Richard Arinero

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Gustavo Ariel SchwartzCentro de Física de Materiales - CSIC - UPV/EHUAdresse e-mail validée de csic.es
Olivier ArnouldUniversité de MontpellierAdresse e-mail validée de umontpellier.fr
Bruno ClairCNRS, LMGC, MontpellierAdresse e-mail validée de cnrs.fr
Alexei Baranovies, university montpellier 2Adresse e-mail validée de univ-montp2.fr
Mikhail DunaevskiyIoffe Institute; ITMO University, Nanophotonics and Metamaterials DepartmentAdresse e-mail validée de mail.ioffe.ru
Juan Jose SaenzDonostia International Physics Center (DIPC)Adresse e-mail validée de dipc.org
Dimas G. de Oteyza (ORCID: 0000-00...Nanomaterials and Nanotechnology Research Center (CINN), El Entrego, SpainAdresse e-mail validée de cinn.es
Sebastien BalmeAssistant professor, Université de Montpellier - European Institute of MembranesAdresse e-mail validée de univ-montp2.fr
philippe combetteprofessorAdresse e-mail validée de univ-montp2.fr
Jean PODLECKIMontpellier University, IES - UMR5214Adresse e-mail validée de umontpellier.fr
Wael HouraniMaître de conférences à l'Université de Franche Comte - Institut FEMTO-STAdresse e-mail validée de univ-fcomte.fr
Ron SchrimpfProfessor of Electrical Engineering, Vanderbilt UniversityAdresse e-mail validée de vanderbilt.edu
Yago Gonzalez-VeloArizona State UniversityAdresse e-mail validée de asu.edu
Enxia ZhangUniversity of Central FloridaAdresse e-mail validée de ucf.edu
Daniel M. FleetwoodProfessor of Electrical Engineering, Vanderbilt UniversityAdresse e-mail validée de vanderbilt.edu
Bo Kyoung ChoiMTEGAdresse e-mail validée de mteg.co.kr
Laurent CeruttiUniversity of MontpellierAdresse e-mail validée de umontpellier.fr
François FORESTInstitut d'Electronique du SudAdresse e-mail validée de univ-montp2.fr
Davide FabianiUniversity of BolognaAdresse e-mail validée de unibo.it
Eric DavidEcole de technologie superieureAdresse e-mail validée de etsmtl.ca

Suivre

Richard Arinero

Enseignant-chercheur, Université de Montpellier

Adresse e-mail validée de um2.fr

Atomic force microscopy nanoscience


Titre Trier par citations Trier par année Trier par titre	Citée par Citée par	Année
Determination of the nanoscale dielectric constant by means of a double pass method using electrostatic force microscopy C Riedel, R Arinero, P Tordjeman, M Ramonda, G Lévêque, GA Schwartz, ... Journal of Applied Physics 106 (2), 2009	90	2009
Nanodielectric mapping of a model polystyrene-poly (vinyl acetate) blend by electrostatic force microscopy C Riedel, R Arinero, P Tordjeman, G Lévêque, GA Schwartz, A Alegría, ... Physical Review E—Statistical, Nonlinear, and Soft Matter Physics 81 (1 …, 2010	69	2010
Imaging dielectric relaxation in nanostructured polymers by frequency modulation electrostatic force microscopy C Riedel, R Sweeney, NE Israeloff, R Arinero, GA Schwartz, A Alegría, ... Applied Physics Letters 96 (21), 2010	65	2010
Vibration of the cantilever in force modulation microscopy analysis by a finite element model R Arinero, G Lévêque Review of scientific instruments 74 (1), 104-111, 2003	56	2003
Imaging the mechanical properties of wood cell wall layers by atomic force modulation microscopy B Clair, R Arinero, G Lévèque, M Ramonda, B Thibaut IAWA journal 24 (3), 223-230, 2003	44	2003
Towards a better understanding of wood cell wall characterisation with contact resonance atomic force microscopy O Arnould, R Arinero Composites Part A: Applied Science and Manufacturing 74, 69-76, 2015	43	2015
Force gradient detection under vacuum on the basis of a double pass method L Portes, P Girard, R Arinero, M Ramonda Review of Scientific Instruments 77 (9), 2006	32	2006
Broadband nanodielectric spectroscopy by means of amplitude modulation electrostatic force microscopy (AM-EFM) GA Schwartz, C Riedel, R Arinero, P Tordjeman, A Alegría, J Colmenero Ultramicroscopy 111 (8), 1366-1369, 2011	31	2011
Nanoscale surface charge detection in epoxy resin materials using electrostatic force spectroscopy D El Khoury, R Arinero, JC Laurentie, J Castellon AIP Advances 6 (3), 2016	28	2016
Development of ruthenium dioxide electrodes for pyroelectric devices based on lithium tantalate thin films L Nougaret, P Combette, R Arinero, J Podlecki, F Pascal-Delannoy Thin Solid Films 515 (7-8), 3971-3977, 2007	24	2007
On the use of electrostatic force microscopy as a quantitative subsurface characterization technique: A numerical study C Riedel, A Alegria, GA Schwartz, R Arinero, J Colmenero, JJ Saenz Applied Physics Letters 99 (2), 2011	23	2011
Near field imaging of a semiconductor laser by scanning probe microscopy without a photodetector MS Dunaevskiy, PA Alekseev, AN Baranov, AM Monakhov, R Teissier, ... Applied Physics Letters 103 (5), 2013	22	2013
Nanoscale dielectric properties of insulating thin films: From single point measurements to quantitative images C Riedel, GA Schwartz, R Arinero, P Tordjeman, G Lévêque, A Alegría, ... Ultramicroscopy 110 (6), 634-638, 2010	22	2010
Capacitive silicon micro-electromechanical resonator for enhanced photoacoustic spectroscopy K Chamassi, W Trzpil, R Arinero, R Rousseau, A Vicet, M Bahriz Applied Physics Letters 115 (8), 2019	21	2019
Characterization of dielectric nanocomposites with electrostatic force microscopy D El Khoury, V Fedorenko, J Castellon, M Bechelany, JC Laurentie, ... Scanning 2017 (1), 4198519, 2017	21	2017
High-energy heavy ion irradiation-induced structural modifications: A potential physical understanding of latent defects M Marinoni, AD Touboul, D Zander, C Petit, FÉÉ Wrobel, AMJF Carvalho, ... IEEE Transactions on Nuclear Science 55 (6), 2970-2974, 2008	21	2008
Image processing for resonance frequency mapping in atomic force modulation microscopy R Arinéro, G Lévêque, P Girard, JY Ferrandis Review of scientific instruments 78 (2), 2007	21	2007
Numerical simulations of electrostatic interactions between an atomic force microscopy tip and a dielectric sample in presence of buried nano-particles R Arinero, C Riedel, C Guasch Journal of Applied Physics 112 (11), 2012	20	2012
Dynamic atomic force microscopy operation based on high flexure modes of the cantilever P Girard, M Ramonda, R Arinero Review of scientific instruments 77 (9), 2006	18	2006
New method for electrostatic force gradient microscopy observations and Kelvin measurements under vacuum L Portes, M Ramonda, R Arinero, P Girard Ultramicroscopy 107 (10-11), 1027-1032, 2007	16	2007

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