Suivre
Karthik Sarpatwari
Karthik Sarpatwari
Penn State University|Micron Technology
Adresse e-mail validée de micron.com
Titre
Citée par
Citée par
Année
Toward increasing FPGA lifetime
S Srinivasan, R Krishnan, P Mangalagiri, Y Xie, V Narayanan, MJ Irwin, ...
IEEE Transactions on Dependable and Secure Computing 5 (2), 115-127, 2008
1112008
A low-power phase change memory based hybrid cache architecture
P Mangalagiri, K Sarpatwari, A Yanamandra, VK Narayanan, Y Xie, ...
Proceedings of the 18th ACM Great Lakes symposium on VLSI, 395-398, 2008
852008
FLAW: FPGA lifetime awareness
S Srinivasan, P Mangalagiri, Y Xie, N Vijaykrishnan, K Sarpatwari
Proceedings of the 43rd annual Design Automation Conference, 630-635, 2006
742006
Extracting the Richardson constant: Schottky diodes
K Sarpatwari, OO Awadelkarim, MW Allen, SM Durbin, SE Mohney
Applied physics letters 94 (24), 242110, 2009
452009
Temperature-dependent properties of nearly ideal ZnO Schottky diodes
MW Allen, X Weng, JM Redwing, K Sarpatwari, SE Mohney, ...
IEEE transactions on electron devices 56 (9), 2160-2164, 2009
412009
Effects of barrier height inhomogeneities on the determination of the Richardson constant
K Sarpatwari, SE Mohney, OO Awadelkarim
Journal of Applied Physics 109 (1), 014510, 2011
272011
Comprehensive understanding on the role of tunnel oxide top nitridation for the reliability of nanoscale flash memory
T Kim, K Sarpatwari, S Koka, H Wang
IEEE Electron Device Letters 34 (3), 396-398, 2013
192013
Extracting the Schottky barrier height from axial contacts to semiconductor nanowires
K Sarpatwari, NS Dellas, OO Awadelkarim, SE Mohney
Solid-state electronics 54 (7), 689-695, 2010
192010
Tunnel Oxide Nitridation Effect on the Evolution of Instabilities (RTS/QED) and Defect Characterization for Sub-40-nm Flash Memory
T Kim, D He, K Morinville, K Sarpatwari, B Millemon, A Goda, J Kessenich
IEEE electron device letters 32 (8), 999-1001, 2011
152011
Modified three terminal charge pumping technique applied to vertical transistor structures
LJ Passmore, K Sarpatwari, SA Suliman, OO Awadelkarim, R Ridley, ...
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 2005
142005
Toward understanding the electrical properties of metal/semiconductor Schottky contacts: The effects of barrier inhomogeneities and geometry in bulk and nanoscale structures
K Sarpatwari
The Pennsylvania State University, 2009
122009
Disturb verify for programming memory cells
K Sarpatwari, A Goda
US Patent 8,638,607, 2014
112014
Voltage stabilizing for a memory cell array
K Sarpatwari, H Wang, R Sanjay
US Patent 9,196,357, 2015
92015
Fowler–Nordheim and hot carrier reliabilities of U-shaped trench-gated transistors studied by three terminal charge pumping
LJ Passmore, K Sarpatwari, SA Suliman, OO Awadelkarim, R Ridley, ...
Thin solid films 504 (1-2), 302-306, 2006
82006
Analysis of current–voltage–temperature characteristics in SiC Schottky diodes using threshold-accepting simulated-annealing techniques
K Sarpatwari, L Passmore, SA Suliman, OO Awadelkarim
Solid-state electronics 51 (5), 644-649, 2007
62007
Minority carrier injection limited current in Re/4H‐SiC Schottky diodes
K Sarpatwari, SE Mohney, S Ashok, OO Awadelkarim
physica status solidi (a) 207 (6), 1509-1513, 2010
52010
Read refresh operation
F Pellizzer, K Sarpatwari, I Tortorelli, NN Gajera
US Patent 11,139,016, 2021
32021
Techniques for applying multiple voltage pulses to select a memory cell
JT Hamada, M Cui, JM McCrate, K Sarpatwari, J Chen
US Patent 10,867,671, 2020
32020
Methods for generating random data using phase change materials and related devices and systems
K Sarpatwari, H Wang, S Rangan
US Patent 9,575,727, 2017
32017
Accessing a multi-level memory cell
K Sarpatwari, XA Tran, J Chen, JA Durand, NN Gajera, YC Lee
US Patent 11,355,209, 2022
22022
Le système ne peut pas réaliser cette opération maintenant. Veuillez réessayer plus tard.
Articles 1–20