Frank Sill Torres; Frank Sill; FS Torres; Frank Torres; F Torres; Torres, F.S.; Sill Torres, F
Frank Sill Torres; Frank Sill; FS Torres; Frank Torres; F Torres; Torres, F.S.; Sill Torres, F
German Aerospace Center (DLR) / Institute for the Protection of Maritime Infrastructures
Adresse e-mail validée de - Page d'accueil
Citée par
Citée par
USE: A universal, scalable, and efficient clocking scheme for QCA
CAT Campos, AL Marciano, OPV Neto, FS Torres
IEEE Transactions on computer-aided design of integrated circuits and …, 2015
An energy-aware model for the logic synthesis of quantum-dot cellular automata
FS Torres, R Wille, P Niemann, R Drechsler
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2018
Design of mixed gates for leakage reduction
F Sill, J You, D Timmermann
Proceedings of the 17th ACM Great Lakes symposium on VLSI, 263-268, 2007
An exact method for design exploration of quantum-dot cellular automata
M Walter, R Wille, D Große, FS Torres, R Drechsler
2018 Design, Automation & Test in Europe Conference & Exhibition (DATE), 503-508, 2018
A methodology for standard cell design for QCA
DA Reis, CAT Campos, TRBS Soares, OPV Neto, FS Torres
2016 IEEE International Symposium on Circuits and Systems (ISCAS), 2114-2117, 2016
Novel transient-fault detection circuit featuring enhanced bulk built-in current sensor with low-power sleep-mode
RP Bastos, FS Torres, G Di Natale, M Flottes, B Rouzeyre
Microelectronics Reliability 52 (9-10), 1781-1786, 2012
Low power gate-level design with mixed-V/sub th/(MVT) techniques
F Sill, F Grassert, D Timmermann
Proceedings. SBCCI 2004. 17th Symposium on Integrated Circuits and Systems …, 2004
Detection of transient faults in nanometer technologies by using modular built-in current sensors
FS Torres, RP Bastos
Journal of Integrated Circuits and Systems 8 (2), 89-97, 2013
Evaluation of the full operational cycle of a CMOS transfer-gated photodiode active pixel
PFL Retes, FS Torres, DW de Lima Monteiro
Microelectronics Journal 42 (11), 1269-1275, 2011
A bulk built-in sensor for detection of fault attacks
RP Bastos, FS Torres, JM Dutertre, ML Flottes, G Di Natale, B Rouzeyre
2013 IEEE International Symposium on Hardware-Oriented Security and Trust …, 2013
Robust modular bulk built-in current sensors for detection of transient faults
FS Torres, RP Bastos
2012 25th Symposium on Integrated Circuits and Systems Design (SBCCI), 1-6, 2012
Comparative analysis of network-on-chip simulation tools
S Khan, S Anjum, UA Gulzari, FS Torres
IET Computers & Digital Techniques 12 (1), 30-38, 2017
Comparison of bulk built-in current sensors in terms of transient-fault detection sensitivity
RP Bastos, JM Dutertre, FS Torres
2014 5th European Workshop on CMOS Variability (VARI), 1-6, 2014
A single built-in sensor to check pull-up and pull-down CMOS networks against transient faults
RP Bastos, FS Torres, JM Dutertre, ML Flottes, G Di Natale, B Rouzeyre
2013 23rd International Workshop on Power and Timing Modeling, Optimization …, 2013
High-speed, low-leakage integrated circuits: An evolutionary algorithm perspective
R Salomon, F Sill
Journal of Systems Architecture 53 (5-6), 321-327, 2007
Total leakage power optimization with improved Mixed Gates
F Sill, F Grassert, D Timmermann
Proceedings of the 18th annual symposium on Integrated circuits and system …, 2005
Distance-based large margin classifier suitable for integrated circuit implementation
LCB Torres, CL Castro, F Coelho, FS Torres, AP Braga
Electronics Letters 51 (24), 1967-1969, 2015
Scalable design for field-coupled nanocomputing circuits
M Walter, R Wille, FS Torres, D Große, R Drechsler
Proceedings of the 24th Asia and South Pacific Design Automation Conference …, 2019
Evaluating the impact of interconnections in Quantum-dot Cellular Automata
FS Torres, R Wille, M Walter, P Niemann, D Große, R Drechsler
2018 21st Euromicro Conference on Digital System Design (DSD), 649-656, 2018
Synchronization of clocked field-coupled circuits
FS Torres, M Walter, R Wille, D Große, R Drechsler
2018 IEEE 18th International Conference on Nanotechnology (IEEE-NANO), 1-5, 2018
Le système ne peut pas réaliser cette opération maintenant. Veuillez réessayer plus tard.
Articles 1–20