Johan Hoefnagels
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Cavity ring-down spectroscopy: techniques and applications
G Berden, R Engeln
John Wiley & Sons, 2009
3022009
Strain localization and damage in dual phase steels investigated by coupled in-situ deformation experiments and crystal plasticity simulations
CC Tasan, JPM Hoefnagels, M Diehl, D Yan, F Roters, D Raabe
International Journal of Plasticity 63, 198-210, 2014
2702014
Microstructural banding effects clarified through micrographic digital image correlation
CC Tasan, JPM Hoefnagels, MGD Geers
Scripta Materialia 62 (11), 835-838, 2010
1582010
Experimental analysis of strain path dependent ductile damage mechanics and forming limits
CC Tasan, JPM Hoefnagels, C Ten Horn, MGD Geers
Mechanics of materials 41 (11), 1264-1276, 2009
972009
Cavity ring down study of the densities and kinetics of Si and SiH in a remote plasma
WMM Kessels, JPM Hoefnagels, MGH Boogaarts, DC Schram, ...
Journal of Applied Physics 89 (4), 2065-2073, 2001
752001
Cavity ring down detection of in a remote plasma and comparison with model calculations and mass spectrometry
WMM Kessels, A Leroux, MGH Boogaarts, JPM Hoefnagels, ...
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films 19 (2 …, 2001
712001
Quasi-Ice Monolayer on Atomically Smooth Amorphous at Room Temperature Observed with a High-Finesse Optical Resonator
IMP Aarts, ACR Pipino, JPM Hoefnagels, WMM Kessels, ...
Physical review letters 95 (16), 166104, 2005
632005
Stretching-induced interconnect delamination in stretchable electronic circuits
O Van Der Sluis, YY Hsu, PHM Timmermans, M Gonzalez, ...
Journal of Physics D: Applied Physics 44 (3), 034008, 2010
612010
Identification of the continuum damage parameter: An experimental challenge in modeling damage evolution
CC Tasan, JPM Hoefnagels, MGD Geers
Acta Materialia 60 (8), 3581-3589, 2012
582012
Interface debonding characterization by image correlation integrated with double cantilever beam kinematics
B Blaysat, JPM Hoefnagels, G Lubineau, M Alfano, MGD Geers
International Journal of Solids and Structures 55, 79-91, 2015
542015
Time-resolved cavity ring-down spectroscopic study of the gas phase and surface loss rates of Si and SiH3 plasma radicals
JPM Hoefnagels, AAE Stevens, MGH Boogaarts, WMM Kessels, ...
Chemical physics letters 360 (1-2), 189-193, 2002
532002
Improvement of hydrogenated amorphous silicon properties with increasing contribution of to film growth
WMM Kessels, MGH Boogaarts, JPM Hoefnagels, DC Schram, ...
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films 19 (3 …, 2001
462001
Time-resolved cavity ringdown study of the and surface reaction probability during plasma deposition of at different substrate temperatures
JPM Hoefnagels, Y Barrell, WMM Kessels, MCM Van de Sanden
Journal of applied physics 96 (8), 4094-4106, 2004
452004
Copper–rubber interface delamination in stretchable electronics
JPM Hoefnagels, J Neggers, PHM Timmermans, O van der Sluis, ...
Scripta Materialia 63 (8), 875-878, 2010
432010
Absolute surface coverage measurement using a vibrational overtone
ACR Pipino, JPM Hoefnagels, N Watanabe
The Journal of chemical physics 120 (6), 2879-2888, 2004
422004
Time‐resolved integrated digital image correlation
J Neggers, JPM Hoefnagels, MGD Geers, F Hild, S Roux
International Journal for Numerical Methods in Engineering 103 (3), 157-182, 2015
412015
Temperature dependence of the surface reactivity of SiH3 radicals and the surface silicon hydride composition during amorphous silicon growth
WMM Kessels, JPM Hoefnagels, PJ Van den Oever, Y Barrell, ...
Surface science 547 (3), L865-L870, 2003
412003
Direct stress-strain measurements from bulged membranes using topography image correlation
J Neggers, JPM Hoefnagels, F Hild, S Roux, MGD Geers
Experimental Mechanics 54 (5), 717-727, 2014
402014
Processing induced size effects in plastic yielding upon miniaturisation
PJM Janssen, JPM Hoefnagels, TH de Keijser, MGD Geers
Journal of the Mechanics and Physics of Solids 56 (8), 2687-2706, 2008
402008
Block and sub-block boundary strengthening in lath martensite
C Du, JPM Hoefnagels, R Vaes, MGD Geers
Scripta Materialia 116, 117-121, 2016
392016
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