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Munhyeon Kim
Munhyeon Kim
Adresse e-mail validée de snu.ac.kr
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Investigation of electrical characteristic behavior induced by channel-release process in stacked nanosheet gate-all-around MOSFETs
S Kim, M Kim, D Ryu, K Lee, S Kim, J Lee, R Lee, S Kim, JH Lee, BG Park
IEEE Transactions on Electron Devices 67 (6), 2648-2652, 2020
382020
Investigation of Sidewall High-k Interfacial Layer Effect in Gate-All-Around Structure
D Ryu, M Kim, J Yu, S Kim, JH Lee, BG Park
IEEE Transactions on Electron Devices 67 (4), 1859-1863, 2020
282020
Design and optimization of triple-k spacer structure in two-stack nanosheet FET from OFF-state leakage perspective
D Ryu, M Kim, S Kim, Y Choi, J Yu, JH Lee, BG Park
IEEE Transactions on Electron Devices 67 (3), 1317-1322, 2020
282020
Semiconductor devices and inverter having the same
MH Kim, CW Noh, KH Cho, MG Kang, S Maeda
US Patent 9,966,376, 2018
242018
Investigation of device performance for fin angle optimization in FinFET and gate-all-around FETs for 3 nm-node and beyond
S Kim, K Lee, S Kim, M Kim, JH Lee, S Kim, BG Park
IEEE Transactions on Electron Devices 69 (4), 2088-2093, 2022
172022
Semiconductor device and method of fabricating the same
JB Kim, M Kim, HS Kim, TJ Park, KH Lee, CW Noh, MTLU QUE, HB Park, ...
US Patent App. 16/037,922, 2019
172019
Semiconductor device having first and second gate electrodes and method of manufacturing the same
Y Dong, MH Kim, KH Cho, S Maeda, HS Oh
US Patent 9,576,959, 2017
172017
Surface Ge-rich p-type SiGe channel tunnel field-effect transistor fabricated by local condensation technique
J Lee, R Lee, S Kim, K Lee, HM Kim, S Kim, M Kim, S Kim, JH Lee, ...
Solid-State Electronics 164, 107701, 2020
162020
Semiconductor devices including contact patterns having a rising portion and a recessed portion
S Park, M Kim, W Kim, K Cho, H Jun, D Kim, HA Daewon
US Patent 9,536,968, 2017
152017
Negative capacitance effect on MOS structure: Influence of electric field variation
K Lee, J Lee, S Kim, R Lee, S Kim, M Kim, JH Lee, S Kim, BG Park
IEEE Transactions on Nanotechnology 19, 168-171, 2020
122020
Double-gated ferroelectric-gate field-effect-transistor for processing in memory
M Kim, K Lee, S Kim, JH Lee, BG Park, D Kwon
IEEE Electron Device Letters 42 (11), 1607-1610, 2021
112021
Semiconductor device
KH Cho, S Park, BH Hong, T Fukai, MH Kim, WG Kim, SH Park, D Kim, ...
US Patent 9,331,199, 2016
112016
Comprehensive TCAD-based validation of interface trap-assisted ferroelectric polarization in ferroelectric-gate field-effect transistor memory
K Lee, S Kim, M Kim, JH Lee, D Kwon, BG Park
IEEE Transactions on Electron Devices 69 (3), 1048-1053, 2022
102022
Semiconductor devices and methods of manufacturing the same
MH Kim, SH Kim, BH Hong, KH Cho, T Fukai, S Maeda, H Fukutome
US Patent App. 15/209,328, 2017
102017
Integrated circuit device
MH Kim, S Whang, CW Noh, D Kim, HS Oh
US Patent 10,396,205, 2019
92019
Analysis on fully depleted negative capacitance field-effect transistor (NCFET) based on electrostatic potential difference
K Lee, J Lee, S Kim, S Kim, M Kim, S Kim, BG Park
2019 Electron Devices Technology and Manufacturing Conference (EDTM), 422-424, 2019
52019
Spiking neural network with weight-sharing synaptic array for multi-input processing
S Song, M Kim, B Jeon, D Ryu, S Kim, K Lee, JH Lee, JJ Kim, W Shim, ...
IEEE Electron Device Letters 43 (10), 1657-1660, 2022
42022
Floating Fin Shaped Stacked Nanosheet MOSFET for Low Power Logic Application
M Kim, S Kim, K Lee, JH Lee, BG Park, D Kwon
IEEE Journal of the Electron Devices Society 11, 95-100, 2023
32023
Ferroelectric Field-Effect Transistor Synaptic Device with Hafnium-silicate Interlayer
SW Kim, W Shin, M Kim, KR Kwon, J Yim, J Kim, C Han, S Jeong, EC Park, ...
IEEE Electron Device Letters, 2023
22023
Investigation on variability of ferroelectric-gate field-effect transistor memory by random spatial distribution of interface trap
K Lee, S Kim, M Kim, JH Lee, BG Park, D Kwon
IEEE Transactions on Nanotechnology 21, 534-538, 2022
22022
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