| Reconfigurable distributed network control system for industrial plant automation J García, FR Palomo, A Luque, C Aracil, JM Quero, D Carrión, F Gámiz, ... IEEE Transactions on Industrial Electronics 51 (6), 1168-1180, 2004 | 80 | 2004 |
| High-accuracy determination of the neutron flux in the new experimental area n_TOF-EAR2 at CERN M Sabate-Gilarte, M Barbagallo, N Colonna, F Gunsing, P Žugec, ... The European Physical Journal A 53, 1-13, 2017 | 70 | 2017 |
| Design of control systems for portable PEM fuel cells AP Vega-Leal, FR Palomo, F Barragan, C García, JJ Brey Journal of power sources 169 (1), 194-197, 2007 | 68 | 2007 |
| Compiler-directed soft error mitigation for embedded systems A Martinez-Alvarez, S Cuenca-Asensi, F Restrepo-Calle, FRP Pinto, ... IEEE Transactions on Dependable and Secure Computing 9 (2), 159-172, 2011 | 61 | 2011 |
| FTUNSHADES2: A novel platform for early evaluation of robustness against SEE JM Mogollon, H Guzman-Miranda, J Napoles, J Barrientos, MA Aguirre 2011 12th European Conference on Radiation and Its Effects on Components and …, 2011 | 60 | 2011 |
| Nuclear data activities at the n_TOF facility at CERN n_TOF Collaboration, F Gunsing, O Aberle, J Andrzejewski, L Audouin, ... The European Physical Journal Plus 131, 1-13, 2016 | 47 | 2016 |
| A novel co-design approach for soft errors mitigation in embedded systems S Cuenca-Asensi, A Martinez-Alvarez, F Restrepo-Calle, FR Palomo, ... IEEE Transactions on Nuclear Science 58 (3), 1059-1065, 2011 | 44 | 2011 |
| Test results and prospects for RD53A, a large scale 65 nm CMOS chip for pixel readout at the HL-LHC L Gaioni, RD53 Collaboration Nuclear Instruments and Methods in Physics Research Section A: Accelerators …, 2019 | 34 | 2019 |
| Simulation of total ionising dose in MOS capacitors P Fernández-Martínez, I Cortés, S Hidalgo, D Flores, FR Palomo Proceedings of the 8th Spanish Conference on Electron Devices, CDE'2011, 1-4, 2011 | 33 | 2011 |
| Recent progress of RD53 Collaboration towards next generation Pixel Read-Out Chip for HL-LHC N Demaria, MB Barbero, D Fougeron, F Gensolen, S Godiot, M Menouni, ... Journal of Instrumentation 11 (12), C12058, 2016 | 30 | 2016 |
| Mixed-mode simulation of bit-flip with pulsed laser FR Palomo, JM Mogollon, J Napoles, MA Aguirre IEEE Transactions on Nuclear Science 57 (4), 1884-1891, 2010 | 28 | 2010 |
| Ionizing radiation hardness tests of GaN HEMTs for harsh environments ACV Bôas, MAA de Melo, RBB Santos, R Giacomini, NH Medina, ... Microelectronics Reliability 116, 114000, 2021 | 27 | 2021 |
| Automatic single event effects sensitivity analysis of a 13-bit successive approximation ADC F Márquez, F Munoz, FR Palomo, L Sanz, E Lopez-Morillo, MA Aguirre, ... IEEE Transactions on Nuclear Science 62 (4), 1609-1616, 2015 | 26 | 2015 |
| Measurement of 73Ge (n, γ) cross sections and implications for stellar nucleosynthesis C Lederer-Woods, U Battino, P Ferreira, A Gawlik, C Guerrero, F Gunsing, ... Physics letters B 790, 458-465, 2019 | 22 | 2019 |
| Pulsed laser SEU cross section measurement using coincidence detectors FR Palomo, JM Mogollon, J Napoles, H Guzman-Miranda, AP Vega-Leal, ... IEEE Transactions on Nuclear Science 56 (4), 2001-2007, 2009 | 22 | 2009 |
| Ionizing radiation damage in 65 nm CMOS technology: Influence of geometry, bias and temperature at ultra-high doses G Borghello, E Lerario, F Faccio, HD Koch, G Termo, S Michelis, ... Microelectronics Reliability 116, 114016, 2021 | 21 | 2021 |
| Development of a tabletop setup for the transient current technique using two-photon absorption in silicon particle detectors M Wiehe, MF García, M Moll, R Montero, FR Palomo, I Vila, ... IEEE Transactions on Nuclear Science 68 (2), 220-228, 2020 | 21 | 2020 |
| High-resolution three-dimensional imaging of a depleted CMOS sensor using an edge Transient Current Technique based on the Two Photon Absorption process (TPA-eTCT) MF García, JG Sánchez, RJ Echeverría, M Moll, RM Santos, D Moya, ... Nuclear Instruments and Methods in Physics Research Section A: Accelerators …, 2017 | 20 | 2017 |
| TCAD simulations on CMOS propagation induced pulse broadening effect: Dependence analysis on the threshold voltage JM Mogollón, FR Palomo, MA Aguirre, J Nápoles, H Guzmán-Miranda, ... IEEE Transactions on nuclear science 57 (4), 1908-1914, 2010 | 19 | 2010 |
| A test of HIL COTS technology for fuel cell systems emulation FRP Pinto, AP Vega-Leal IEEE Transactions on Industrial Electronics 57 (4), 1237-1244, 2009 | 19 | 2009 |
