| Modular design of product families for quality and cost B Agard, S Bassetto International Journal of Production Research 51 (6), 1648-1667, 2013 | 90 | 2013 |
| Dynamic risk management unveil productivity improvements A Mili, S Bassetto, A Siadat, M Tollenaere Journal of Loss Prevention in the Process Industries 22 (1), 25-34, 2009 | 81 | 2009 |
| Quality control planning to prevent excessive scrap production B Bettayeb, SJ Bassetto, M Sahnoun Journal of Manufacturing Systems 33 (3), 400-411, 2014 | 40 | 2014 |
| Simulation-based optimization of sampling plans to reduce inspections while mastering the risk exposure in semiconductor manufacturing M Sahnoun, B Bettayeb, SJ Bassetto, M Tollenaere Journal of Intelligent Manufacturing 27, 1335-1349, 2016 | 33 | 2016 |
| A method for a robust optimization of joint product and supply chain design B Baud-Lavigne, S Bassetto, B Agard Journal of Intelligent Manufacturing 27, 741-749, 2016 | 31 | 2016 |
| A broader view of the economic design of the X-bar chart in the semiconductor industry B Baud-Lavigne, S Bassetto, B Penz International Journal of Production Research 48 (19), 5843-5857, 2010 | 30 | 2010 |
| Operational methods for improving manufacturing control plans: case study in a semiconductor industry S Bassetto, A Siadat Journal of intelligent manufacturing 20, 55-65, 2009 | 24 | 2009 |
| Quality and exposure control in semiconductor manufacturing. Part I: Modelling B Bettayeb, S Bassetto, P Vialletelle, M Tollenaere International Journal of Production Research 50 (23), 6835-6851, 2012 | 23 | 2012 |
| Developing machine-learning regression model with Logical Analysis of Data (LAD) RM Khalifa, S Yacout, S Bassetto Computers & Industrial Engineering 151, 106947, 2021 | 22 | 2021 |
| Optimisation of the process control in a semiconductor company: model and case study of defectivity sampling M Shanoun, S Bassetto, S Bastoini, P Vialletelle International Journal of Production Research 49 (13), 3873-3890, 2011 | 22 | 2011 |
| Case study: A semi-supervised methodology for anomaly detection and diagnosis A Morales-Forero, S Bassetto 2019 IEEE international conference on industrial engineering and engineering …, 2019 | 20 | 2019 |
| The management of process control deployment using interactions in risks analyses S Bassetto, A Siadat, M Tollenaere Journal of Loss Prevention in the Process Industries 24 (4), 458-465, 2011 | 20 | 2011 |
| Simulation and deep reinforcement learning for adaptive dispatching in semiconductor manufacturing systems AH Sakr, A Aboelhassan, S Yacout, S Bassetto Journal of Intelligent Manufacturing 34 (3), 1311-1324, 2023 | 17 | 2023 |
| Contribution à la qualification et amélioration des moyens de production: application à une usine de recherche et production de semiconducteurs S Bassetto Paris, ENSAM, 2005 | 17 | 2005 |
| Optimized design of control plans based on risk exposure and resources capabilities B Bettayeb, P Vialletelle, S Bassetto, M Tollenaere 2010 International Symposium on Semiconductor Manufacturing (ISSM), 1-4, 2010 | 13 | 2010 |
| STARS: the implementation of a Computer-Aided Employee Suggestion Management System to operationalize a continuous improvement process J Charron-Latour, S Bassetto, H Pourmonet Cognition, Technology & Work 19, 179-190, 2017 | 11 | 2017 |
| Including the voice of the client in the creative process: a case study of the integration of Quality Function Deployment (QFD) to the Value Proposition Design (VPD) in the … F Armellini, RA Pelicioni, PC Kaminski, S Bassetto The Journal of Modern Project Management 5 (2), 2017 | 11 | 2017 |
| Building discrete-event simulation for digital twin applications in production systems AH Sakr, A Aboelhassan, S Yacout, S Bassetto 2021 26th IEEE International Conference on Emerging Technologies and Factory …, 2021 | 10 | 2021 |
| Dynamic management of detected factory events and estimated risks using FMECA A Mili, A Siadat, S Hubac, S Bassetto 2008 4th IEEE International Conference on Management of Innovation and …, 2008 | 10 | 2008 |
| Risks analyses update based on maintenance events A Mili, S Hubac, S Bassetto, A Siadat IFAC Proceedings Volumes 41 (2), 34-39, 2008 | 10 | 2008 |
