Maximilian Haider
Maximilian Haider
CEOS GmbH
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Electron microscopy image enhanced
M Haider, S Uhlemann, E Schwan, H Rose, B Kabius, K Urban
Nature 392 (6678), 768-769, 1998
11101998
A spherical-aberration-corrected 200 kV transmission electron microscope
M Haider, H Rose, S Uhlemann, E Schwan, B Kabius, K Urban
Ultramicroscopy 75 (1), 53-60, 1998
4871998
Detection of single atoms and buried defects in three dimensions by aberration-corrected electron microscope with 0.5-Å information limit
C Kisielowski, B Freitag, M Bischoff, H Van Lin, S Lazar, G Knippels, ...
Microscopy and Microanalysis 14 (5), 469, 2008
3442008
Towards 0.1 nm resolution with the first spherically corrected transmission electron microscope
M Haider, H Rose, S Uhlemann, B Kabius, K Urban
Microscopy 47 (5), 395-405, 1998
2531998
Correction of the spherical aberration of a 200 kV TEM by means of a hexapole-corrector
M Haider, G Braunshausen, E Schwan
Optik (Stuttgart) 99 (4), 167-179, 1995
2121995
Transmission electron microscopy at 20 kV for imaging and spectroscopy
U Kaiser, J Biskupek, JC Meyer, J Leschner, L Lechner, H Rose, ...
Ultramicroscopy 111 (8), 1239-1246, 2011
2082011
Residual wave aberrations in the first spherical aberration corrected transmission electron microscope
S Uhlemann, M Haider
Ultramicroscopy 72 (3-4), 109-119, 1998
2081998
Upper limits for the residual aberrations of a high-resolution aberration-corrected STEM
M Haider, S Uhlemann, J Zach
Ultramicroscopy 81 (3-4), 163-175, 2000
1862000
Aberration correction in a low voltage SEM by a multipole corrector
J Zach, M Haider
Nuclear Instruments and Methods in Physics Research Section A: Accelerators …, 1995
1851995
Advancing the Hexapole Cs-Corrector for the Scanning Transmission Electron Microscope
H Müller, S Uhlemann, P Hartel, M Haider
Microscopy and Microanalysis 12 (6), 442-455, 2006
1342006
First application of Cc-corrected imaging for high-resolution and energy-filtered TEM
B Kabius, P Hartel, M Haider, H Müller, S Uhlemann, U Loebau, J Zach, ...
Journal of electron microscopy 58 (3), 147-155, 2009
1322009
Information transfer in a TEM corrected for spherical and chromatic aberration
M Haider, P Hartel, H Müller, S Uhlemann, J Zach
Microscopy and Microanalysis 16 (4), 393, 2010
1212010
Prerequisites for a Cc/Cs-corrected ultrahigh-resolution TEM
M Haider, H Müller, S Uhlemann, J Zach, U Loebau, R Hoeschen
Ultramicroscopy 108 (3), 167-178, 2008
1062008
Thermal magnetic field noise limits resolution in transmission electron microscopy
S Uhlemann, H Müller, P Hartel, J Zach, M Haider
Physical review letters 111 (4), 046101, 2013
922013
Correction of spherical and chromatic aberration in a low voltage SEM
J Zach, M Haider
Optik (Stuttgart) 98 (3), 112-118, 1995
881995
Current and future aberration correctors for the improvement of resolution in electron microscopy
M Haider, P Hartel, H Müller, S Uhlemann, J Zach
Philosophical Transactions of the Royal Society A: Mathematical, Physical …, 2009
812009
Chromatic aberration correction for atomic resolution TEM imaging from 20 to 80 kV
M Linck, P Hartel, S Uhlemann, F Kahl, H Müller, J Zach, M Haider, ...
Physical review letters 117 (7), 076101, 2016
772016
Concentration evaluation of chromatin in unstained resin-embedded sections by means of low-dose ratio-contrast imaging in STEM
B Bohrmann, M Haider, E Kellenberger
Ultramicroscopy 49 (1-4), 235-251, 1993
751993
A way to higher resolution: spherical-aberration correction in a 200 kV transmission electron microscope
K Urban, B Kabius, M Haider, H Rose
Microscopy 48 (6), 821-826, 1999
701999
Probing the out-of-plane distortion of single point defects in atomically thin hexagonal boron nitride at the picometer scale
N Alem, OV Yazyev, C Kisielowski, P Denes, U Dahmen, P Hartel, ...
Physical review letters 106 (12), 126102, 2011
672011
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