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Hamideh Rostami
Hamideh Rostami
ASML Holding Semiconductor company
Adresse e-mail validée de asml.com
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An M/M/c queue model for hub covering location problem
M Mohammadi, F Jolai, H Rostami
Mathematical and Computer Modelling 54 (11-12), 2623-2638, 2011
1312011
A multi-objective imperialist competitive algorithm for a capacitated hub covering location problem
M Mohammadi, R Tavakkoli-Moghaddam, R Rostami
International Journal of Industrial Engineering Computations 2 (3), 671-688, 2011
652011
Review of data mining applications for quality assessment in manufacturing industry: support vector machines
H Rostami, JY Dantan, L Homri
International Journal of Metrology and Quality Engineering 6 (4), 401, 2015
632015
Automatic equipment fault fingerprint extraction for the fault diagnostic on the batch process data
H Rostami, J Blue, C Yugma
Applied Soft Computing 68, 972-989, 2018
392018
Equipment Condition Diagnosis and Fault Fingerprint Extraction in Semiconductor Manufacturing
Hamideh Rostami, Jakey Blue, Claude Yugma
Machine Learning and Applications (ICMLA), 2016 15th IEEE International …, 2016
24*2016
Hub covering location problem under capacity constraints
R Ghodsi, M Mohammadi, H Rostami
2010 Fourth Asia International Conference on Mathematical/Analytical …, 2010
182010
Genetic and improved shuffled frog leaping algorithms for a 2-stage model of a hub covering location network
M Mohammadi, MR TAVAKKOLI, A Ghodratnama, H Rostami
INTERNATIONAL JOURNAL OF INDUSTRIAL ENGINEERING AND PRODUCTION RESEARCH …, 2011
82011
Equipment deterioration modeling and cause diagnosis in semiconductor manufacturing
H Rostami, J Blue, A Chen, C Yugma
International Journal of Intelligent Systems 36 (6), 2618-2638, 2021
62021
Identification of customer churn determinants using censored log file data in the Iranian mobile telecommunications service industry
A Keramati, A Azadeh, M Mohammadi, H Rostami
International Journal of Electronic Customer Relationship Management 5 (2 …, 2011
62011
A genetic-based SVM approach for quality data classification
W Zouhri, H Rostami, L Homri, JY Dantan
Artificial Intelligence and Industrial Applications: Smart Operation …, 2021
52021
Equipment Anomaly Detection and Automatic Fault Fingerprint Extraction in Semiconductor Manufacturing
H Rostami, J Blue, C Yugma
Proceedings of the 2016 International Symposium on Semiconductor …, 2016
42016
Equipment health modeling for deterioration prognosis and fault signatures diagnosis
H Rostami, J Blue, C Yugma, J Pinaton
2017 28th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC …, 2017
32017
Genetic and hybrid shuffled frog leaping algorithms for solving a 2-stage model for a hub covering location network
M Mohammadi, R Tavakkoli-Moghaddam, H Rostami
2011 Fourth International Conference on Modeling, Simulation and Applied …, 2011
22011
Equipment Behavior Modelling for Fault Diagnosis and Deterioration Prognosis in Semiconductor Manufacturing
H Rostami
Université de Lyon, 2018
2018
FDC-based Equipment Deterioration Modeling and the Root Cause Identification in Semiconductor Industry
H Rostami, J Blue, C Yugma
18th European advanced process control and manufacturing (apc|m) Conference, 2018
2018
Equipment Health Diagnosis and Prognosis using a Wavelet-based Windowing Approach in Semiconductor Manufacturing
H Rostami, J Blue, C Yugma
Advanced Process Control Conference, 2017
2017
Equipment Deterioration Prognosis and Fault Diagnosis in Semiconductor Manufacturing
H Rostami, J Blue, C Yugma
European advanced process control and manufacturing (apc| m) Conference, 2017
2017
Hub Covering Location Problem under Capacity Constraints
M Mohammadi, H Rostami
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