FASER: Fast analysis of soft error susceptibility for cell-based designs B Zhang, WS Wang, M Orshansky Proceedings of the 7th International Symposium on Quality Electronic Design …, 2006 | 237 | 2006 |
Leakage power reduction by dual-Vth designs under probabilistic analysis of Vth variation M Liu, WS Wang, M Orshansky Low Power Electronics and Design, 2004. ISLPED'04. Proceedings of the 2004 …, 2004 | 52 | 2004 |
Statistical timing based on incomplete probabilistic descriptions of parameter uncertainty WS Wang, V Kreinovich, M Orshansky Proceedings of the 43rd annual Design Automation Conference, 161-166, 2006 | 33 | 2006 |
Robust estimation of parametric yield under limited descriptions of uncertainty WS Wang, M Orshansky Proceedings of the 2006 IEEE/ACM international conference on Computer-aided …, 2006 | 20 | 2006 |
Interval-based robust statistical techniques for non-negative convex functions, with application to timing analysis of computer chips M Orshansky, WS Wang, M Ceberio, G Xiang Proceedings of the 2006 ACM symposium on Applied computing, 1645-1649, 2006 | 20 | 2006 |
Path-based statistical timing analysis handling arbitrary delay correlations: Theory and implementation WS Wang, M Orshansky IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2006 | 12 | 2006 |
Statistical analysis of circuit timing using majorization M Orshansky, WS Wang Communications of the ACM 52 (8), 95-100, 2009 | 4 | 2009 |
Estimation of leakage power consumption and parametric yield based on realistic probabilistic descriptions of parameters WS Wang, M Orshansky Journal of Low Power Electronics 3 (1), 1-12, 2007 | 1 | 2007 |
Analysis of Leakage Power Reduction in Dual-Vth Technologies in the Presence of Large Threshold Voltage Variation WS Wang, M Liu, M Orshansky Journal of Low Power Electronics 2 (1), 1-7, 2006 | 1 | 2006 |