Jean-Max Dutertre
Jean-Max Dutertre
Professor, Microelectronic, Ecole Nationale Supérieure des Mines de Saint-Etienne
Adresse e-mail validée de emse.fr - Page d'accueil
Titre
Citée par
Citée par
Année
When clocks fail: On critical paths and clock faults
M Agoyan, JM Dutertre, D Naccache, B Robisson, A Tria
International conference on smart card research and advanced applications …, 2010
1822010
Electromagnetic transient faults injection on a hardware and a software implementations of AES
A Dehbaoui, JM Dutertre, B Robisson, A Tria
2012 Workshop on Fault Diagnosis and Tolerance in Cryptography, 7-15, 2012
1652012
Fault model analysis of laser-induced faults in sram memory cells
C Roscian, A Sarafianos, JM Dutertre, A Tria
2013 Workshop on Fault Diagnosis and Tolerance in Cryptography, 89-98, 2013
852013
How to flip a bit?
M Agoyan, JM Dutertre, AP Mirbaha, D Naccache, AL Ribotta, A Tria
2010 IEEE 16th International On-Line Testing Symposium, 235-239, 2010
732010
Injection of transient faults using electromagnetic pulses-Practical results on a cryptographic system-.
A Dehbaoui, JM Dutertre, B Robisson, P Orsatelli, P Maurine, A Tria
IACR Cryptology EPrint Archive 2012, 123, 2012
702012
Efficiency of a glitch detector against electromagnetic fault injection
L Zussa, A Dehbaoui, K Tobich, JM Dutertre, P Maurine, ...
2014 Design, Automation & Test in Europe Conference & Exhibition (DATE), 1-6, 2014
652014
Frontside laser fault injection on cryptosystems-Application to the AES'last round
C Roscian, JM Dutertre, A Tria
2013 IEEE International Symposium on Hardware-Oriented Security and Trust …, 2013
542013
A side-channel and fault-attack resistant AES circuit working on duplicated complemented values
M Doulcier-Verdier, JM Dutertre, J Fournier, JB Rigaud, B Robisson, ...
2011 IEEE International Solid-State Circuits Conference, 274-276, 2011
512011
Electromagnetic glitch on the AES round counter
A Dehbaoui, AP Mirbaha, N Moro, JM Dutertre, A Tria
International Workshop on Constructive Side-Channel Analysis and Secure …, 2013
492013
A DFA on AES based on the entropy of error distributions
R Lashermes, G Reymond, JM Dutertre, J Fournier, B Robisson, A Tria
2012 Workshop on Fault Diagnosis and Tolerance in Cryptography, 34-43, 2012
482012
Evidence of a larger EM-induced fault model
S Ordas, L Guillaume-Sage, K Tobich, JM Dutertre, P Maurine
International Conference on Smart Card Research and Advanced Applications …, 2014
422014
Investigation of timing constraints violation as a fault injection means
L Zussa, JM Dutertre, J Clédiere, B Robisson, A Tria
27th Conference on Design of Circuits and Integrated Systems (DCIS), Avignon …, 2012
412012
Power supply glitch induced faults on FPGA: An in-depth analysis of the injection mechanism
L Zussa, JM Dutertre, J Clediere, A Tria
2013 IEEE 19th International On-Line Testing Symposium (IOLTS), 110-115, 2013
402013
Single-bit DFA using multiple-byte laser fault injection
M Agoyan, JM Dutertre, AP Mirbaha, D Naccache, AL Ribotta, A Tria
2010 IEEE International Conference on Technologies for Homeland Security …, 2010
332010
Improving the ability of Bulk Built-In Current Sensors to detect Single Event Effects by using triple-well CMOS
JM Dutertre, RP Bastos, O Potin, ML Flottes, B Rouzeyre, G Di Natale, ...
Microelectronics Reliability 54 (9-10), 2289-2294, 2014
282014
Fault round modification analysis of the advanced encryption standard
JM Dutertre, AP Mirbaha, D Naccache, AL Ribotta, A Tria, T Vaschalde
2012 IEEE International Symposium on Hardware-Oriented Security and Trust …, 2012
242012
Building the electrical model of the pulsed photoelectric laser stimulation of an NMOS transistor in 90nm technology
A Sarafianos, O Gagliano, V Serradeil, M Lisart, JM Dutertre, A Tria
2013 IEEE International Reliability Physics Symposium (IRPS), 5B. 5.1-5B. 5.9, 2013
232013
Review of fault injection mechanisms and consequences on countermeasures design
JM Dutertre, JJA Fournier, AP Mirbaha, D Naccache, JB Rigaud, ...
2011 6th International Conference on Design & Technology of Integrated …, 2011
232011
Sensitivity tuning of a bulk built-in current sensor for optimal transient-fault detection
JM Dutertre, RP Bastos, O Potin, ML Flottes, B Rouzeyre, G Di Natale
Microelectronics Reliability 53 (9-11), 1320-1324, 2013
222013
Experimental validation of a Bulk Built-In Current Sensor for detecting laser-induced currents
C Champeix, N Borrel, JM Dutertre, B Robisson, M Lisart, A Sarafianos
2015 IEEE 21st International On-Line Testing Symposium (IOLTS), 150-155, 2015
202015
Le système ne peut pas réaliser cette opération maintenant. Veuillez réessayer plus tard.
Articles 1–20