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Coauteurs
- Yuanqing Xia (夏元清)School of Automation, Beijing Institute of TechnologyAdresse e-mail validée de bit.edu.cn
- Min WuProfessor, IEEE Fellow, China University of GeosciencesAdresse e-mail validée de cug.edu.cn
- Yun-Bo ZhaoUniversity of Science and Technology of ChinaAdresse e-mail validée de ustc.edu.cn
- Yong HeSchool of Automation, China University of GeoscienceAdresse e-mail validée de cug.edu.cn
- Zhong-Hua PangNorth China University of TechnologyAdresse e-mail validée de ia.ac.cn
- Ron PattonProfessor of Control and Intelligent Systems Engineering, Hull UniversityAdresse e-mail validée de hull.ac.uk
- Peng ShiProfessor, School of Electrical and Electronic Engineering, The University of AdelaideAdresse e-mail validée de adelaide.edu.au
- Jinhua She, Professor, IEEE FellowTokyo University of TechnologyAdresse e-mail validée de stf.teu.ac.jp
- Xi-Ming SunDalian University of TechnologyAdresse e-mail validée de dlut.edu.cn
- Visakan KadirkamanathanProfessor of Signal and Information Processing, University of SheffieldAdresse e-mail validée de sheffield.ac.uk
- Qing-Long Han, MAE, FIEEE, FIFAC,...Swinburne University of TechnologyAdresse e-mail validée de swin.edu.au
- Zidong WangChair Professor, MAE, MEASA, FIEEE, Brunel University London, UKAdresse e-mail validée de brunel.ac.uk
- Jian-Bo YangProfessor of Decision and System Sciences, The University of ManchesterAdresse e-mail validée de mbs.ac.uk
- Jie ChenBrunel UniversityAdresse e-mail validée de brunel.ac.uk
- Yuliang QiaoPrincipal Engineer, AmazonAdresse e-mail validée de amazon.com
- deng qijunDepartment of Automation, Wuhan UniversityAdresse e-mail validée de whu.edu.cn
- James F WhidborneHead of Dynamics Simulation and Control Group, Cranfield UniversityAdresse e-mail validée de cranfield.ac.uk
- Jongrae KimUniversity of Leeds, Leeds UKAdresse e-mail validée de leeds.ac.uk
- Jian SunBeijing Institute of TechnologyAdresse e-mail validée de bit.edu.cn
- Di-Hua Zhai (or Dihua Zhai)School of Automation, Beijing Institute of TechnologyAdresse e-mail validée de bit.edu.cn