Helmut Dosch
Helmut Dosch
DESY-Director, Hamburg
Adresse e-mail validée de desy.de - Page d'accueil
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Molecular layering of fluorinated ionic liquids at a charged sapphire (0001) surface
M Mezger, H Schröder, H Reichert, S Schramm, JS Okasinski, S Schöder, ...
Science 322 (5900), 424-428, 2008
5922008
Critical phenomena at surfaces and interfaces: evanescent X-ray and neutron scattering
H Dosch
Springer, 2006
4542006
Observation of five-fold local symmetry in liquid lead
H Reichert, O Klein, H Dosch, M Denk, V Honkimäki, T Lippmann, ...
Nature 408 (6814), 839-841, 2000
3352000
High-resolution in situ x-ray study of the hydrophobic gap at the water–octadecyl-trichlorosilane interface
M Mezger, H Reichert, S Schöder, J Okasinski, H Schröder, H Dosch, ...
Proceedings of the National Academy of Sciences 103 (49), 18401-18404, 2006
2882006
Organic n-channel transistors based on core-cyanated perylene carboxylic diimide derivatives
RT Weitz, K Amsharov, U Zschieschang, EB Villas, DK Goswami, ...
Journal of the American Chemical Society 130 (14), 4637-4645, 2008
2672008
Kinetic hindrance during the initial oxidation of Pd (100) at ambient pressures
E Lundgren, J Gustafson, A Mikkelsen, JN Andersen, A Stierle, H Dosch, ...
Physical review letters 92 (4), 046101, 2004
2462004
X-ray cross correlation analysis uncovers hidden local symmetries in disordered matter
P Wochner, C Gutt, T Autenrieth, T Demmer, V Bugaev, AD Ortiz, A Duri, ...
Proceedings of the National Academy of Sciences 106 (28), 11511-11514, 2009
2302009
Shape changes of supported Rh nanoparticles during oxidation and reduction cycles
P Nolte, A Stierle, NY Jin-Phillipp, N Kasper, TU Schulli, H Dosch
Science 321 (5896), 1654-1658, 2008
2132008
Initial corrosion observed on the atomic scale
FU Renner, A Stierle, H Dosch, DM Kolb, TL Lee, J Zegenhagen
Nature 439 (7077), 707-710, 2006
2062006
Depth-controlled grazing-incidence diffraction of synchrotron x radiation
H Dosch, BW Batterman, DC Wack
Physical review letters 56 (11), 1144, 1986
2001986
Rapid roughening in thin film growth of an organic semiconductor (diindenoperylene)
AC Dürr, F Schreiber, KA Ritley, V Kruppa, J Krug, H Dosch, B Struth
Physical review letters 90 (1), 016104, 2003
1982003
Interfacial melting of ice in contact with SiO 2
S Engemann, H Reichert, H Dosch, J Bilgram, V Honkimäki, A Snigirev
Physical review letters 92 (20), 205701, 2004
1962004
Evanescent absorption in kinematic surface Bragg diffraction
H Dosch
Physical Review B 35 (5), 2137, 1987
1901987
X-ray diffraction study of the ultrathin Al2O3 layer on NiAl (110)
A Stierle, F Renner, R Streitel, H Dosch, W Drube, BC Cowie
Science 303 (5664), 1652-1656, 2004
1892004
Glancing-angle X-ray scattering studies of the premelting of ice surfaces
H Dosch, A Lied, JH Bilgram
Surface science 327 (1-2), 145-164, 1995
1861995
Morphology and thermal stability of metal contacts on crystalline organic thin films
AC Dürr, F Schreiber, M Kelsch, HD Carstanjen, H Dosch
Advanced Materials 14 (13‐14), 961-963, 2002
1702002
High structural order in thin films of the organic semiconductor diindenoperylene
AC Dürr, F Schreiber, M Münch, N Karl, B Krause, V Kruppa, H Dosch
Applied Physics Letters 81 (12), 2276-2278, 2002
1672002
Interplay between morphology, structure, and electronic properties at diindenoperylene-gold interfaces
AC Dürr, N Koch, M Kelsch, A Rühm, J Ghijsen, RL Johnson, JJ Pireaux, ...
Physical Review B 68 (11), 115428, 2003
1522003
Surface melting of ice single crystals revealed by glancing angle x-ray scattering
A Lied, H Dosch, JH Bilgram
Physical Review Letters 72 (22), 3554, 1994
1491994
Layering of -based ionic liquids at a charged sapphire interface
M Mezger, S Schramm, H Schröder, H Reichert, M Deutsch, EJ De Souza, ...
The Journal of chemical physics 131 (9), 094701, 2009
1472009
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