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Coauteurs
- Siddharth RajanElectrical and Computer Engineering, Ohio State UniversityAdresse e-mail validée de ece.osu.edu
- Digbijoy NathAssociate Professor at Indian Institute of ScienceAdresse e-mail validée de iisc.ac.in
- Sriram KrishnamoorthyUniversity of California, Santa BarbaraAdresse e-mail validée de ucsb.edu
- Fatih AkyolYıldız Teknik ÜniversitesiAdresse e-mail validée de yildiz.edu.tr
- Sanyam BajajIntel CorporationAdresse e-mail validée de intel.com
- Zhichao YangDepartment of Electrical and Computer Engineering, The Ohio State UniversityAdresse e-mail validée de ece.osu.edu
- Wu Lu, ProfessorThe Ohio State UniversityAdresse e-mail validée de osu.edu
- Masihhur LaskarUniversity of Wisconsin-MadisonAdresse e-mail validée de wisc.edu
- Emre GÜRProf., Department of Physics, Faculty of Science, Eskişehir Osmangazi University, 26480, MeşelikAdresse e-mail validée de ogu.edu.tr
- Jacob B KhurginJohns Hopkins UniversityAdresse e-mail validée de jhu.edu
- Omor ShoronSoftware Reaserch Engineer (Compact Device Modeling), Intel CorporationAdresse e-mail validée de intel.com
- Roberto C. MyersProfessor of Materials Science, Electrical Engineering, and Physics, The Ohio State UniversityAdresse e-mail validée de osu.edu
- Nitin P. PadtureOtis E. Randall University Professor, Brown UniversityAdresse e-mail validée de brown.edu
- Yuh-Renn WuProfessor of Electrical Engineering, National Taiwan UniversityAdresse e-mail validée de ntu.edu.tw
- Stacia KellerUniversity of California Santa BarbaraAdresse e-mail validée de ece.ucsb.edu
- Aaron ArehartAssistant Research Professor of Electrical and Computer Engineering, The Ohio State UniversityAdresse e-mail validée de osu.edu
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PIL SUNG PARK
Technology Development Center, Samsung Electronics
Adresse e-mail validée de osu.edu