 2012 | 55 | 2012 |
| Hardware Trojan detection by delay and electromagnetic measurements XT Ngo, I Exurville, S Bhasin, JL Danger, S Guilley, Z Najm, JB Rigaud, ... 2015 Design, Automation & Test in Europe Conference & Exhibition (DATE), 782-787, 2015 | 51 | 2015 |
| Investigation of timing constraints violation as a fault injection means L Zussa, JM Dutertre, J Clédiere, B Robisson, A Tria 27th Conference on Design of Circuits and Integrated Systems (DCIS), Avignon …, 2012 | 50 | 2012 |
| Experimental evaluation of two software countermeasures against fault attacks N Moro, K Heydemann, A Dehbaoui, B Robisson, E Encrenaz 2014 IEEE International Symposium on Hardware-Oriented Security and Trust …, 2014 | 35 | 2014 |
| Compilation of a countermeasure against instruction-skip fault attacks T Barry, D Couroussé, B Robisson Proceedings of the Third Workshop on Cryptography and Security in Computing …, 2016 | 34 | 2016 |
| Resilient hardware Trojans detection based on path delay measurements I Exurville, L Zussa, JB Rigaud, B Robisson 2015 IEEE International Symposium on Hardware Oriented Security and Trust …, 2015 | 32 | 2015 |
| Review of fault injection mechanisms and consequences on countermeasures design JM Dutertre, JJA Fournier, AP Mirbaha, D Naccache, JB Rigaud, ... 2011 6th International Conference on Design & Technology of Integrated …, 2011 | 28 | 2011 |
| Experimental validation of a Bulk Built-In Current Sensor for detecting laser-induced currents C Champeix, N Borrel, JM Dutertre, B Robisson, M Lisart, A Sarafianos 2015 IEEE 21st International On-Line Testing Symposium (IOLTS), 150-155, 2015 | 24 | 2015 |
| Analysis of the fault injection mechanism related to negative and positive power supply glitches using an on-chip voltmeter L Zussa, JM Dutertre, J Clediere, B Robisson 2014 IEEE International Symposium on Hardware-Oriented Security and Trust …, 2014 | 24 | 2014 |
| ElectroMagnetic analysis (EMA) of software AES on Java mobile phones D Aboulkassimi, M Agoyan, L Freund, J Fournier, B Robisson, A Tria 2011 IEEE International Workshop on Information Forensics and Security, 1-6, 2011 | 24 | 2011 |
Jean-Max DutertreProfessor, Microelectronic, Ecole Nationale Supérieure des Mines de Saint-EtienneAdresse e-mail validée de emse.fr
