Nate Kupp
Title
Cited by
Cited by
Year
Experiences in hardware Trojan design and implementation
Y Jin, N Kupp, Y Makris
2009 IEEE International Workshop on Hardware-Oriented Security and Trust, 50-57, 2009
2582009
DFTT: Design for Trojan test
Y Jin, N Kupp, Y Makris
2010 17th IEEE International Conference on Electronics, Circuits and Systems …, 2010
442010
Improving analog and RF device yield through performance calibration
N Kupp, H Huang, Y Makris, P Drineas
IEEE Design & Test of Computers 28 (3), 64-75, 2010
362010
Post-production performance calibration in analog/RF devices
N Kupp, H Huang, P Drineas, Y Makris
2010 IEEE International Test Conference, 1-10, 2010
322010
Spatial estimation of wafer measurement parameters using gaussian process models
N Kupp, K Huang, J Carulli, Y Makris
2012 IEEE International Test Conference, 1-8, 2012
292012
Spatial correlation modeling for probe test cost reduction in RF devices
N Kupp, K Huang, JM Carulli, Y Makris
2012 IEEE/ACM International Conference on Computer-Aided Design (ICCAD), 23-29, 2012
282012
Correlating inline data with final test outcomes in analog/RF devices
N Kupp, M Slamani, Y Makris
2011 Design, Automation & Test in Europe, 1-6, 2011
232011
Confidence estimation in non-RF to RF correlation-based specification test compaction
N Kupp, P Drineas, M Slamani, Y Makris
2008 13th European Test Symposium, 35-40, 2008
232008
A comparative study of one-shot statistical calibration methods for analog/RF ICs
Y Lu, KS Subramani, H Huang, N Kupp, K Huang, Y Makris
2015 IEEE International Test Conference (ITC), 1-10, 2015
212015
Handling discontinuous effects in modeling spatial correlation of wafer-level analog/RF tests
K Huang, N Kupp, JM Carulli, Y Makris
2013 Design, Automation & Test in Europe Conference & Exhibition (DATE), 553-558, 2013
182013
On proving the efficiency of alternative RF tests
N Kupp, H Stratigopoulos, P Drineas, Y Makris
2011 IEEE/ACM International Conference on Computer-Aided Design (ICCAD), 762-767, 2011
172011
On boosting the accuracy of non-RF to RF correlation-based specification test compaction
N Kupp, P Drineas, M Slamani, Y Makris
Journal of Electronic Testing 25 (6), 309-321, 2009
172009
Applying the model-view-controller paradigm to adaptive test
N Kupp, Y Makris
IEEE Design & Test of computers 29 (1), 28-35, 2011
152011
Process monitoring through wafer-level spatial variation decomposition
K Huang, N Kupp, JM Carulli, Y Makris
2013 IEEE International Test Conference (ITC), 1-10, 2013
142013
Low-cost analog/RF IC testing through combined intra-and inter-die correlation models
K Huang, N Kupp, C Xanthopoulos, JM Carulli, Y Makris
IEEE Design & Test 32 (1), 53-60, 2014
112014
On combining alternate test with spatial correlation modeling in analog/RF ICs
K Huang, N Kupp, JM Carulli, Y Makris
2013 18th IEEE European Test Symposium (ETS), 1-6, 2013
112013
A low cost advance encryption standard (AES) co-processor implementation
OJ Hernandez, T Sodon, M Adel, N Kupp
Journal of Computer Science & Technology 8, 2008
92008
Integrated optimization of semiconductor manufacturing: a machine learning approach
N Kupp, Y Makris
2012 IEEE International Test Conference, 1-10, 2012
72012
CSAW 2008 Team Report (Yale University)
Y Jin, N Kupp
CSAW Embedded System Challenge, 2008
62008
On-device energy estimation for portable electronic devices
AK Vyas, A Pathak, DS Choi, A Ramadurai, NK Kupp, Z Zeng
US Patent App. 14/176,819, 2014
42014
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