Yoichi Miyahara
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Cantilever-based sensing: the origin of surface stress and optimization strategies
M Godin, V Tabard-Cossa, Y Miyahara, T Monga, PJ Williams, ...
Nanotechnology 21 (7), 075501, 2010
Detection of single-electron charging in an individual InAs quantum dot by noncontact atomic-force microscopy
R Stomp, Y Miyahara, S Schaer, Q Sun, H Guo, P Grutter, S Studenikin, ...
Physical review letters 94 (5), 056802, 2005
Strong electromechanical coupling of an atomic force microscope cantilever to a quantum dot
SD Bennett, L Cockins, Y Miyahara, P Grütter, AA Clerk
Physical review letters 104 (1), 017203, 2010
Energy levels of few-electron quantum dots imaged and characterized by atomic force microscopy
L Cockins, Y Miyahara, SD Bennett, AA Clerk, S Studenikin, P Poole, ...
Proceedings of the National Academy of Sciences 107 (21), 9496-9501, 2010
From tunneling to point contact: Correlation between forces and current
Y Sun, H Mortensen, S Schär, AS Lucier, Y Miyahara, P Grütter, W Hofer
Physical Review B 71 (19), 193407, 2005
Decoupling conservative and dissipative forces in frequency modulation atomic force microscopy
A Labuda, Y Miyahara, L Cockins, PH Grütter
Physical Review B 84 (12), 125433, 2011
Non-contact atomic force microscope with a PZT cantilever used for deflection sensing, direct oscillation and feedback actuation
Y Miyahara, M Deschler, T Fujii, S Watanabe, H Bleuler
Applied surface science 188 (3-4), 450-455, 2002
Retrofitting an atomic force microscope with photothermal excitation for a clean cantilever response in low Q environments
A Labuda, K Kobayashi, Y Miyahara, P Grütter
Review of Scientific Instruments 83 (5), 053703, 2012
Determination of the local contact potential difference of PTCDA on NaCl: a comparison of techniques
SA Burke, JM LeDue, Y Miyahara, JM Topple, S Fostner, P Grütter
Nanotechnology 20 (26), 264012, 2009
Minimum threshold for incipient plasticity in the atomic-scale nanoindentation of Au (111)
W Paul, D Oliver, Y Miyahara, PH Grütter
Physical review letters 110 (13), 135506, 2013
Lead zirconate titanate cantilever for noncontact atomic force microscopy
Y Miyahara, T Fujii, S Watanabe, A Tonoli, S Carabelli, H Yamada, ...
Applied surface science 140 (3-4), 428-431, 1999
Refined tip preparation by electrochemical etching and ultrahigh vacuum treatment to obtain atomically sharp tips for scanning tunneling microscope and atomic force microscope
T Hagedorn, ME Ouali, W Paul, D Oliver, Y Miyahara, P Grütter
Review of Scientific Instruments 82 (11), 113903, 2011
Measurement of surface photovoltage by atomic force microscopy under pulsed illumination
Z Schumacher, Y Miyahara, A Spielhofer, P Grutter
Physical Review Applied 5 (4), 044018, 2016
The limit of time resolution in frequency modulation atomic force microscopy by a pump-probe approach
Z Schumacher, A Spielhofer, Y Miyahara, P Grutter
Applied Physics Letters 110 (5), 053111, 2017
Tip-induced artifacts in magnetic force microscopy images
O Iglesias-Freire, JR Bates, Y Miyahara, A Asenjo, PH Grütter
Applied Physics Letters 102 (2), 022417, 2013
Stochastic noise in atomic force microscopy
A Labuda, M Lysy, W Paul, Y Miyahara, P Grütter, R Bennewitz, M Sutton
Physical Review E 86 (3), 031104, 2012
Controlled deposition of gold nanodots using non-contact atomic force microscopy
ME Pumarol, Y Miyahara, R Gagnon, P Grütter
Nanotechnology 16 (8), 1083, 2005
Quantum state readout of individual quantum dots by electrostatic force detection
Y Miyahara, A Roy-Gobeil, P Grutter
Nanotechnology 28 (6), 064001, 2017
Conductivity of an atomically defined metallic interface
DJ Oliver, J Maassen, M El Ouali, W Paul, T Hagedorn, Y Miyahara, Y Qi, ...
Proceedings of the National Academy of Sciences 109 (47), 19097-19102, 2012
Implementation of atomically defined field ion microscopy tips in scanning probe microscopy
W Paul, Y Miyahara, P Grütter
Nanotechnology 23 (33), 335702, 2012
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