| Unified method for determining the complex propagation constant of reflecting and nonreflecting transmission lines JA Reynoso-Hernandez IEEE Microwave and Wireless Components Letters 13 (8), 351-353, 2003 | 128 | 2003 |
| Analytical model and parameter extraction to account for the pad parasitics in RF-CMOS R Torres-Torres, R Murphy-Arteaga, JA Reynoso-Hernández IEEE Transactions on Electron Devices 52 (7), 1335-1342, 2005 | 96 | 2005 |
| Full RF characterization for extracting the small-signal equivalent circuit in microwave FETs JA Reynoso-Hernandez, FE Rangel-Patino, J Perdomo IEEE transactions on Microwave Theory and Techniques 44 (12), 2625-2633, 1996 | 69 | 1996 |
| An improved method for the wave propagation constant γ estimation in broadband uniform millimeter‐wave transmission line JA Reynoso‐Hernández, CF Estrada‐Maldonado, T Parra, K Grenier, ... Microwave and Optical Technology Letters 22 (4), 268-271, 1999 | 61 | 1999 |
| Advances in linear modeling of microwave transistors A Zarate-de Landa, JE Zuniga-Juarez, JR Loo-Yau, ... IEEE Microwave magazine 10 (2), 100, 102-111, 146, 2009 | 45 | 2009 |
| Output conductance frequency dispersion and low-frequency noise in HEMTs and MESFETs JA Reynoso-Hernandez, J Graffeuil IEEE transactions on microwave theory and techniques 37 (9), 1478-1481, 1989 | 41 | 1989 |
| Artificial neural network model of SOS-MOSFETs based on dynamic large-signal measurements Y Ko, P Roblin, A Zárate-de Landa, JA Reynoso-Hernandez, D Nobbe, ... IEEE Transactions on Microwave Theory and Techniques 62 (3), 491-501, 2014 | 39 | 2014 |
| Study on the Al/silicon rich oxide/Si structure as a surge suppressor, DC, frequency response and modeling M Aceves, J Pedraza, JA Reynoso-Hernandez, C Falcony, W Calleja Microelectronics Journal 30 (9), 855-862, 1999 | 26 | 1999 |
| Generalized theory of the thru-reflect-match calibration technique MA Pulido-Gaytán, JA Reynoso-Hernández, JR Loo-Yau, ... IEEE Transactions on Microwave Theory and Techniques 63 (5), 1693-1699, 2015 | 22 | 2015 |
| Flexible test bed for the behavioural modelling of power amplifiers JC Nuñez-Perez, JR Cardenas-Valdez, C Gontrand, ... COMPEL: The International Journal for Computation and Mathematics in …, 2014 | 22 | 2014 |
| A new and better method for extracting the parasitic elements of on-wafer GaN transistors A Zárate-de Landa, JE Zuniga-Juarez, JA Reynoso-Hernández, ... 2007 IEEE/MTT-S International Microwave Symposium, 791-794, 2007 | 22 | 2007 |
| Using lines of arbitrary impedance as standards on the TRL calibration technique JA Reynoso-Hernandez, MA Pulido-Gaytan, A Zarate-de Landa, ... 81st ARFTG Microwave Measurement Conference, 1-4, 2013 | 21 | 2013 |
| An improved two-tier LL method for characterizing symmetrical microwave test fixtures JE Zúñiga-Juárez, JA Reynoso-Hernández, JR Loo-Yau, ... Measurement 44 (9), 1491-1498, 2011 | 18 | 2011 |
| An improved multiline TRL method JE Zuniga-Juarez, JA Reynoso-Hernandez, MC Maya-Sanchez 2006 67th ARFTG Conference, 139-142, 2006 | 18 | 2006 |
| Modeling the I‐V characteristics of the power microwave FETs with the Angelov model using pulse measurements JR Loo‐Yau, JA Reynoso‐Hernández, JE Zuniga, FI Hirata‐Flores, ... Microwave and optical technology letters 48 (6), 1046-1050, 2006 | 18 | 2006 |
| Reliable method for computing the phase shift of multiline LRL calibration technique JA Reynoso-Hernandez IEEE microwave and wireless components letters 12 (10), 395-397, 2002 | 15 | 2002 |
| Modeling memory effects in RF power amplifiers applied to a digital pre-distortion algorithm and emulated on a DSP-FPGA board JR Cárdenas-Valdez, JC Núñez-Pérez, JA Galaviz-Aguilar, ... Integration 49, 49-64, 2015 | 14 | 2015 |
| Vector network analyzer calibration using a line and two offset reflecting loads MA Pulido-Gaytán, JA Reynoso-Hernández, A Zárate-de Landa, ... IEEE transactions on microwave theory and techniques 61 (9), 3417-3423, 2013 | 14 | 2013 |
| A new analytical method to calculate the characteristic impedance ZC of uniform transmission lines JE Zúñiga-Juárez, JA Reynoso-Hernández, MC Maya-Sánchez, ... Computación y Sistemas 16 (3), 277-285, 2012 | 14 | 2012 |
| What can the ABCD parameters tell us about the TRL? JA Reynoso-Hernandez, MA Pulido-Gaytan, MC Maya-Sanchez, ... 79th ARFTG Microwave Measurement Conference, 1-4, 2012 | 14 | 2012 |
Andrés Zárate-de LandaPeregrine SemiconductorAdresse e-mail validée de psemi.com
