| Characterization and Modeling of IV, CV and Trapping behavior of SiC Power MOSFETs MS Nazir, A Pampori, YH Zarkob, A Kar, YS Chauhan 2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM), 1-3, 2023 | 1 | 2023 |
| Recent Enhancements in the Standard BSIM-BULK MOSFET Model A Sharma, YH Zarkob, R Goel, CK Dabhi, G Pahwa, C Hu, YS Chauhan 2022 IEEE International Conference on Emerging Electronics (ICEE), 1-6, 2022 | 1 | 2022 |
| Compact Modeling of Impact Ionization and Conductivity Modulation in LDMOS Transistors A Sharma, YH Zarkob, G Pahwa, CK Dabhi, R Goel, H Agarwal, V Kubrak, ... IEEE Transactions on Electron Devices, 2024 | | 2024 |
| Compact Modeling and Experimental Validation of Reverse Mode Impact Ionization in LDMOS Transistors within the BSIM-BULK Framework YH Zarkob, A Sharma, G Pahwa, D Nandi, CK Dabhi, V Kubrak, ... 2024 8th IEEE Electron Devices Technology & Manufacturing Conference (EDTM), 1-3, 2024 | | 2024 |
| Ferroelectric FET based Bayesian Inference Engine for Disease Diagnosis A Chakraborty, YH Zarkob, M Rafiq, S Sahay Authorea Preprints, 2023 | | 2023 |
| Analytical Surface Potential Calculation for Organic Thin-film Transistors YH Zarkob, SA Bhat, SA Ahsan 2021 International Semiconductor Conference (CAS), 165-168, 2021 | | 2021 |
Yogesh S. ChauhanFellow IEEE, FNAE, Professor-IIT KanpurAdresse e-mail validée de iitk.ac.in
