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Co-authors
- Hideaki SoneTohoku UniversityVerified email at tohoku.ac.jp
- Takaaki MizukiTohoku UniversityVerified email at cc.tohoku.ac.jp
- Naofumi HommaTohoku UniversityVerified email at riec.tohoku.ac.jp
- Daisuke FujimotoNara Institute of Science and TechnologyVerified email at is.naist.jp
- Makoto NagataProfessor, Kobe UniversityVerified email at cs.kobe-u.ac.jp
- Noriyuki MiuraOsaka UniversityVerified email at ist.osaka-u.ac.jp
- Masahiro KINUGAWAThe University of FukuchiyamaVerified email at fukuchiyama.ac.jp
- Jean-Luc DangerLTCI, Télécom Paris, Institut Polytechnique de ParisVerified email at enst.fr
- Kazuo SakiyamaThe University of Electro-CommunicationsVerified email at uec.ac.jp
- Youngwoo KimAssociate Professor, Sejong UniversityVerified email at sejong.ac.kr
- Daiki MiyaharaThe University of Electro-CommunicationsVerified email at uec.ac.jp
- Takeshi SugawaraThe University of Electro-CommunicationsVerified email at uec.ac.jp
- Ingrid VerbauwhedeKU LeuvenVerified email at esat.kuleuven.be
- Laurent SauvageInstitut Mines-TélécomVerified email at telecom-paris.fr
- Arthur BeckersKU LeuvenVerified email at esat.kuleuven.be
- Benedikt GierlichsResearch Expert at KU Leuven/COSICVerified email at esat.kuleuven.be
- Josep BalaschKU LeuvenVerified email at kuleuven.be
- Tatsuya MoriProfessor, Waseda UniversityVerified email at nsl.cs.waseda.ac.jp
- Sylvain GUILLEYTELECOM-ParisTechVerified email at secure-ic.com
- Shinichi KawamuraNational Institute of Advanced Industrial Science and Technology (AIST)Verified email at aist.go.jp