Suivre
Laurent Bechou
Laurent Bechou
Professeur
Adresse e-mail validée de ims-bordeaux.fr
Titre
Citée par
Citée par
Année
Detection and location of defects in electronic devices by means of scanning ultrasonic microscopy and the wavelet transform
L Angrisani, L Bechou, D Dallet, P Daponte, Y Ousten
Measurement 31 (2), 77-91, 2002
562002
Long‐term Reliability Prediction of 935 nm LEDs Using Failure Laws and Low Acceleration Factor Ageing Tests
Y Deshayes, L Bechou, F Verdier, Y Danto
Quality and Reliability Engineering International 21 (6), 571-594, 2005
482005
Study of a polymer optical microring resonator for hexavalent chromium sensing
F Meziane, V Raimbault, H Hallil, S Joly, V Conédéra, JL Lachaud, ...
Sensors and Actuators B: Chemical 209, 1049-1056, 2015
422015
Effects of silicone coating degradation on GaN MQW LEDs performances using physical and chemical analyses
R Baillot, Y Deshayes, L Bechou, T Buffeteau, I Pianet, C Armand, ...
Microelectronics reliability 50 (9-11), 1568-1573, 2010
302010
An improved method for automatic detection and location of defects in electronic components using scanning ultrasonic microscopy
L Bechou, D Dallet, Y Danto, P Daponte, Y Ousten, S Rapuano
IEEE Transactions on Instrumentation and Measurement 52 (1), 135-142, 2003
242003
Ultrasonic images interpretation improvement for microassembling technologies characterisation
L Bechou, Y Ousten, B Tregon, F Marc, Y Danto, R Even, P Kertesz
Microelectronics Reliability 37 (10-11), 1787-1790, 1997
241997
Highly accelerated life testing (HALT), failure oriented accelerated testing (FOAT), and their role in making a viable device into a reliable product
E Suhir, A Bensoussan, J Nicolics, L Bechou
2014 IEEE Aerospace Conference, Big Sky, Montana, 2014
232014
Technical Diagnostics in Electronics: Application of Bayes Formula and Boltzmann-Arrhenius-Zhurkov (BAZ) Model
E Suhir, L Bechou, A Bensoussan
Printed Circuit Design& Fab/Circuits Assembly 29 (12), 25-28, 2012
232012
Estimation of lifetime distributions on 1550-nm DFB laser diodes using Monte-Carlo statistic computations
Y Deshayes, F Verdier, L Bechou, B Tregon, Y Danto, D Laffitte, ...
Reliability of Optical Fiber Components, Devices, Systems, and Networks II …, 2004
222004
Early failure signatures of 1310 nm laser modules using electrical, optical and spectral measurements
Y Deshayes, L Bechou, L Mendizabal, Y Danto
Measurement 34 (2), 157-178, 2003
212003
Predicted size of an inelastic zone in a ball-grid-array assembly
E Suhir, L Bechou, B Levrier
Journal of Applied Mechanics 80 (2), 021007, 2013
202013
Miniaturization of InGaP/InGaAs/Ge solar cells for micro‐concentrator photovoltaics
P Albert, A Jaouad, G Hamon, M Volatier, CE Valdivia, Y Deshayes, ...
Progress in Photovoltaics: Research and Applications 29 (9), 990-999, 2021
192021
Probabilistic design for reliability (pdfr) and a novel approach to qualification testing (qt)
E Suhir, R Mahajan, A Lucero, L Bechou
IEEE/AIAA Aerospace Conf., 3843-3860, 2012
192012
Measurement of the thermal characteristics of packaged double-heterostructure light emitting diodes for space applications using spontaneous optical spectrum properties
L Bechou, O Rehioui, Y Deshayes, O Gilard, G Quadri, Y Ousten
Optics & Laser Technology 40 (4), 589-601, 2008
192008
Precise facet temperature distribution of high-power laser diodes: Unpumped window effect
J Michaud, P Del Vecchio, L Béchou, D Veyrié, MA Bettiati, F Laruelle, ...
IEEE Photonics Technology Letters 27 (9), 1002-1005, 2015
182015
Availability index and minimized reliability cost
E Suhir, L Bechou
Circuit Assemblies, 2013
182013
Localization of defects in die-attach assembly by continuous wavelet transform using scanning acoustic microscopy
L Bechou, L Angrisiani, Y Ousten, D Dallet, H Levi, P Daponte, Y Danto
Microelectronics Reliability 39 (6-7), 1095-1101, 1999
181999
Non‐destructive detection and localization of defects in multilayer ceramic chip capacitors using electromechanical resonances
L Bechou, S Mejdi, Y Ousten, Y Danto
Quality and reliability engineering international 12 (1), 43-53, 1996
181996
Crack propagation modeling in silicon: a comprehensive thermomechanical finite-element model approach for power devices
D Calvez, F Roqueta, S Jacques, L Bechou, Y Ousten, S Ducret
IEEE Transactions on Components, Packaging and Manufacturing Technology 4 (2 …, 2013
172013
Durability study of a fluorescent optical memory in glass studied by luminescence spectroscopy
A Royon, K Bourhis, L Béchou, T Cardinal, L Canioni, Y Deshayes
Microelectronics Reliability 53 (9-11), 1514-1518, 2013
172013
Le système ne peut pas réaliser cette opération maintenant. Veuillez réessayer plus tard.
Articles 1–20