| Silicon photodiode absolute spectral response self-calibration EF Zalewski, J Geist Applied optics 19 (8), 1214-1216, 1980 | 256 | 1980 |
| The first census optical character recognition systems conf.# NISTIR 4912 R Wilkinson, J Geist, S Janet, P Grother, C Burges, R Creecy, ... The US Bureau of Census and the National Institute of Standards and …, 1992 | 225* | 1992 |
| Quantum efficiency stability of silicon photodiodes R Korde, J Geist Applied Optics 26 (24), 5284-5290, 1987 | 216 | 1987 |
| Spectral response self-calibration and interpolation of silicon photodiodes J Geist, EF Zalewski, AR Schaefer Applied Optics 19 (22), 3795-3799, 1980 | 197 | 1980 |
| Micromachined thermal radiation emitter from a commercial CMOS process M Parameswaran, AM Robinson, DL Blackburn, M Gaitan, J Geist IEEE Electron Device Letters 12 (2), 57-59, 1991 | 134 | 1991 |
| Hybrid postprocessing etching for CMOS-compatible MEMS NH Tea, V Milanović, C Zincke, JS Suehle, M Gaitan, ME Zaghloul, J Geist Microelectromechanical Systems, Journal of 6 (4), 363-372, 1997 | 126 | 1997 |
| Microwave dielectric heating of fluids in an integrated microfluidic device JJ Shah, SG Sundaresan, J Geist, DR Reyes, JC Booth, MV Rao, ... Journal of Micromechanics and Microengineering 17 (11), 2224, 2007 | 114 | 2007 |
| Influence of black coatings on pyroelectric detectors WR Blevin, J Geist Applied optics 13 (5), 1171-1178, 1974 | 113 | 1974 |
| Generalized temperature measurement equations for rhodamine B dye solution and its application to microfluidics JJ Shah, M Gaitan, J Geist Analytical chemistry 81 (19), 8260-8263, 2009 | 103 | 2009 |
| Silicon detector nonlinearity and related effects AR Schaefer, EF Zalewski, J Geist Applied optics 22 (8), 1232-1236, 1983 | 103 | 1983 |
| Stable, high quantum efficiency, UV-enhanced silicon photodiodes by arsenic diffusion R Korde, J Geist Solid-state electronics 30 (1), 89-92, 1987 | 93 | 1987 |
| Capillarity induced solvent-actuated bonding of polymeric microfluidic devices JJ Shah, J Geist, LE Locascio, M Gaitan, MV Rao, WN Vreeland Analytical chemistry 78 (10), 3348-3353, 2006 | 89 | 2006 |
| Quantum efficiency of the pn junction in silicon as an absolute radiometric standard J Geist Applied optics 18 (6), 760-762, 1979 | 86 | 1979 |
| Chopper-stabilized null radiometer based upon an electrically calibrated pyroelectric detector J Geist, WR Blevin Applied optics 12 (11), 2532-2535, 1973 | 81 | 1973 |
| Surface modification of poly (methyl methacrylate) for improved adsorption of wall coating polymers for microchip electrophoresis JJ Shah, J Geist, LE Locascio, M Gaitan, MV Rao, WN Vreeland Electrophoresis 27 (19), 3788-3796, 2006 | 80 | 2006 |
| The near ultraviolet quantum yield of silicon FJ Wilkinson, AJD Farmer, J Geist Journal of applied physics 54 (2), 1172-1174, 1983 | 75 | 1983 |
| The second census optical character recognition systems conference JC Geist, RA Wilkinson, S Janet, PJ Grother, B Hammond, NW Larsen, ... NIST Interagency/Internal Report (NISTIR)-5452, 1994 | 72 | 1994 |
| Inverse Source Problems in Optics\ HP Baltes...[et Al.]. HA Ferwerda, J Geist, BJ Hoenders, HG Schmidt-Weinmar, A Walther, ... Springer, 1978 | 72* | 1978 |
| Complete collection of minority carriers from the inversion layer in induced junction diodes J Geist, E Liang, AR Schaefer Journal of Applied Physics 52 (7), 4879-4881, 1981 | 71 | 1981 |
| High accuracy modeling of photodiode quantum efficiency J Geist, H Baltes Applied optics 28 (18), 3929-3939, 1989 | 65 | 1989 |
Samuel M. StavisNational Institute of Standards and Technology (NIST)Verified email at nist.gov
