Gabin An
Cited by
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PyGGI 2.0: language independent genetic improvement framework
G An, A Blot, J Petke, S Yoo
Proceedings of the 12th Joint Meeting on Foundations of Software Engineering …, 2019
Comparing line and AST granularity level for program repair using PyGGI
G An, J Kim, S Yoo
Proceedings of the 4th International Workshop on Genetic Improvement …, 2018
Searching for multi-fault programs in defects4j
G An, J Yoon, S Yoo
International Symposium on Search Based Software Engineering, 153-158, 2021
A Preliminary Evaluation of LLM-Based Fault Localization
S Kang*, G An*, S Yoo
arXiv preprint arXiv:2308.05487, 2023
PyGGI: Python General framework for Genetic Improvement
G An, J Kim, S Lee, S Yoo
Proceedings of Korea Software Congress, 536-538, 2017
Ahead of Time Mutation Based Fault Localisation using Statistical Inference
J Kim, G An, R Feldt, S Yoo
2021 IEEE 32nd International Symposium on Software Reliability Engineering …, 2019
Assisting Bug Report Assignment Using Automated Fault Localisation: An Industrial Case Study
J Sohn*, G An*, J Hong, D Hwang, S Yoo
2021 14th IEEE Conference on Software Testing, Verification and Validation …, 2021
FDG: A Precise Measurement of Fault Diagnosability Gain of Test Cases
G An, S Yoo
Proceedings of the 31st ACM SIGSOFT International Symposium on Software …, 2022
Automatically Identifying Shared Root Causes of Test Breakages in SAP HANA
G An, J Yoon, J Sohn, J Hong, D Hwang, S Yoo
2022 IEEE/ACM 44th International Conference on Software Engineering …, 2022
Reducing the search space of bug inducing commits using failure coverage
G An, S Yoo
Proceedings of the 29th ACM Joint Meeting on European Software Engineering …, 2021
Fonte: Finding Bug Inducing Commits from Failures
G An, J Hong, N Kim, S Yoo
2023 IEEE/ACM 45th International Conference on Software Engineering (ICSE …, 2023
Just-in-time flaky test detection via abstracted failure symptom matching
G An, J Yoon, T Bach, J Hong, S Yoo
arXiv preprint arXiv:2310.06298, 2023
The state and future of genetic improvement
WB Langdon, W Weimer, C Timperley, O Krauss, ZY Ding, Y Lyu, ...
ACM SIGSOFT Software Engineering Notes 44 (3), 25-29, 2019
BUGSC++: A Highly Usable Real World Defect Benchmark for C/C++
G An, M Kwon, K Choi, J Yi, S Yoo
2023 38th IEEE/ACM International Conference on Automated Software …, 2023
Improving Test Distance for Failure Clustering with Hypergraph Modelling
G An, J Yoon, JJ Whang, S Yoo
arXiv preprint arXiv:2104.10360, 2021
Genetic Improvement@ ICSE 2023
WB Langdon, V Nowack, J Petke, M Wagner, H Lee, EM Fredericks, G An, ...
ACM SIGSOFT Software Engineering Notes 48 (4), 51-59, 2023
Learning test-mutant relationship for accurate fault localisation
J Kim, G An, R Feldt, S Yoo
Information and Software Technology 162, 107272, 2023
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