Suivre
samuel bassetto
samuel bassetto
Adresse e-mail validée de polymtl.ca
Titre
Citée par
Citée par
Année
Modular design of product families for quality and cost
B Agard, S Bassetto
International Journal of Production Research 51 (6), 1648-1667, 2013
902013
Dynamic risk management unveil productivity improvements
A Mili, S Bassetto, A Siadat, M Tollenaere
Journal of Loss Prevention in the Process Industries 22 (1), 25-34, 2009
812009
Quality control planning to prevent excessive scrap production
B Bettayeb, SJ Bassetto, M Sahnoun
Journal of Manufacturing Systems 33 (3), 400-411, 2014
402014
Simulation-based optimization of sampling plans to reduce inspections while mastering the risk exposure in semiconductor manufacturing
M Sahnoun, B Bettayeb, SJ Bassetto, M Tollenaere
Journal of Intelligent Manufacturing 27, 1335-1349, 2016
342016
A method for a robust optimization of joint product and supply chain design
B Baud-Lavigne, S Bassetto, B Agard
Journal of Intelligent Manufacturing 27, 741-749, 2016
312016
A broader view of the economic design of the X-bar chart in the semiconductor industry
B Baud-Lavigne, S Bassetto, B Penz
International Journal of Production Research 48 (19), 5843-5857, 2010
302010
Quality and exposure control in semiconductor manufacturing. Part I: Modelling
B Bettayeb, S Bassetto, P Vialletelle, M Tollenaere
International Journal of Production Research 50 (23), 6835-6851, 2012
272012
Operational methods for improving manufacturing control plans: case study in a semiconductor industry
S Bassetto, A Siadat
Journal of intelligent manufacturing 20, 55-65, 2009
272009
Optimisation of the process control in a semiconductor company: model and case study of defectivity sampling
M Shanoun, S Bassetto, S Bastoini, P Vialletelle
International Journal of Production Research 49 (13), 3873-3890, 2011
242011
Case study: a semi-supervised methodology for anomaly detection and diagnosis
A Morales-Forero, S Bassetto
2019 IEEE international conference on industrial engineering and engineering …, 2019
202019
The management of process control deployment using interactions in risks analyses
S Bassetto, A Siadat, M Tollenaere
Journal of Loss Prevention in the Process Industries 24 (4), 458-465, 2011
202011
Developing machine-learning regression model with Logical Analysis of Data (LAD)
RM Khalifa, S Yacout, S Bassetto
Computers & Industrial Engineering 151, 106947, 2021
182021
Contribution à la qualification et amélioration des moyens de production: application à une usine de recherche et production de semiconducteurs
S Bassetto
Paris, ENSAM, 2005
172005
Simulation and deep reinforcement learning for adaptive dispatching in semiconductor manufacturing systems
AH Sakr, A Aboelhassan, S Yacout, S Bassetto
Journal of Intelligent Manufacturing 34 (3), 1311-1324, 2023
162023
Optimized design of control plans based on risk exposure and resources capabilities
B Bettayeb, P Vialletelle, S Bassetto, M Tollenaere
2010 International Symposium on Semiconductor Manufacturing (ISSM), 1-4, 2010
142010
Including the voice of the client in the creative process: a case study of the integration of Quality Function Deployment (QFD) to the Value Proposition Design (VPD) in the …
F Armellini, RA Pelicioni, PC Kaminski, S Bassetto
The Journal of Modern Project Management 5 (2), 2017
122017
Optimizing return on inspection trough defectivity smart sampling
M Sahnoun, P Vialletelle, S Bassetto, S Bastoini, M Tollenaere
2010 International Symposium on Semiconductor manufacturing (ISSM), 1-4, 2010
122010
Quality and exposure control in semiconductor manufacturing. Part II: Evaluation
B Bettayeb, S Bassetto, P Vialletelle, M Tollenaere
International Journal of Production Research 50 (23), 6852-6869, 2012
112012
Contribution à la qualification et amélioration des moyens de production
S Bassetto
Application à une usine de recherche et production de semi-conducteurs, 2005
112005
Experiencing production ramp-up education for engineers
S Bassetto, V Fiegenwald, C Cholez, F Mangione
European Journal of Engineering Education 36 (4), 313-326, 2011
102011
Le système ne peut pas réaliser cette opération maintenant. Veuillez réessayer plus tard.
Articles 1–20