Enrique del Castillo

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Douglas C. MontgomeryProfessor of Industrial Engineering, Arizona State UniversityAdresse e-mail validée de asu.edu
Bianca Maria ColosimoProfessor, Politecnico MilanoAdresse e-mail validée de polimi.it
James MoyneAssociate Research Scientist, University of MichiganAdresse e-mail validée de umich.edu
John PetersonPDQ Research & ConsultingAdresse e-mail validée de windstream.net
Rong PanArizona State UniversityAdresse e-mail validée de asu.edu
Sam Davanloo TajbakhshThe Ohio State UniversityAdresse e-mail validée de osu.edu
Jinn-Yi YehNational Chiayi University, TaiwanAdresse e-mail validée de mail.ncyu.edu.tw
James L RosenbergerPenn State ProfessorAdresse e-mail validée de psu.edu
Arda VanliAssociate Professor of Industrial Engineering, Florida State UniversityAdresse e-mail validée de eng.fsu.edu
James RapkinUniversity of ExeterAdresse e-mail validée de exeter.ac.uk
John SempleCox School of Business, SMUAdresse e-mail validée de mail.cox.smu.edu
Clarissa M HouseBehavioural Ecologist, Western Sydney UniversityAdresse e-mail validée de westernsydney.edu.au
Byran SmuckerAssociate Professor of Statistics, Miami University, Oxford, OHAdresse e-mail validée de miamioh.edu
Hussam AlshraidehAmerican University of SharjahAdresse e-mail validée de asu.edu
Quirico SEMERAROProfessore di Tecnologia e Sistemi di lavorazioneAdresse e-mail validée de polimi.it
C. Ruth ArcherUniversity of UlmAdresse e-mail validée de exeter.ac.uk
E Sanigauniversity of delawareAdresse e-mail validée de udel.edu
Jack KleijnenEmeritus Professor of Simulation and Information Systems, Tilburg UniversityAdresse e-mail validée de tilburguniversity.edu
Parameshwaran S IyerAdresse e-mail validée de bosch.com
Joel M. HaightProfessor of Industrial Engineering, University of PittsburghAdresse e-mail validée de pitt.edu

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Enrique del Castillo

Distinguished Professor, Industrial Engineering & Statistics depts., Penn State University

Adresse e-mail validée de psu.edu - Page d'accueil

Engineering Statistics Response Surface Methodology Industrial Metrology Statistical Process Control Quality Engineering


Titre Trier par citations Trier par année Trier par titre	Citée par Citée par	Année
Modified desirability functions for multiple response optimization E Del Castillo, DC Montgomery, DR McCarville Journal of quality technology 28 (3), 337-345, 1996	582	1996
Process optimization: a statistical approach E del Castillo Elsevier, 2008	522*	2008
A nonlinear programming solution to the dual response problem E Del Castillo, DC Montgomery Journal of Quality Technology 25 (3), 199-204, 1993	441	1993
Fitting the generalized Pareto distribution to data E Castillo, AS Hadi Journal of the American Statistical Association 92 (440), 1609-1620, 1997	426	1997
Run-to-run control in semiconductor manufacturing J Moyne Encyclopedia of Systems and Control, 1997-2003, 2021	370	2021
Run-to-run process control: Literature review and extensions E Del Castillo, AM Hurwitz Journal of Quality Technology 29 (2), 184-196, 1997	357	1997
Statistical process adjustment for quality control, 2002 E Del Castillo Wiley: New York, 0	294*
NIST/SEMATECH e-Handbook of Statistical Methods M Natrella	252	2010
Response surface methodology and related topics AI Khuri World scientific, 2006	238	2006
An adaptive run-to-run optimizing controller for linear and nonlinear semiconductor processes E Del Castillo, JY Yeh IEEE Transactions on Semiconductor Manufacturing 11 (2), 285-295, 1998	155	1998
Optimal short horizon distribution operations in reusable container systems ED Castillo, JK Cochran Journal of the Operational Research Society 47, 48-60, 1996	144	1996
Long run and transient analysis of a double EWMA feedback controller ED Castillo IIE transactions 31 (12), 1157-1169, 1999	131	1999
A Bayesian approach for multiple response surface optimization in the presence of noise variables G Miró-Quesada, E Del Castillo, JJ Peterson Journal of applied statistics 31 (3), 251-270, 2004	120	2004
Economic modeling for statistical process control JB Keats, E Del Castillo, E Von Collani, EM Saniga Journal of Quality Technology 29 (2), 144-147, 1997	113	1997
A multivariate double EWMA process adjustment scheme for drifting processes E Del Castillo, R Rajagopal Iie Transactions 34 (12), 1055-1068, 2002	101	2002
Bayesian process monitoring, control and optimization BM Colosimo, E Del Castillo CRC Press, 2006	94*	2006
Short‐run statistical process control: Q‐chart enhancements and alternative methods ED Castillo, DC Montgomery Quality and Reliability Engineering International 10 (2), 87-97, 1994	86	1994
Multiresponse process optimization via constrained confidence regions E Del Castillo Journal of Quality Technology 28 (1), 61-70, 1996	83	1996
Some properties of EWMA feedback quality adjustment schemes for drifting disturbances E Del Castillo Journal of quality technology 33 (2), 153-166, 2001	82	2001
Query-by-committee improvement with diversity and density in batch active learning S Kee, E Del Castillo, G Runger Information Sciences 454, 401-418, 2018	77	2018

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