A 2.6 nW, 0.45 V temperature-compensated subthreshold CMOS voltage reference L Magnelli, F Crupi, P Corsonello, C Pace, G Iannaccone
IEEE Journal of Solid-State Circuits 46 (2), 465-474, 2010
332 2010 Evolution of depression and anxiety symptoms in parents of very preterm infants during the newborn period CC Pace, AJ Spittle, CML Molesworth, KJ Lee, EA Northam, JLY Cheong, ...
JAMA pediatrics 170 (9), 863-870, 2016
223 2016 Australian standards of care and treatment guidelines for transgender and gender diverse children and adolescents MM Telfer, MA Tollit, CC Pace, KC Pang
Medical Journal of Australia 209 (3), 132-136, 2018
222 2018 P Magnone, F Crupi, G Giusi, C Pace, E Simoen, C Claeys, L Pantisano, ...
IEEE Transactions on Device and Materials Reliability 9 (2), 180-189, 2009
139 2009 Embedded DSP-based telehealth radar system for remote in-door fall detection C Garripoli, M Mercuri, P Karsmakers, PJ Soh, G Crupi, ...
IEEE journal of biomedical and health informatics 19 (1), 92-101, 2014
113 2014 Neurobehaviour between birth and 40 weeks’ gestation in infants born< 30 weeks’ gestation and parental psychological wellbeing: predictors of brain development and child outcomes AJ Spittle, DK Thompson, NC Brown, K Treyvaud, JLY Cheong, KJ Lee, ...
BMC pediatrics 14, 1-13, 2014
71 2014 Impact of the interfacial layer on the low-frequency noise (1/f) behavior of MOSFETs with advanced gate stacks F Crupi, P Srinivasan, P Magnone, E Simoen, C Pace, D Misra, C Claeys
IEEE Electron Device Letters 27 (8), 688-691, 2006
69 2006 Comparative study of drain and gate low-frequency noise in nMOSFETs with hafnium-based gate dielectrics G Giusi, F Crupi, C Pace, C Ciofi, G Groeseneken
IEEE Transactions on Electron Devices 53 (4), 823-828, 2006
69 2006 Humidity sensing properties of Li–iron oxide based thin films G Neri, A Bonavita, S Galvagno, C Pace, S Patanè, A Arena
Sensors and Actuators B: Chemical 73 (2-3), 89-94, 2001
57 2001 Positive bias temperature instability in nMOSFETs with ultra-thin Hf-silicate gate dielectrics F Crupi, C Pace, G Cocorullo, G Groeseneken, M Aoulaiche, M Houssa
Microelectronic Engineering 80, 130-133, 2005
54 2005 Least square regression method for estimating gas concentration in an electronic nose system W Khalaf, C Pace, M Gaudioso
Sensors 9 (3), 1678-1691, 2009
51 2009 Influence of fathers' early parenting on the development of children born very preterm and full term GE McMahon, MM Spencer-Smith, CC Pace, AJ Spittle, P Stedall, ...
The Journal of pediatrics 205, 195-201, 2019
48 2019 New generation non-stationary portable neutron generators for biophysical applications of Neutron Activation Analysis N Marchese, A Cannuli, MT Caccamo, C Pace
Biochimica et Biophysica Acta (BBA)-General Subjects 1861 (1), 3661-3670, 2017
45 2017 Matching performance of FinFET devices with fin widths down to 10 nm P Magnone, A Mercha, V Subramanian, P Parvais, N Collaert, M Dehan, ...
IEEE electron device letters 30 (12), 1374-1376, 2009
44 2009 How to enlarge the bandwidth without increasing the noise in OP-AMP-based transimpedance amplifier C Ciofi, F Crupi, C Pace, G Scandurra
IEEE transactions on instrumentation and measurement 55 (3), 814-819, 2006
42 2006 What are the health outcomes of trans and gender diverse young people in Australia? Study protocol for the Trans20 longitudinal cohort study MA Tollit, CC Pace, M Telfer, M Hoq, J Bryson, N Fulkoski, C Cooper, ...
BMJ open 9 (11), e032151, 2019
35 2019 Analytical model for the 1∕ f noise in the tunneling current through metal-oxide-semiconductor structures F Crupi, G Giusi, G Iannaccone, P Magnone, C Pace, E Simoen, C Claeys
Journal of Applied Physics 106 (7), 2009
35 2009 A new circuit topology for the realization of very low-noise wide-bandwidth transimpedance amplifier C Ciofi, F Crupi, C Pace, G Scandurra, M Patanè
IEEE Transactions on Instrumentation and Measurement 56 (5), 1626-1631, 2007
35 2007 Posttraumatic stress symptoms in mothers and fathers of very preterm infants over the first 2 years CC Pace, PJ Anderson, KJ Lee, AJ Spittle, K Treyvaud
Journal of Developmental & Behavioral Pediatrics 41 (8), 612-618, 2020
34 2020 Room-temperature single-electron effects in silicon nanocrystal memories C Pace, F Crupi, S Lombardo, C Gerardi, G Cocorullo
Applied Physics Letters 87 (18), 2005
34 2005 