| Determination of yield stress from nano-indentation experiments A Clausner, F Richter European Journal of Mechanics-A/Solids 51, 11-20, 2015 | 65 | 2015 |
| Fully printed zinc oxide electrolyte-gated transistors on paper JT Carvalho, V Dubceac, P Grey, I Cunha, E Fortunato, R Martins, ... Nanomaterials 9 (2), 169, 2019 | 43 | 2019 |
| Mid-frequency PECVD of a-SiCN: H films and their structural, mechanical and electrical properties S Peter, M Günther, S Berg, A Clausner, F Richter Vacuum 90, 155-159, 2013 | 35 | 2013 |
| Numerical and experimental study of the mechanical response of diatom frustules E Topal, H Rajendran, I Zgłobicka, J Gluch, Z Liao, A Clausner, ... Nanomaterials 10 (5), 959, 2020 | 19 | 2020 |
| Anisotropy of Mechanical Properties of Pinctada margaritifera Mollusk Shell M Strąg, Ł Maj, M Bieda, P Petrzak, A Jarzębska, J Gluch, E Topal, ... Nanomaterials 10 (4), 634, 2020 | 19 | 2020 |
| Mechanical characterization of porous nano-thin films by use of atomic force acoustic microscopy M Kopycinska-Müller, A Clausner, KB Yeap, B Köhler, N Kuzeyeva, ... Ultramicroscopy 162, 82-90, 2016 | 19 | 2016 |
| Quantitative analysis of backscattered electron (BSE) contrast using low voltage scanning electron microscopy (LVSEM) and its application to Al0. 22Ga0. 78N/GaN layers AG Cid, R Rosenkranz, M Löffler, A Clausner, Y Standke, E Zschech Ultramicroscopy 195, 47-52, 2018 | 11 | 2018 |
| Fundamental limitations at the determination of initial yield stress using nano-indentation with spherical tips A Clausner, F Richter European Journal of Mechanics-A/Solids 58, 69-75, 2016 | 10 | 2016 |
| Crack identification and evaluation in BEoL stacks of two different samples utilizing acoustic emission testing and nano X-ray computed tomography J Silomon, J Gluch, A Clausner, J Paul, E Zschech Microelectronics Reliability 121, 114137, 2021 | 9 | 2021 |
| Usage of the concept of the effectively shaped indenter for the determination of yield stress from Berkovich nano-indentation experiments A Clausner, F Richter European Journal of Mechanics-A/Solids 53, 294-302, 2015 | 9 | 2015 |
| In-situ X-ray tomographic imaging and controlled steering of microcracks in 3D nanopatterned structures K Kutukova, J Gluch, M Kraatz, A Clausner, E Zschech Materials & Design 221, 110946, 2022 | 7 | 2022 |
| Impact of mechanical strain on 22 nm FDSOI device performance using nanoindentation S Schlipf, A Clausner, J Paul, S Capecchi, G Kurz, E Zschech 2019 IEEE International Integrated Reliability Workshop (IIRW), 1-4, 2019 | 7 | 2019 |
| Direct measurement of gaussian distributed radial crystallographic orientations of polycrystalline, layered-oxide secondary particles and their impact on materials utilization … J Wegener, LCX Ho, V Glavas, JE Mueller, S Höhn, A Clausner, A Latz Energy Storage Materials 45, 399-411, 2022 | 6 | 2022 |
| Analysis of 28 nm SRAM cell stability under mechanical load applied by nanoindentation A Clausner, S Schlipf, G Kurz, M Otto, J Paul, KU Giering, J Warmuth, ... 2018 IEEE International Reliability Physics Symposium (IRPS), 5B. 1-1-5B. 1-6, 2018 | 6 | 2018 |
| Quantitative analysis of backscattered electron (BSE) contrast using low voltage scanning electron microscopy (LVSEM) and its application to Al0. 22Ga0. 78N/GaN layers A Garitagoitia Cid, R Rosenkranz, M Löffler, A Clausner, Y Standke, ... Ultramicroscopy (Amsterdam) 195, 47-52, 2018 | 6 | 2018 |
| Novel approaches to determine thermomechanical materials data in advanced interconnect stacks E Zschech, M Gall, A Clausner, C Sander, V Sukharev 2016 IEEE International Interconnect Technology Conference/Advanced …, 2016 | 6 | 2016 |
| Stress-induced transistor degradation studied by an indentation approach S Schlipf, A Clausner, J Paul, S Capecchi, L Wambera, K Meier, ... IEEE Transactions on Device and Materials Reliability 21 (1), 9-16, 2020 | 5 | 2020 |
| Crack identification in BEoL stacks using acoustic emission testing and nano x-ray computed tomography J Silomon, J Gluch, A Clausner, J Paul, E Zschech 2020 IEEE International Symposium on the Physical and Failure Analysis of …, 2020 | 5 | 2020 |
| Bewertung von Verfahren zur Fließspannungsbestimmung in der Nanoindentation DIA Clausner | 5 | 2013 |
| Strategy to characterize electromigration short length effects in Cu/low-k interconnects Z Zhang, M Kraatz, M Hauschildt, S Choi, A Clausner, E Zschech, M Gall 2021 IEEE International Reliability Physics Symposium (IRPS), 1-5, 2021 | 4 | 2021 |
