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Nadjet Rouag
Nadjet Rouag
Professor of Material Science, Université Mentouri Constanrine
Adresse e-mail validée de umc.edu.dz
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Consideration of Zener drag effect by introducing a limiting radius for neighbourhood in grain growth simulation
N Maazi, N Rouag
Journal of Crystal Growth 243 (2), 361-369, 2002
572002
Growth mechanism for chromium nitride films deposited by magnetron and triode sputtering methods
L Chekour, C Nouveau, A Chala, C Labidi, N Rouag, MA Djouadi
Surface and Coatings Technology 200 (1-4), 241-244, 2005
372005
Influence of neighbourhood on abnormal Goss grain growth in Fe–3% Si steels: Formation of island grains in the large growing grain
N Maazi, N Rouag, AL Etter, R Penelle, T Baudin
Scripta materialia 55 (7), 641-644, 2006
362006
Grain Orientation Spread values in IF steels after plastic deformation and recrystallization
A Ayad, N Allain-Bonasso, N Rouag, F Wagner
Materials Science Forum 702, 269-272, 2012
342012
Grain Orientation Spread values in IF steels after plastic deformation and recrystallization
A Ayad, N Allain-Bonasso, N Rouag, F Wagner
Materials Science Forum 702, 269-272, 2012
342012
Accelerated Potts model for grain growth–Application to an IF steel
A Ayad, F Wagner, N Rouag, AD Rollett
Computational materials science 68, 189-197, 2013
212013
Evolution of local texture and grain boundary characteristics during secondary recrystallisation of Fe-3% Si sheets
N Rouag, G Vigna, R Penelle
Acta Metallurgica et Materialia 38 (6), 1101-1107, 1990
211990
XRD peak broadening characterization of deformed microstructures and heterogeneous behavior of carbon steel
M Bouras, A Boumaiza, V Ji, N Rouag
Theoretical and applied fracture mechanics 61, 51-56, 2012
172012
Textured hexagonal and cubic phases of AlN films deposited on Si (100) by DC magnetron sputtering and high power impulse magnetron sputtering
B Riah, A Ayad, J Camus, M Rammal, F Boukari, L Chekour, MA Djouadi, ...
Thin Solid Films 655, 34-40, 2018
152018
Hetero-epitaxial growth of AlN deposited by DC magnetron sputtering on Si (111) using a AlN buffer layer
B Riah, J Camus, A Ayad, M Rammal, R Zernadji, N Rouag, MA Djouadi
Coatings 11 (9), 1063, 2021
142021
The nondestructive estimation of mechanical properties of a carbon steel by X-ray diffraction peak broadening
A Boumaiza, V Ji, N Rouag
Journal of Testing and Evaluation 37 (4), 343-346, 2009
102009
Onset of abnormal growth related to the crystallographic neighbourhood from the texture function. Application to Goss grain growth in magnetic sheets of Fe–3% Si
H Afer, N Rouag, R Penelle
Journal of crystal growth 268 (1-2), 320-327, 2004
102004
Modelling grain growth in the presence of Zener drag: application for Fe-3% Si
N Maazi, N Rouag
Modelling and simulation in materials science and engineering 9 (5), 423, 2001
92001
Characterization of nitride thin films using SEM and EDX
F Mammeri, L Chekour, N Rouag
Acta Physica Polonica A 123 (2), 294-295, 2013
82013
Electron backscattered diffraction of transgranular crack propagation in soft steel
A Boumaiza, T Baudin, N Rouag, R Penelle
Chinese Physics Letters 24 (6), 1759, 2007
82007
Mathematical and Electrochemical Investigation of Lamium flexuosum Extract as Effective Corrosion Inhibitor for CS in Acidic Solution Using Multidimensional …
H Mahfoud, N Rouag, S Boudiba, M Benahmed, K Morakchi, S Akkal
Arabian Journal for Science and Engineering 47 (5), 6605-6616, 2022
62022
Optimization of stress–strain behavior parameters by genetic algorithms method: Application to soft-matrix two-phase alloys
R Taouche, N Rouag
Computational mechanics 30, 297-302, 2003
62003
PARAMETERS ON ABNORMAL GRAIN GROWTH IN Fe-3% Si SHEETS
N Rouag, R Penelle
Textures and Microstructures 11, 203-217, 1989
4*1989
Influence de la texture cristallographique et de la spécialité des joints de grains sur l'anisotropie de migration des joints entourant un grain d'orientation (110) 001au cours …
N Rouag, J Philibert
41988
Normalized differential conductance to study current conduction mechanisms in MOS structures
TH Nouibat, Z Messai, D Chikouch, Z Ouennoughi, N Rouag, M Rommel, ...
Microelectronics Reliability 91, 183-187, 2018
32018
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