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Sergio E Martínez-Herrera
Sergio E Martínez-Herrera
Pollen Metrology
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Development of a Multispectral Gastroendoscope to Improve the Detection of Precancerous Lesions in Digestive Gastroendoscopy
SEM Herrera, Y Benezeth, M Boffety, F Goudail, D Lamarque, JF Emile, ...
Doctoral Consortium on Computer Vision, Imaging and Computer Graphics Theory …, 2014
1642014
Shape-from-Polarization in laparoscopy
SEM Herrera, A Malti, O Morel, A Bartoli
2013 IEEE 10th International Symposium on Biomedical Imaging, 1412-1415, 2013
282013
Identification of precancerous lesions by multispectral gastroendoscopy
SE Martinez-Herrera, Y Benezeth, M Boffety, JF Emile, F Marzani, ...
Signal, Image and Video Processing 10, 455-462, 2016
112016
Multispectral endoscopy to identify precancerous lesions in gastric mucosa
SE Martinez-Herrera, Y Benezeth, M Boffety, JF Emile, F Marzani, ...
Image and Signal Processing: 6th International Conference, ICISP 2014 …, 2014
102014
Cognitive learning: a machine learning approach for automatic process characterization from design
J Foucher, J Baderot, S Martinez, A Dervilllé, G Bernard
Metrology, Inspection, and Process Control for Microlithography XXXII 10585 …, 2018
92018
The coming of age of the first hybrid metrology software platform dedicated to nanotechnologies (Conference Presentation)
J Foucher, A Labrosse, A Dervillé, Y Zimmermann, G Bernard, S Martinez, ...
Metrology, Inspection, and Process Control for Microlithography XXXI 10145 …, 2017
82017
Designed tools for analysis of lithography patterns and nanostructures
A Dervilllé, J Baderot, G Bernard, J Foucher, H Grönqvist, A Labrosse, ...
Proc. SPIE 10145, Metrology, Inspection, and Process Control for …, 2017
82017
Multispectral imaging detects gastritis consistently in mouse model and in humans
T Bazin, SE Martinez-Herrera, A Jobart-Malfait, Y Benezeth, M Boffety, ...
Scientific Reports 10 (1), 20047, 2020
52020
Machine Learning assistant technology to facilitate Fin and 3D memory measurements on SEM and TEM images
J Baderot, B Darbon, N Clement, M Bryan, S Martinez, J Foucher
Advanced Etch Technology for Nanopatterning IX 11329, 92-100, 2020
42020
Introducing machine learning-based application for writer main pole CD metrology by dual beam FIB/SEM
A Zandiatashbar, A Ngo, C Chien, J Baderot, S Martinez, B Darbon, ...
Metrology, Inspection, and Process Control for Semiconductor Manufacturing …, 2021
32021
Using machine learning technology to accelerate the development of plasma etching processes
A Derville, G Gey, J Baderot, S Martinez, G Bernard, J Foucher
Advanced Etch Technology for Nanopatterning VIII 10963, 64-71, 2019
32019
Semi-automatic tools for nanoscale metrology and annotations for deep learning automation on electron microscopy images
IW Sanou, J Baderot, Y Benezeth, S Bricq, F Marzani, S Martinez, ...
Sixteenth International Conference on Quality Control by Artificial Vision …, 2023
22023
Application of machine learning-based metrology for writer main pole CD measurement by CDSEM
Y Yang, A Ngo, M Wang, C Chien, J Baderot, A Hallal, S Martinez, ...
Metrology, Inspection, and Process Control XXXVI 12053, 564-577, 2022
22022
Parametric modeling of patterned object with variations and expert tuning of edge placement
B Darbon, M Grould, N Clément, J Baderot, S Martinez, J Foucher
Advanced Etch Technology and Process Integration for Nanopatterning X 11615 …, 2021
22021
Accelerate the analysis and optimization of lamellar BCP process using machine learning
A Derville, S Martinez, G Gey, J Baderot, G Bernard, X Chevalier, ...
Advances in Patterning Materials and Processes XXXVI 10960, 102-107, 2019
22019
Application of deep-learning based techniques for automatic metrology on scanning and transmission electron microscopy images
J Baderot, M Grould, D Misra, N Clément, A Hallal, S Martinez, J Foucher
Journal of Vacuum Science & Technology B 40 (5), 2022
12022
Edge detection using deep learning pipelines for TEM and SEM metrology by proposing generic and specific approaches
E Loza, J Baderot, M Grould, E Pery, F Chausse, S Martinez, J Foucher
Metrology, Inspection, and Process Control XXXVII 12496, 694-707, 2023
2023
A generic deep-learning-based defect segmentation model for electron micrographs for automatic defect inspection
M Jacob, A Hallal, J Baderot, V Barra, A Guillin, S Martinez, J Foucher
Metrology, Inspection, and Process Control XXXVII 12496, 732-739, 2023
2023
Automatic Classification of C-SAM Voids for Root Cause Identification of Bonding Yield Degradation
J Baderot, S Garrais, S Martinez, J Foucher, R Eto, K Tanida, T Yasui, ...
2022 International Symposium on Semiconductor Manufacturing (ISSM), 1-4, 2022
2022
Multispectral imaging detects gastritis consistently in mouse model and in humans (vol 10, 20047, 2021)
T Bazin, SE Martinez-Herrera, A Jobart-Malfait, Y Benezeth, M Boffety, ...
SCIENTIFIC REPORTS 11 (1), 2021
2021
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