Shubham Tayal

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Dr. J. AjayanProfessor & Dean Post Graduation Programs, SR University, TelanganaAdresse e-mail validée de sru.edu.in
Dr.Sandip BhattacharyaProfessor & Head, ECE, SR University, PDF from HiSIM Research Center, Hiroshima University, 🗾Adresse e-mail validée de sru.edu.in
Ashutosh NandiAssistant professor at NIT KurukshetraAdresse e-mail validée de nitkkr.ac.in
Dr. Shiromani Balmukund RahiAssistant Professor(Gautam Buddha University)&Associated-Researcher|(IIT Kanpur),|Editor|,|Reviewer|Adresse e-mail validée de iitk.ac.in
Laxman Raju ThoutamAmrita Vishwa VidyapeethamAdresse e-mail validée de acnsmm.aims.amrita.edu
Sresta ValasaNational Institute of Technology WarangalAdresse e-mail validée de student.nitw.ac.in
Dr. BISWAJIT JENAVellore Institute of Technology - VIT ChennaiAdresse e-mail validée de vit.ac.in
Abhishek UpadhyayX-FAB Dresden GmbH & Co. KGAdresse e-mail validée de xfab.com
Dr.D.NirmalAssociate Dean Engineering and Technology, Karunya UniversityAdresse e-mail validée de karunya.edu
Young Suh SongDepartment of Electrical and Computer Engineering, Seoul National UniversityAdresse e-mail validée de snu.ac.kr
Dr.L.M.I.LEO JOSEPHSR UNIVERSITYAdresse e-mail validée de sru.edu.in
Parveen singlaProfessor, ECE Department, Chandigarh Engineering College, Landran, MohaliAdresse e-mail validée de cgc.edu.in
Billel SmaaniCentre Universitaire Abdelhafid Boussouf - MilaAdresse e-mail validée de centre-univ-mila.dz
Shikhar GuptaResearch ScholarAdresse e-mail validée de nitkkr.ac.in
Dr. Krutideepa BholAssistant Professor(ECE),Sathyabama Deemed to be UniversityAdresse e-mail validée de vitap.ac.in
Umakanta NandaAssociate Professor and Dean (School of Electronics Engineering), VIT-AP UniversityAdresse e-mail validée de vitap.ac.in
Mounika BandiSR UniversityAdresse e-mail validée de sru.edu.in
Dr. Deboraj MuchaharyNational Institute of Technology, RaipurAdresse e-mail validée de nitrr.ac.in
Shweta MeenaNational Institute of Technology KurukshetraAdresse e-mail validée de nitkkr.ac.in
Byung Gook ParkProfessor of Electrical Engineering, Seoul National UniversityAdresse e-mail validée de snu.ac.kr

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Shubham Tayal

Synopsys India Pvt. Ltd., Hyderabad

Adresse e-mail validée de nitkkr.ac.in - Page d'accueil

Device simulation and modelling Device-Circuit co-design issues Digital IC design Analog IC design Semiconductor device phys


Titre Trier par citations Trier par année Trier par titre	Citée par Citée par	Année
Nanosheet field effect transistors-A next generation device to keep Moore's law alive: An intensive study J Ajayan, D Nirmal, S Tayal, S Bhattacharya, L Arivazhagan, ASA Fletcher, ... Microelectronics Journal 114, 105141, 2021	69	2021
Analog/RF performance analysis of channel engineered high-k gate-stack based junctionless trigate-FinFET S Tayal, A Nandi Superlattices and Microstructures 112, 287-295, 2017	57	2017
A review on emerging negative capacitance field effect transistor for low power electronics SB Rahi, S Tayal, AK Upadhyay Microelectronics Journal 116, 105242, 2021	45	2021
Challenges in material processing and reliability issues in AlGaN/GaN HEMTs on silicon wafers for future RF power electronics & switching applications: A critical review J Ajayan, D Nirmal, P Mohankumar, B Mounika, S Bhattacharya, S Tayal, ... Materials Science in Semiconductor Processing 151, 106982, 2022	44	2022
Optimization of gate-stack in junctionless Si-nanotube FET for analog/RF applications S Tayal, A Nandi Materials Science in Semiconductor Processing 80, 63-67, 2018	40	2018
Analog/RF performance analysis of inner gate engineered junctionless Si nanotube S Tayal, A Nandi Superlattices and Microstructures 111, 862-871, 2017	38	2017
Effect of FIBL in-conjunction with channel parameters on analog and RF FOM of FinFET S Tayal, A Nandi Superlattices and Microstructures 105, 152-162, 2017	32	2017
Recent progress on negative capacitance tunnel FET for low-power applications: Device perspective AK Upadhyay, SB Rahi, S Tayal, YS Song Microelectronics Journal 129, 105583, 2022	28	2022
Study of 6T SRAM cell using high-k gate dielectric based junctionless silicon nanotube FET S Tayal, A Nandi Superlattices and Microstructures 112, 143-150, 2017	28	2017
A critical review of AlGaN/GaN-heterostructure based Schottky diode/HEMT hydrogen (H2) sensors for aerospace and industrial applications J Ajayan, D Nirmal, R Ramesh, S Bhattacharya, S Tayal, LMIL Joseph, ... Measurement 186, 110100, 2021	25	2021
A comprehensive investigation of vertically stacked silicon nanosheet field effect transistors: an analog/rf perspective S Tayal, J Ajayan, LMIL Joseph, J Tarunkumar, D Nirmal, B Jena, A Nandi Silicon 14 (7), 3543-3550, 2022	23	2022
Study of temperature effect on junctionless Si nanotube FET concerning analog/RF performance S Tayal, A Nandi Cryogenics 92, 71-75, 2018	21	2018
Investigation of nanosheet-FET based logic gates at sub-7 nm technology node for digital IC applications S Tayal, S Valasa, S Bhattacharya, J Ajayan, SM Ahmed, B Jena, ... Silicon 14 (18), 12261-12267, 2022	20	2022
Optimization of design space for vertically stacked junctionless nanosheet FET for analog/RF applications S Valasa, S Tayal, LR Thoutam Silicon 14 (16), 10347-10356, 2022	19	2022
Incorporating bottom-up approach into device/circuit co-design for SRAM-based cache memory applications S Tayal, B Smaani, SB Rahi, AK Upadhyay, S Bhattacharya, J Ajayan, ... IEEE Transactions on Electron Devices 69 (11), 6127-6132, 2022	19	2022
Performance analysis of junctionless DG‐MOSFET‐based 6T‐SRAM with gate‐stack configuration S Tayal, A Nandi Micro & Nano Letters 13 (6), 838-841, 2018	19	2018
Temperature sensitivity analysis of inner-gate engineered JL-SiNT-FET: An Analog/RF prospective S Tayal, V Mittal, S Jadav, S Gupta, A Nandi, B Krishan Cryogenics 108, 103087, 2020	18	2020
Enhancing the delay performance of junctionless silicon nanotube based 6T SRAM S Tayal, A Nandi Micro & Nano Letters 13 (7), 965-968, 2018	18	2018
A critical review on performance, reliability, and fabrication challenges in nanosheet FET for future analog/digital IC applications S Valasa, S Tayal, LR Thoutam, J Ajayan, S Bhattacharya Micro and Nanostructures 170, 207374, 2022	17	2022
Design insights into thermal performance of vertically stacked JL-NSFET with high-k gate dielectric for sub 5-nm technology node S Valasa, S Tayal, LR Thoutam ECS Journal of Solid State Science and Technology 11 (4), 041008, 2022	17	2022

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