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Kaibo Wang
Kaibo Wang
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High-dimensional process monitoring and fault isolation via variable selection
K Wang, W Jiang
Journal of Quality Technology 41 (3), 247, 2009
1762009
Using profile monitoring techniques for a data‐rich environment with huge sample size
K Wang, F Tsung
Quality and Reliability Engineering International 21 (7), 677-688, 2005
1742005
A variable-selection-based multivariate EWMA chart for process monitoring and diagnosis
W Jiang, K Wang, F Tsung
Quality control and applied statistics 58 (5), 443-444, 2013
952013
A variable-selection-based multivariate EWMA chart for process monitoring and diagnosis
W Jiang, K Wang, F Tsung
Journal of Quality Technology 44 (3), 209-230, 2012
952012
A review of reliability research on nanotechnology
SL Jeng, JC Lu, K Wang
Reliability, IEEE Transactions on 56 (3), 401-410, 2007
772007
A review of statistical methods for quality improvement and control in nanotechnology
JC Lu, SL Jeng, K Wang
Journal of Quality Technology 41 (2), 148, 2009
642009
Statistical surface monitoring by spatial-structure modeling
A Wang, F Tsung, K Wang
Quality control and applied statistics 60 (3), 229-232, 2015
532015
Statistical Surface Monitoring by Spatial-Structure Modeling
A Wang, K Wang, F Tsung
Journal of Quality Technology 46 (4), 359, 2014
532014
Monitoring the covariance matrix via penalized likelihood estimation
B Li, K Wang, AB Yeh
IIE Transactions 45 (2), 132-146, 2013
532013
Monitoring Wafer Geometric Quality using Additive Gaussian Process Model
L Zhang, K Wang, N Chen
IIE Transactions, 00-00, 2015
512015
CUSUM and EWMA multi-charts for detecting a range of mean shifts
D Han, F Tsung, X Hu, K Wang
Statistica Sinica 17 (3), 1139, 2007
502007
Adaptive charting techniques: Literature review and extensions
F Tsung, K Wang
Frontiers in Statistical Quality Control 9, 19-35, 2010
442010
Adaptive Charting Techniques
F Tsung, K Wang
Proceedings of the IXth International Workshop on Intelligent Statistical …, 2007
44*2007
Simultaneous monitoring of process mean vector and covariance matrix via penalized likelihood estimation
K Wang, AB Yeh, B Li
Computational Statistics & Data Analysis 78, 206-217, 2014
402014
Monitoring multivariate process variability with individual observations via penalised likelihood estimation
AB Yeh, B Li, K Wang
International Journal of Production Research 50 (22), 6624-6638, 2012
402012
Run-to-run process adjustment using categorical observations
K Wang, F Tsung
Journal of Quality Technology 39 (4), 312-325, 2007
402007
A hierarchical model for characterising spatial wafer variations
L Bao, K Wang, R Jin
International Journal of Production Research 52 (6), 1827-1842, 2014
272014
An adaptive T2 chart for monitoring dynamic systems
K Wang, F Tsung
Journal of Quality Technology 40 (1), 109, 2008
272008
Process adjustment with an asymmetric quality loss function
J Zhang, W Li, K Wang, R Jin
Journal of Manufacturing Systems 33 (1), 159-165, 2014
232014
A general harmonic rule controller for run-to-run process control
F He, K Wang, W Jiang
Semiconductor Manufacturing, IEEE Transactions on 22 (2), 232-244, 2009
232009
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