| Preparation and characterization of SnO2 films for sensing applications P Stefanov, G Atanasova, E Manolov, Z Raicheva, V Lazarova Journal of Physics: Conference Series 100 (8), 082046, 2008 | 41 | 2008 |
| Quartz resonator with SnO2 thin film as acoustic gas sensor for NH3 V Lazarova, L Spassov, V Gueorguiev, S Andreev, E Manolov, L Popova Vacuum 47 (12), 1423-1425, 1996 | 36 | 1996 |
| Absorption and transport properties of Si rich oxide layers annealed at various temperatures D Nesheva, N Nedev, Z Levi, R Brüggemann, E Manolov, K Kirilov, ... Semiconductor Science and Technology 23 (4), 045015, 2008 | 33 | 2008 |
| Memory effect in MIS structures with amorphous silicon nanoparticles embedded in ultra thin SiOx matrix D Nesheva, N Nedev, E Manolov, I Bineva, H Hofmeister Journal of physics and chemistry of solids 68 (5-6), 725-728, 2007 | 30 | 2007 |
| Microstructural characterization of thin SiOx films obtained by physical vapor deposition MA Curiel, N Nedev, D Nesheva, J Soares, R Haasch, M Sardela, ... Materials Science and Engineering: B 174 (1-3), 132-136, 2010 | 29 | 2010 |
| Thin MoO3 films for sensor applications V Georgieva, P Stefanov, L Spassov, Z Raicheva, M Atanassov, ... Journal of optoelectronics and advanced materials 11 (10), 1363-1366, 2009 | 22 | 2009 |
| Metal-Oxide-Semiconductor Structures Containing Silicon Nanocrystals for Application in Radiation Dosimeters N Nedev, E Manolov, D Nesheva, K Krezhov, R Nedev, M Curiel, ... Sensor Letters 10 (3-4), 833-837, 2012 | 15 | 2012 |
| Influence of thermal annealing on the memory effect in MIS structures containing crystalline Si nanoparticles S Meier, R Brueggemann, K Kirilov, Z Levi, E Manolov, N Nedev Verhandlungen der Deutschen Physikalischen Gesellschaft 42, 2007 | 12 | 2007 |
| UV sensitivity of MOS structures with silicon nanoclusters M Curiel, N Nedev, J Paz, O Perez, B Valdez, D Mateos, A Arias, ... Sensors 19 (10), 2277, 2019 | 10 | 2019 |
| High energy electron-beam irradiation effects in Si-SiOx structures D Nesheva, V Dzhurkov, M Šćepanović, I Bineva, E Manolov, ... Journal of Physics: Conference Series 682 (1), 012012, 2016 | 10 | 2016 |
| Silicon oxide films containing amorphous or crystalline silicon nanodots for device applications D Nesheva, N Nedev, M Curiel, I Bineva, B Valdez, E Manolov Quantum Dots–A Variety of New Applications Ameenah AA editor InTech, 183-206, 2012 | 10 | 2012 |
| Formation of Si Nanocrystals in Thin SiO2 Films for Memory Device Applications M Curiel, I Petrov, N Nedev, D Nesheva, MR Sardela, Y Murata, B Valdez, ... Materials Science Forum 644, 101-104, 2010 | 10 | 2010 |
| Application of Metal-Oxide-Semiconductor structures containing silicon nanocrystals in radiation dosimetry D Nesheva, N Nedev, M Curiel, V Dzhurkov, A Arias, E Manolov, ... Open Physics 13 (1), 2015 | 9 | 2015 |
| Quartz roughness affect on W03 coated QCM V Georgieva, Z Raicheva, A Grechnikov, V Gadjanova, M Atanassov, ... Journal of Physics: Conference Series 253 (1), 012046, 2010 | 9 | 2010 |
| Resistance changes of SnO/sub 2/thin films suitable for microelectronic gas sensors LI Popova, SK Andreev, VK Gueorguiev, EB Manolov Proceedings of International Conference on Microelectronics 2, 581-583, 1995 | 9 | 1995 |
| Effect of oxygen to argon ratio on the properties of thin SiO x films deposited by r.f. sputtering JM Terrazas, N Nedev, E Manolov, B Valdez, D Nesheva, MA Curiel, ... Journal of Materials Science: Materials in Electronics 21, 481-485, 2010 | 8 | 2010 |
| Memory effect in MOS structures containing amorphous or crystalline silicon nanoparticles N Nedev, D Nesheva, E Manolov, R Bruggemann, S Meier, Z Levi 2008 26th International Conference on Microelectronics, 117-120, 2008 | 8 | 2008 |
| MOS structures containing silicon nanoparticles for memory device applications N Nedev, D Nesheva, E Manolov, R Brüggemann, S Meier, Z Levi, ... Journal of Physics: Conference Series 113 (1), 012034, 2008 | 8 | 2008 |
| Structural, compositional and electrical characterization of Si-rich SiOx layers suitable for application in light sensors R Herrera, M Curiel, A Arias, D Nesheva, N Nedev, E Manolov, ... Materials Science in Semiconductor Processing 37, 229-234, 2015 | 7 | 2015 |
| MOS Structures Containing Si Nanocrystals for Applications in UV Dosimeters A Arias, N Nedev, D Nesheva, M Curiel, E Manolov, D Mateos, V Dzurkov, ... Key Engineering Materials 605, 380-383, 2014 | 7 | 2014 |
