Jeremy Guy
Jeremy Guy
Crossbar Inc
Verified email at crossbar-inc.com
Title
Cited by
Cited by
Year
Sb-doped GeS2as performance and reliability booster in Conductive Bridge RAM
E Vianello, G Molas, F Longnos, P Blaise, E Souchier, C Cagli, G Palma, ...
2012 International Electron Devices Meeting, 31.5. 1-31.5. 4, 2012
482012
Investigation of the physical mechanisms governing data-retention in down to 10nm nano-trench Al2O3/CuTeGe conductive bridge RAM (CBRAM)
J Guy, G Molas, E Vianello, F Longnos, S Blanc, C Carabasse, M Bernard, ...
2013 IEEE International Electron Devices Meeting, 30.2. 1-30.2. 4, 2013
412013
Controlling oxygen vacancies in doped oxide based CBRAM for improved memory performances
G Molas, E Vianello, F Dahmani, M Barci, P Blaise, J Guy, A Toffoli, ...
2014 IEEE International Electron Devices Meeting, 6.1. 1-6.1. 4, 2014
332014
Investigation of forming, SET, and data retention of conductive-bridge random-access memory for stack optimization
J Guy, G Molas, P Blaise, M Bernard, A Roule, G Le Carval, V Delaye, ...
IEEE Transactions on Electron Devices 62 (11), 3482-3489, 2015
312015
Experimental and theoretical understanding of Forming, SET and RESET operations in Conductive Bridge RAM (CBRAM) for memory stack optimization
J Guy, G Molas, P Blaise, C Carabasse, M Bernard, A Roule, G Le Carval, ...
2014 IEEE International Electron Devices Meeting, 6.5. 1-6.5. 4, 2014
222014
Impact of SET and RESET conditions on CBRAM high temperature data retention
M Barci, J Guy, G Molas, E Vianello, A Toffoli, J Cluzel, A Roule, ...
2014 IEEE International Reliability Physics Symposium, 5E. 3.1-5E. 3.4, 2014
172014
Effect of the active layer thickness and temperature on the switching kinetics of GeS2-based conductive bridge memories
G Palma, E Vianello, G Molas, C Cagli, F Longnos, J Guy, M Reyboz, ...
Japanese Journal of Applied Physics 52 (4S), 04CD02, 2013
172013
Guidance to reliability improvement in CBRAM using advanced KMC modelling
J Guy, G Molas, C Cagli, M Bernard, A Roule, C Carabasse, A Toffoli, ...
2017 IEEE International Reliability Physics Symposium (IRPS), PM-2.1-PM-2.5, 2017
72017
Functionality and reliability of resistive RAM (RRAM) for non-volatile memory applications
G Molas, G Piccolboni, M Barci, B Traore, J Guy, G Palma, E Vianello, ...
2016 International Symposium on VLSI Technology, Systems and Application …, 2016
52016
Impact of Sb doping on power consumption and retention reliability of GeS2 based conductive bridge random access memory
J Guy, G Molas, E Vianello, C Carabasse, P Blaise, M Bernard, ...
Thin Solid Films 563, 15-19, 2014
52014
Evaluation des performances des mémoires CBRAM (Conductive Bridge Memory) afin d’optimiser les empilements technologiques et les solutions d’intégration
J Guy
Université Grenoble Alpes (ComUE), 2015
32015
Method for determining electrical parameters used to programme a resistive random access memory
G Molas, GUY Jérémy
US Patent 9,633,725, 2017
22017
Conductive bridge ram (cbram): functionality, reliability and applications
G Molas, J Guy, M Barci, F Longnos, G Palma, E Vianello, P Blaise, ...
International Conference on Solid State Devices and Materials (SSDM) 2015, 2015
22015
Resistive random access memory program and erase techniques and apparatus
J Guy, SH Jo, H Nazarian, R Shah, L Zhao
US Patent 10,998,064, 2021
12021
Distinct chip identifier sequence utilizing unclonable characteristics of resistive memory on a chip
SH Jo, H Nazarian, S Nguyen, J Guy, Z Li
US Patent App. 17/223,817, 2021
2021
Resistive random access memory erase techniques and apparatus
J Guy, SH Jo, H Nazarian, R Shah, L Zhao
US Patent App. 17/242,015, 2021
2021
Evaluation of the performances of scaled CBRAM devices to optimize technological solutions and integration flows
J Guy
Université Grenoble Alpes, 2015
2015
Resistive Memory Fully Compatible with Advanced CMOS Nodes
J Guy, A Prakash, SH Jo
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Articles 1–18