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Sara Dereste dos Santos
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The dependence of retention time on gate length in UTBOX FBRAM with different source/drain junction engineering
T Nicoletti, M Aoulaiche, LM Almeida, SD Santos, JA Martino, A Veloso, ...
IEEE electron device letters 33 (7), 940-942, 2012
412012
Influence of the source composition on the analog performance parameters of vertical nanowire-TFETs
PGD Agopian, MDV Martino, SD dos Santos, FS Neves, JA Martino, ...
IEEE Transactions on Electron Devices 62 (1), 16-22, 2014
302014
Low-frequency noise assessment in advanced UTBOX SOI nMOSFETs with different gate dielectrics
SD Dos Santos, B Cretu, V Strobel, JM Routoure, R Carin, JA Martino, ...
Solid-state electronics 97, 14-22, 2014
302014
On the variability of the front-/back-channel LF noise in UTBOX SOI nMOSFETs
SD dos Santos, T Nicoletti, JA Martino, M Aoulaiche, A Veloso, M Jurczak, ...
IEEE transactions on electron devices 60 (1), 444-450, 2012
262012
Towards single‐trap spectroscopy: Generation‐recombination noise in UTBOX SOI nMOSFETs
E Simoen, B Cretu, W Fang, M Aoulaiche, JM Routoure, R Carin, ...
physica status solidi (c) 12 (3), 292-298, 2015
212015
The impact of gate length scaling on UTBOX FDSOI devices: The digital/analog performance of extension-less structures
T Nicoletti, S Santos, L Almeida, JA Martino, M Aoulaiche, A Veloso, ...
2012 13th International Conference on Ultimate Integration on Silicon (ULIS …, 2012
202012
Low-frequency noise studies on fully depleted UTBOX silicon-on-insulator nMOSFETs: challenges and opportunities
E Simoen, M Aoulaiche, SD Dos Santos, JA Martino, V Strobel, B Cretu, ...
ECS Journal of Solid State Science and Technology 2 (11), Q205, 2013
152013
Epileptic seizure prediction from EEG signals using unsupervised learning and a polling-based decision process
LAS Kitano, MAA Sousa, SD Santos, R Pires, S Thome-Souza, AB Campo
International Conference on Artificial Neural Networks, 117-126, 2018
142018
NW-TFET analog performance for different Ge source compositions
PGD Agopian, SD dos Santos, FS Neves, JA Martino, A Vandooren, ...
2013 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference …, 2013
132013
Improved retention times in UTBOX nMOSFETs for 1T-DRAM applications
KRA Sasaki, T Nicoletti, LM Almeida, SD dos Santos, A Nissimoff, ...
Solid-state electronics 97, 30-37, 2014
122014
DIBL study using triple gate unstrained and uniaxial/biaxial strained FinFETs
SD Santos, JA Martino, E Simoen, C Claeys
ECS Transactions 23 (1), 591, 2009
122009
Analog performance of gate-source/drain underlap triple-gate SOI nMOSFET
SD Santos, T Nicoletti, JA Martino
ECS Transactions 39 (1), 239, 2011
112011
Impact of selective epitaxial growth and uniaxial/biaxial strain on DIBL effect using triple gate FinFETs
SD dos Santos, JA Martino, E Simoen, C Claeys
Journal of Integrated Circuits and Systems 5 (2), 154-159, 2010
72010
Potential and limitations of UTBB SOI for advanced CMOS technologies
C Claeys, M Aoulaiche, E Simoen, T Nicoletti, SD dos Santos, JA Martino
28th Symposium on Microelectronics Technology and Devices (SBMicro 2013), 1-6, 2013
62013
An FPGA-based SOM circuit architecture for online learning of 64-QAM data streams
MAA de Sousa, R Pires, SDS Perseghini, E Del-Moral-Hernandez
2018 International Joint Conference on Neural Networks (IJCNN), 1-8, 2018
52018
Lessons learned from low-frequency noise studies on fully depleted utbox silicon-on-insulator nmosfets
ER Simoen, M Aoulaiche, SD Dos Santos, JA Martino, V Strobel, B Cretu, ...
ECS Transactions 53 (5), 49, 2013
42013
Low frequency noise assessment in advanced UTBOX SOI n-channel MOSFETs
V Strobel, B Cretu, SD dos Santos, E Simoen, JM Routoure, R Carin, ...
Workshop of the Thematic Network on Silicon on Insulator technology, devices …, 2013
32013
The Generation Rate Analysis of Different S/D Junction Engineering in Scaled UTBOX 1T-DRAM
T Nicoletti, KRA Sasaki, SD dos Santos, JA Martino, M Aoulaiche, ...
ECS Transactions 53 (5), 195, 2013
22013
Low-frequency noise for different gate dielectrics on state-of-the-art UTBOX SOI nMOSFETs
SD Dos Santos, E Simoen, V Strobel, B Cretu, JM Routoure, R Carin, ...
Workshop of the Thematic Network on Silicon on Insulator technology, devices …, 2013
22013
On the variability and front-back coupling of the low-frequency noise in UTBOX SOI nMOSFETs
SD Dos Santos, E Simoen, V Strobel, B Cretu, JM Routoure, R Carin, ...
2012 IEEE 11th International Conference on Solid-State and Integrated …, 2012
22012
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