Haralampos-G. Stratigopoulos
Haralampos-G. Stratigopoulos
Sorbonne Université, CNRS, LIP6
Verified email at lip6.fr
Title
Cited by
Cited by
Year
Error moderation in low-cost machine-learning-based analog/RF testing
HG Stratigopoulos, Y Makris
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2008
1322008
Defect filter for alternate RF test
HG Stratigopoulos, S Mir, E Acar, S Ozev
2010 15th IEEE European Test Symposium, 265-270, 2010
922010
Non-RF to RF test correlation using learning machines: A case study
HGD Stratigopoulos, P Drineas, M Slamani, Y Makris
25th IEEE VLSI Test Symposium (VTS'07), 9-14, 2007
872007
Nonlinear decision boundaries for testing analog circuits
HGD Stratigopoulos, Y Makris
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2005
722005
Evaluation of analog/RF test measurements at the design stage
HG Stratigopoulos, S Mir, A Bounceur
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2009
712009
RF specification test compaction using learning machines
HG Stratigopoulos, P Drineas, M Slamani, Y Makris
IEEE Transactions on Very Large Scale Integration (VLSI) Systems 18 (6), 998 …, 2009
642009
Sensors for built-in alternate RF test
L Abdallah, HG Stratigopoulos, C Kelma, S Mir
2010 15th IEEE European Test Symposium, 49-54, 2010
612010
Diagnosis of local spot defects in analog circuits
K Huang, HG Stratigopoulos, S Mir, C Hora, Y Xing, B Kruseman
IEEE Transactions on Instrumentation and Measurement 61 (10), 2701-2712, 2012
522012
Fault diagnosis of analog circuits based on machine learning
K Huang, HG Stratigopoulos, S Mir
2010 Design, Automation & Test in Europe Conference & Exhibition (DATE 2010 …, 2010
492010
Adaptive alternate analog test
HG Stratigopoulos, S Mir
IEEE Design & Test of Computers 29 (4), 71-79, 2012
482012
Estimation of analog parametric test metrics using copulas
A Bounceur, S Mir, HG Stratigopoulos
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2011
442011
Test metrics model for analog test development
HG Stratigopoulos
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2012
402012
Enrichment of limited training sets in machine-learning-based analog/RF test
HG Stratigopoulos, S Mir, Y Makris
2009 Design, Automation & Test in Europe Conference & Exhibition, 1668-1673, 2009
352009
Fast Monte Carlo-based estimation of analog parametric test metrics
HG Stratigopoulos, S Sunter
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2014
332014
Defect-oriented non-intrusive RF test using on-chip temperature sensors
L Abdallah, HG Stratigopoulos, S Mir, J Altet
2013 IEEE 31st VLSI Test Symposium (VTS), 1-6, 2013
332013
Experiences with non-intrusive sensors for RF built-in test
L Abdallah, HG Stratigopoulos, S Mir, C Kelma
2012 IEEE International Test Conference, 1-8, 2012
322012
An adaptive checker for the fully differential analog code
HGD Stratigopoulos, Y Makris
IEEE Journal of Solid-State Circuits 41 (6), 1421-1429, 2006
322006
Analog neural network design for RF built-in self-test
D Maliuk, HG Stratigopoulos, H Huang, Y Makris
2010 IEEE International Test Conference, 1-10, 2010
292010
Machine learning applications in IC testing
HG Stratigopoulos
2018 IEEE 23rd European Test Symposium (ETS), 1-10, 2018
262018
RF front-end test using built-in sensors
L Abdallah, HG Stratigopoulos, S Mir, C Kelma
IEEE Design & Test of Computers 28 (6), 76-84, 2011
262011
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