Dr. Suresh Balanethiram
Dr. Suresh Balanethiram
Assistant Professor, Dept. of ECE, National Institute of Technology Puducherry, Karaikal
Adresse e-mail validée de iiitt.ac.in - Page d'accueil
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Analytic estimation of thermal resistance in HBTs
A Chakravorty, R D’Esposito, S Balanethiram, S Frégonèse, T Zimmer
IEEE Transactions on Electron Devices 63 (8), 2994-2998, 2016
212016
Accurate modeling of thermal resistance for on-wafer SiGe HBTs using average thermal conductivity
S Balanethiram, A Chakravorty, R D’Esposito, S Fregonese, D Céli, ...
IEEE Transactions on Electron Devices 64 (9), 3955-3960, 2017
152017
Extracting the temperature dependence of thermal resistance from temperature-controlled DC measurements of sige HBTs
S Balanethiram, R d'Esposito, S Fregonese, T Zimmer, J Berkner, D Celi
2017 IEEE Bipolar/BiCMOS Circuits and Technology Meeting (BCTM), 94-97, 2017
112017
Extraction of BEOL contributions for thermal resistance in SiGe HBTs
S Balanethiram, R D’Esposito, A Chakravorty, S Fregonese, T Zimmer
IEEE Transactions on Electron Devices 64 (3), 1380-1384, 2017
112017
An improved scalable self-consistent iterative model for thermal resistance in SiGe HBTs
S Balanethiram, A Chakravorty, R D'Esposito, S Fregonese, T Zimmer
2016 IEEE Bipolar/BiCMOS Circuits and Technology Meeting (BCTM), 150-153, 2016
102016
Thermal penetration depth analysis and impact of the BEOL metals on the thermal impedance of SiGe HBTs
R D’Esposito, S Balanethiram, JL Battaglia, S Frégonèse, T Zimmer
IEEE Electron Device Letters 38 (10), 1457-1460, 2017
62017
Efficient modeling of distributed dynamic self-heating and thermal coupling in multifinger SiGe HBTs
S Balanethiram, R D’Esposito, A Chakravorty, S Fregonese, D Céli, ...
IEEE Transactions on Electron Devices 63 (9), 3393-3398, 2016
52016
Efficient modeling of static self-heating and thermal-coupling in multi-finger SiGe HBTs
S Balanethiram, A Chakravorty, R d'Esposito, S Fregonese, T Zimmer
2015 IEEE Bipolar/BiCMOS Circuits and Technology Meeting-BCTM, 68-71, 2015
52015
Device level analysis of threshold voltage variation in FinFET with varied design parameters
DJ Moni, R Malarkodi, B Suresh
2011 International Conference on Computer, Communication and Electrical …, 2011
32011
Validation of thermal resistance extracted from measurements on stripe geometry SiGe HBTs
S Balanethiram, R D’Esposito, S Fregonese, A Chakravorty, T Zimmer
IEEE Transactions on Electron Devices 66 (10), 4151-4155, 2019
22019
Influence of the BEOL metallization design on the overall performances of SiGe HBTs
R D'Esposito, M De Matos, S Fregonese, S Balanethiram, A Chakravorty, ...
2016 13th IEEE International Conference on Solid-State and Integrated …, 2016
22016
An efficient thermal model for multifinger SiGe HBTs under real operating condition
K Nidhin, S Pande, S Yadav, S Balanethiram, DR Nair, S Fregonese, ...
IEEE Transactions on Electron Devices 67 (11), 5069-5075, 2020
12020
Static Thermal Coupling Factors in Multi-Finger Bipolar Transistors: Part II-Experimental Validation
A Gupta, K Nidhin, S Balanethiram, S Yadav, A Chakravorty, S Fregonese, ...
Electronics 9 (9), 1365, 2020
12020
Static Thermal Coupling Factors in Multi-Finger Bipolar Transistors: Part I—Model Development
A Gupta, K Nidhin, S Balanethiram, S Yadav, A Chakravorty, S Fregonese, ...
Electronics 9 (9), 1333, 2020
12020
Modeling Thermal Behavior in Multi-layered GaN HEMT-like Structures
K Nidhin, S Balanethiram, DR Nair, A Chakravorty
2020 4th IEEE Electron Devices Technology & Manufacturing Conference (EDTM), 1-4, 2020
12020
Extracting the FEOL and BEOL components of thermal resistance in SiGe HBTs
S Balanethiram, A Chakravorty, R D'Esposito, S Fregonese, T Zimmer
2016 3rd International Conference on Emerging Electronics (ICEE), 1-4, 2016
12016
Analysis of electro-thermal instability in bipolar transistors
S Balanethiram, A Chakravorty
2015 IEEE International Conference on Electron Devices and Solid-State …, 2015
12015
Extraction of True Finger Temperature From Measured Data in Multifinger Bipolar Transistors
A Gupta, K Nidhin, S Balanethiram, R D’Esposito, S Fregonese, T Zimmer, ...
IEEE Transactions on Electron Devices 68 (3), 1385-1388, 2021
2021
Analytical Estimation of Peak Temperature in Power Electronic Systems with Multi-Layered Heat Sink Including Convection Mode of Heat Transfer
V Kumar, N Lakshminarasamma, K Nidhin, S Balanethiram, ...
2020 IEEE International Conference on Power Electronics, Smart Grid and …, 2020
2020
Development of low-cost silicon BiCMOS technology for RF applications
S Balanethiram, S Pande, AK Singh, B Umapathi, HS Jatana, ...
2019 IEEE Conference on Modeling of Systems Circuits and Devices (MOS-AK …, 2019
2019
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