Stefan Dilhaire
Stefan Dilhaire
Adresse e-mail validée de u-bordeaux.fr - Page d'accueil
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Precise control of thermal conductivity at the nanoscale through individual phonon-scattering barriers
G Pernot, M Stoffel, I Savic, F Pezzoli, P Chen, G Savelli, A Jacquot, ...
Nature materials 9 (6), 491-495, 2010
3612010
Microscale and nanoscale heat transfer
P Chantrenne, S Dilhaire, S Gomez, N Trannoy, G Tessier
Springer-Verlag Berlin/Heidelberg, 2007
1112007
Thermal properties of carbon fibers at very high temperature
C Pradère, JC Batsale, JM Goyhénèche, R Pailler, S Dilhaire
Carbon 47 (3), 737-743, 2009
1102009
Generation and detection of shear acoustic waves in metal submicrometric films with ultrashort laser pulses
C Rossignol, JM Rampnoux, M Perton, B Audoin, S Dilhaire
Physical review letters 94 (16), 166106, 2005
1082005
Calibration procedure for temperature measurements by thermoreflectance under high magnification conditions
S Dilhaire, S Grauby, W Claeys
Applied Physics Letters 84 (5), 822-824, 2004
842004
Laser beam thermography of circuits in the particular case of passivated semiconductors
V Quintard, G Deboy, S Dilhaire, D Lewis, T Phan, W Claeys
Microelectronic Engineering 31 (1-4), 291-298, 1996
791996
Thermal coupling in integrated circuits: application to thermal testing
J Altet, A Rubio, E Schaub, S Dilhaire, W Claeys
IEEE Journal of Solid-State Circuits 36 (1), 81-91, 2001
782001
Coherent phonons in superlattices
Y Ezzahri, S Grauby, JM Rampnoux, H Michel, G Pernot, W Claeys, ...
Physical Review B 75 (19), 195309, 2007
762007
Dynamic surface temperature measurements in ICs
J Altet, W Claeys, S Dilhaire, A Rubio
Proceedings of the IEEE 94 (8), 1519-1533, 2006
762006
Scanning thermal microscopy of individual silicon nanowires
E Puyoo, S Grauby, JM Rampnoux, E Rouvière, S Dilhaire
Journal of Applied Physics 109 (2), 024302, 2011
742011
Fabrication of Bi2Te3 nanowire arrays and thermal conductivity measurement by 3ω-scanning thermal microscopy
M Muñoz Rojo, S Grauby, JM Rampnoux, O Caballero-Calero, ...
Journal of Applied Physics 113 (5), 054308, 2013
692013
Decrease in thermal conductivity in polymeric P3HT nanowires by size-reduction induced by crystal orientation: new approaches towards thermal transport engineering of organic …
MM Rojo, J Martín, S Grauby, T Borca-Tasciuc, S Dilhaire, ...
Nanoscale 6 (14), 7858-7865, 2014
652014
Thermal exchange radius measurement: Application to nanowire thermal imaging
E Puyoo, S Grauby, JM Rampnoux, E Rouvière, S Dilhaire
Review of Scientific Instruments 81 (7), 073701, 2010
622010
Heterodyne picosecond thermoreflectance applied to nanoscale thermal metrology
S Dilhaire, G Pernot, G Calbris, JM Rampnoux, S Grauby
Journal of Applied Physics 110 (11), 114314, 2011
562011
Thermoreflectance optical test probe for the measurement of current‐induced temperature changes in microelectronic components
W Claeys, S Dilhaire, V Quintard, JP Dom, Y Danto
Quality and reliability engineering international 9 (4), 303-308, 1993
561993
Four different approaches for the measurement of IC surface temperature: application to thermal testing
J Altet, S Dilhaire, S Volz, JM Rampnoux, A Rubio, S Grauby, LDP Lopez, ...
Microelectronics journal 33 (9), 689-696, 2002
532002
All-optical broadband ultrasonography of single cells
T Dehoux, M Abi Ghanem, OF Zouani, JM Rampnoux, Y Guillet, S Dilhaire, ...
Scientific reports 5, 8650, 2015
502015
Structurally-driven enhancement of thermoelectric properties within poly (3, 4-ethylenedioxythiophene) thin films
I Petsagkourakis, E Pavlopoulou, G Portale, BA Kuropatwa, S Dilhaire, ...
Scientific reports 6, 30501, 2016
452016
Laser probing of thermal behaviour of electronic components and its application in quality and reliability testing
W Claeys, S Dilhaire, V Quintard
Microelectronic Engineering 24 (1-4), 411-420, 1994
441994
Nanoscale block copolymer ordering induced by visible interferometric micropatterning: a route towards large scale block copolymer 2D crystals
K Aissou, J Shaver, G Fleury, G Pécastaings, C Brochon, C Navarro, ...
Advanced Materials 25 (2), 213-217, 2013
432013
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