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Peter Borgesen
Peter Borgesen
Professor of Systems Science & Industrial Engineering, Binghamton University
Adresse e-mail validée de binghamton.edu - Page d'accueil
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Stress evolution due to electromigration in confined metal lines
MA Korhonen, P Borgesen, KN Tu, CY Li
Journal of Applied Physics 73 (8), 3790-3799, 1993
8411993
Growth of Sn and intermetallic compounds in Sn-Ag-Cu solder
LP Lehman, SN Athavale, TZ Fullem, AC Giamis, RK Kinyanjui, ...
Journal of Electronic Materials 33, 1429-1439, 2004
2092004
Microstructure based statistical model of electromigration damage in confined line metallizations in the presence of thermally induced stresses
MA Korhonen, P Borgesen, DD Brown, CY Li
Journal of applied physics 74 (8), 4995-5004, 1993
1781993
Recrystallization and precipitate coarsening in Pb-free solder joints during thermomechanical fatigue
L Yin, L Wentlent, LL Yang, B Arfaei, A Oasaimeh, P Borgesen
Journal of electronic materials 41, 241-252, 2012
1542012
Classifying the dimensional variation in additive manufactured parts from laser-scanned three-dimensional point cloud data using machine learning approaches
M Samie Tootooni, A Dsouza, R Donovan, PK Rao, Z Kong, P Borgesen
Journal of Manufacturing Science and Engineering 139 (9), 091005, 2017
1532017
The growth of intermetallic compounds at Sn-Ag-Cu solder/Cu and Sn-Ag-Cu solder/Ni interfaces and the associated evolution of the solder microstructure
A Zribi, A Clark, L Zavalij, P Borgesen, EJ Cotts
Journal of Electronic Materials 30, 1157-1164, 2001
1522001
On the root cause of Kirkendall voiding in Cu3Sn
L Yin, P Borgesen
Journal of Materials Research 26 (3), 455-466, 2011
1142011
Computational fluid dynamics modeling and online monitoring of aerosol jet printing process
R Salary, JP Lombardi, M Samie Tootooni, R Donovan, PK Rao, ...
Journal of Manufacturing Science and Engineering 139 (2), 021015, 2017
1072017
Interconnect structures containing blocked segments to minimize stress migration and electromigration damage
CY Li, P Borgesen, MA Korhonen
US Patent 5,439,731, 1995
1001995
Influence of plating parameters and solution chemistry on the voiding propensity at electroplated copper–solder interface: Plating in acidic copper solution with and without …
Y Liu, J Wang, L Yin, P Kondos, C Parks, P Borgesen, DW Henderson, ...
Journal of applied electrochemistry 38, 1695-1705, 2008
902008
Thermal‐stress‐induced voiding in narrow, passivated Cu lines
P Bo/rgesen, JK Lee, R Gleixner, CY Li
Applied physics letters 60 (14), 1706-1708, 1992
811992
Pb-free solder: New materials considerations for microelectronics processing
P Borgesen, T Bieler, LP Lehman, EJ Cotts
MRS bulletin 32 (4), 360-365, 2007
702007
Beam-Solid Interactions: Physical Phenomena
JA Knapp, P Børgesen, RA Zuhr
Materials Research Society Symposium Proceedings 157, 1990
70*1990
Depth profiling by ion-beam spectrometry
P Borgesen, R Behrisch, BMU Scherzer
Applied Physics A 27 (4), 183-195, 1982
691982
The effect of Sn grain number and orientation on the shear fatigue life of SnAgCu solder joints
B Arfaei, Y Xing, J Woods, J Wolcott, P Tumne, P Borgesen, E Cotts
2008 58th Electronic Components and Technology Conference, 459-465, 2008
682008
Do thermal spikes contribute to the ion‐induced mixing of Ni into Zr, Ti, and Pd?
P Borgesen, DA Lilienfeld, HH Johnson
Applied Physics Letters 57 (14), 1407-1409, 1990
671990
Stress‐migration related electromigration damage mechanism in passivated, narrow interconnects
CY Li, P Borgesen, TD Sullivan
Applied physics letters 59 (12), 1464-1466, 1991
611991
Assessment of solder joint fatigue life under realistic service conditions
S Hamasha, Y Jaradat, A Qasaimeh, M Obaidat, P Borgesen
Journal of Electronic Materials 43 (12), 4472-4484, 2014
592014
Electronic sputtering of solid nitrogen and oxygen by keV electrons
O Ellegaard, J Schou, H Sørensen, P Børgesen
Surface science 167 (2-3), 474-492, 1986
591986
Solder joint reliability under realistic service conditions
P Borgesen, S Hamasha, M Obaidat, V Raghavan, X Dai, M Meilunas, ...
Microelectronics Reliability 53 (9-11), 1587-1591, 2013
582013
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