| The dependence of retention time on gate length in UTBOX FBRAM with different source/drain junction engineering T Nicoletti, M Aoulaiche, LM Almeida, SD Santos, JA Martino, A Veloso, ... IEEE electron device letters 33 (7), 940-942, 2012 | 42 | 2012 |
| Influence of the source composition on the analog performance parameters of vertical nanowire-TFETs PGD Agopian, MDV Martino, SD dos Santos, FS Neves, JA Martino, ... IEEE Transactions on Electron Devices 62 (1), 16-22, 2014 | 40 | 2014 |
| Low-frequency noise assessment in advanced UTBOX SOI nMOSFETs with different gate dielectrics SD Dos Santos, B Cretu, V Strobel, JM Routoure, R Carin, JA Martino, ... Solid-state electronics 97, 14-22, 2014 | 36 | 2014 |
| Epileptic seizure prediction from EEG signals using unsupervised learning and a polling-based decision process LAS Kitano, MAA Sousa, SD Santos, R Pires, S Thome-Souza, AB Campo Artificial Neural Networks and Machine Learning–ICANN 2018: 27th …, 2018 | 29 | 2018 |
| On the variability of the front-/back-channel LF noise in UTBOX SOI nMOSFETs SD dos Santos, T Nicoletti, JA Martino, M Aoulaiche, A Veloso, M Jurczak, ... IEEE transactions on electron devices 60 (1), 444-450, 2012 | 27 | 2012 |
| Towards single‐trap spectroscopy: Generation‐recombination noise in UTBOX SOI nMOSFETs E Simoen, B Cretu, W Fang, M Aoulaiche, JM Routoure, R Carin, ... physica status solidi (c) 12 (3), 292-298, 2015 | 22 | 2015 |
| The impact of gate length scaling on UTBOX FDSOI devices: The digital/analog performance of extension-less structures T Nicoletti, S Santos, L Almeida, JA Martino, M Aoulaiche, A Veloso, ... 2012 13th International Conference on Ultimate Integration on Silicon (ULIS …, 2012 | 21 | 2012 |
| Low-frequency noise studies on fully depleted UTBOX silicon-on-insulator nMOSFETs: challenges and opportunities E Simoen, M Aoulaiche, SD Dos Santos, JA Martino, V Strobel, B Cretu, ... ECS Journal of Solid State Science and Technology 2 (11), Q205, 2013 | 15 | 2013 |
| Improved retention times in UTBOX nMOSFETs for 1T-DRAM applications KRA Sasaki, T Nicoletti, LM Almeida, SD dos Santos, A Nissimoff, ... Solid-state electronics 97, 30-37, 2014 | 13 | 2014 |
| NW-TFET analog performance for different Ge source compositions PGD Agopian, SD dos Santos, FS Neves, JA Martino, A Vandooren, ... 2013 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference …, 2013 | 13 | 2013 |
| DIBL study using triple gate unstrained and uniaxial/biaxial strained FinFETs SD Santos, JA Martino, E Simoen, C Claeys ECS Transactions 23 (1), 591, 2009 | 12 | 2009 |
| Analog performance of gate-source/drain underlap triple-gate SOI nMOSFET SD Santos, T Nicoletti, JA Martino ECS Transactions 39 (1), 239, 2011 | 11 | 2011 |
| An FPGA-based SOM circuit architecture for online learning of 64-QAM data streams MAA de Sousa, R Pires, SDS Perseghini, E Del-Moral-Hernandez 2018 International Joint Conference on Neural Networks (IJCNN), 1-8, 2018 | 8 | 2018 |
| Lessons learned from low-frequency noise studies on fully depleted utbox silicon-on-insulator nmosfets ER Simoen, M Aoulaiche, SD Dos Santos, JA Martino, V Strobel, B Cretu, ... ECS Transactions 53 (5), 49, 2013 | 8 | 2013 |
| Impact of selective epitaxial growth and uniaxial/biaxial strain on DIBL effect using triple gate FinFETs SD dos Santos, JA Martino, E Simoen, C Claeys Journal of Integrated Circuits and Systems 5 (2), 154-159, 2010 | 7 | 2010 |
| Potential and limitations of UTBB SOI for advanced CMOS technologies C Claeys, M Aoulaiche, E Simoen, T Nicoletti, SD dos Santos, JA Martino 28th Symposium on Microelectronics Technology and Devices (SBMicro 2013), 1-6, 2013 | 6 | 2013 |
| Differentiation between epileptic and psychogenic nonepileptic seizures in electroencephalogram using wavelets and support-vector machines KR dos Santos, MA de Abreu de Sousa, SD dos Santos, R Pires, ... Applied Artificial Intelligence 36 (1), 2008612, 2022 | 4 | 2022 |
| Low frequency noise assessment in advanced UTBOX SOI n-channel MOSFETs V Strobel, B Cretu, SD dos Santos, E Simoen, JM Routoure, R Carin, ... Workshop of the Thematic Network on Silicon on Insulator technology, devices …, 2013 | 3 | 2013 |
| A computer vision system for pallets verification in quality control MVB de Morais, SD dos Santos, R Pires International Journal of Precision Engineering and Manufacturing 24 (7 …, 2023 | 2 | 2023 |
| Advantages of different source/drain engineering on scaled UTBOX FDSOI nMOSFETs at high temperature operation T Nicoletti, SD dos Santos, JA Martino, M Aoulaiche, A Veloso, M Jurczak, ... Solid-state electronics 91, 53-58, 2014 | 2 | 2014 |
Joao Antonio MartinoUniversity of Sao PauloAdresse e-mail validée de usp.br
