Chris H. Kim

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Sachin SapatnekarUniversity of MinnesotaAdresse e-mail validée de umn.edu
Kaushik RoyProfessor of Electrical and Computer Engineering, Purdue UniversityAdresse e-mail validée de purdue.edu
Tony Tae-Hyoung KIMAssociate Professor, Nanyang Technological UniversityAdresse e-mail validée de ntu.edu.sg
Pulkit JainAMDAdresse e-mail validée de intel.com
John KeanePrincipal Hardware Engineer, MedtronicAdresse e-mail validée de medtronic.com
Ki Chul ChunSamsung ElectronicsAdresse e-mail validée de samsung.com
Wei ZhangUniversity of MinnesotaAdresse e-mail validée de umn.edu
Luke EversonBroadcom, Inc.Adresse e-mail validée de broadcom.com
Jian-Ping WangDistinguished McKnight University Professor and Robert Hartmann Chair, University of MinnesotaAdresse e-mail validée de umn.edu
Keshab K. ParhiUniversity of Minnesota, Erwin A. Kelen Chair in Electrical EngineeringAdresse e-mail validée de umn.edu
Xiaofei WangUniversity of MinnesotaAdresse e-mail validée de umn.edu
Jie GuProfessor of Electrical Engineering and Computer Science, Northwestern UniversityAdresse e-mail validée de northwestern.edu
C. Daniel FrisbieProfessor of Chemical Engineering and Materials Science, University of MinnesotaAdresse e-mail validée de umn.edu
Chen ZhouUniversity of MinnesotaAdresse e-mail validée de umn.edu
Saibal MukhopadhyayProfessor of Electrical Engineering, Georgia Institute of TechnologyAdresse e-mail validée de ece.gatech.edu
Mingjing HaApple Inc. (present), University of Minnesota (previous)Adresse e-mail validée de philips.com
Mark HersamNorthwestern UniversityAdresse e-mail validée de northwestern.edu
Jongyeon KimUniversity of minnesota, Yonsei universityAdresse e-mail validée de umn.edu
Bongjin KimKAISTAdresse e-mail validée de kaist.ac.kr
Somnath KunduSr. Staff Design Engineer, Xilinx/AMDAdresse e-mail validée de amd.com

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Chris H. Kim

Mcknight Presidential Endowed Chair, University of Minnesota

Adresse e-mail validée de umn.edu - Page d'accueil

Quantum inspired computing circuit reliability radiation effects exploratory circuits


Titre Trier par citations Trier par année Trier par titre	Citée par Citée par	Année
Printed, sub-3V digital circuits on plastic from aqueous carbon nanotube inks M Ha, Y Xia, AA Green, W Zhang, MJ Renn, CH Kim, MC Hersam, ... ACS nano 4 (8), 4388-4395, 2010	463	2010
A scaling roadmap and performance evaluation of in-plane and perpendicular MTJ based STT-MRAMs for high-density cache memory KC Chun, H Zhao, JD Harms, TH Kim, JP Wang, CH Kim IEEE journal of solid-state circuits 48 (2), 598-610, 2012	426	2012
Impact of NBTI on SRAM read stability and design for reliability SV Kumar, KH Kim, SS Sapatnekar 7th International Symposium on Quality Electronic Design (ISQED'06), 6 pp.-218, 2006	410	2006
Silicon odometer: An on-chip reliability monitor for measuring frequency degradation of digital circuits TH Kim, R Persaud, CH Kim IEEE Journal of Solid-State Circuits 43 (4), 874-880, 2008	351	2008
CorNET: Deep learning framework for PPG-based heart rate estimation and biometric identification in ambulant environment D Biswas, L Everson, M Liu, M Panwar, BE Verhoef, S Patki, CH Kim, ... IEEE transactions on biomedical circuits and systems 13 (2), 282-291, 2019	298	2019
NBTI-aware synthesis of digital circuits SV Kumar, CH Kim, SS Sapatnekar Proceedings of the 44th annual Design Automation Conference, 370-375, 2007	285	2007
An analytical model for negative bias temperature instability SV Kumar, CH Kim, SS Sapatnekar Proceedings of the 2006 IEEE/ACM international conference on Computer-aided …, 2006	278	2006
A 0.2 V, 480 kb subthreshold SRAM with 1 k cells per bitline for ultra-low-voltage computing TH Kim, J Liu, J Keane, CH Kim IEEE Journal of Solid-State Circuits 43 (2), 518-529, 2008	276	2008
Aerosol Jet Printed, Low Voltage, Electrolyte Gated Carbon Nanotube Ring Oscillators with Sub-5µs Stage Delays CDF M. Ha, J. Seo, P. Prabhumirashi, W. Zhang, M. Geier, M. Renn, C.H. Kim ... Nano Letters, 2013	275	2013
An all-in-one silicon odometer for separately monitoring HCI, BTI, and TDDB J Keane, X Wang, D Persaud, CH Kim IEEE Journal of Solid-State Circuits 45 (4), 817-829, 2010	239	2010
Printed sub‐2 V gel‐electrolyte‐gated polymer transistors and circuits Y Xia, W Zhang, M Ha, JH Cho, MJ Renn, CH Kim, CD Frisbie Advanced Functional Materials 20 (4), 587-594, 2010	239	2010
Solution-processed carbon nanotube thin-film complementary static random access memory ML Geier, JJ McMorrow, W Xu, J Zhu, CH Kim, TJ Marks, MC Hersam Nature nanotechnology 10 (11), 944-948, 2015	232	2015
Ultra-low power DLMS adaptive filter for hearing aid applications H Kim, K Roy International Symposium on Low Power Electronics and Design, 2001	224	2001
Gate leakage reduction for scaled devices using transistor stacking S Mukhopadhyay, C Neau, RT Cakici, A Agarwal, CH Kim, K Roy IEEE Transactions on Very Large Scale Integration (VLSI) Systems 11 (4), 716-730, 2003	216	2003
A high-density subthreshold SRAM with data-independent bitline leakage and virtual ground replica scheme TH Kim, J Liu, J Keane, CH Kim 2007 IEEE International Solid-State Circuits Conference. Digest of Technical …, 2007	213	2007
Leakage power analysis and reduction for nanoscale circuits A Agarwal, S Mukhopadhyay, A Raychowdhury, K Roy, CH Kim IEeE Micro 26 (2), 68-80, 2006	212	2006
Spin-based computing: Device concepts, current status, and a case study on a high-performance microprocessor J Kim, A Paul, PA Crowell, SJ Koester, SS Sapatnekar, JP Wang, CH Kim Proceedings of the IEEE 103 (1), 106-130, 2014	186	2014
An on-chip NBTI sensor for measuring PMOS threshold voltage degradation J Keane, TH Kim, CH Kim International Symposium on Low Power Electronics and Design, 2007	185	2007
A Voltage Scalable 0.26 V, 64 kb 8T SRAM With V Lowering Techniques and Deep Sleep Mode TH Kim, J Liu, CH Kim IEEE Journal of Solid-State Circuits 44 (6), 1785-1795, 2009	182	2009
Dynamic V/sub TH/scaling scheme for active leakage power reduction CH Kim, K Roy Proceedings 2002 Design, Automation and Test in Europe Conference and …, 2002	180	2002

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