Statistical analysis of the charge collected in SOI and bulk devices under heavy lon and proton irradiation—Implications for digital SETs V Ferlet-Cavrois, P Paillet, M Gaillardin, D Lambert, J Baggio, ...
IEEE Transactions on Nuclear Science 53 (6), 3242-3252, 2006
197 2006 New insights into single event transient propagation in chains of inverters—Evidence for propagation-induced pulse broadening V Ferlet-Cavrois, P Paillet, D McMorrow, N Fel, J Baggio, S Girard, ...
IEEE Transactions on Nuclear Science 54 (6), 2338-2346, 2007
175 2007 Impact of heavy ion energy and nuclear interactions on single-event upset and latchup in integrated circuits PE Dodd, JR Schwank, MR Shaneyfelt, JA Felix, P Paillet, ...
IEEE Transactions on Nuclear Science 54 (6), 2303-2311, 2007
145 2007 Effects of particle energy on proton-induced single-event latchup JR Schwank, MR Shaneyfelt, J Baggio, PE Dodd, JA Felix, ...
IEEE transactions on nuclear science 52 (6), 2622-2629, 2005
129 2005 Radiation effects on silica-based preforms and optical fibers—I: Experimental study with canonical samples S Girard, Y Ouerdane, G Origlio, C Marcandella, A Boukenter, N Richard, ...
IEEE Transactions on Nuclear Science 55 (6), 3473-3482, 2008
112 2008 Proton-and gamma-induced effects on erbium-doped optical fibers S Girard, B Tortech, E Regnier, M Van Uffelen, A Gusarov, Y Ouerdane, ...
IEEE transactions on nuclear science 54 (6), 2426-2434, 2007
103 2007 Radiation effects on Ytterbium-and Ytterbium/Erbium-doped double-clad optical fibers S Girard, Y Ouerdane, B Tortech, C Marcandella, T Robin, B Cadier, ...
IEEE Transactions on Nuclear Science 56 (6), 3293-3299, 2009
84 2009 14-MeV Neutron, S Girard, J Baggio, J Bisutti
IEEE Transactions on Nuclear Science 53 (6), 3750-3757, 2006
76 2006 Effects of total dose irradiation on single-event upset hardness JR Schwank, MR Shaneyfelt, JA Felix, PE Dodd, J Baggio, ...
IEEE transactions on nuclear science 53 (4), 1772-1778, 2006
75 2006 Single event upsets induced by 1–10 MeV neutrons in static-RAMs using mono-energetic neutron sources J Baggio, D Lambert, V Ferlet-Cavrois, P Paillet, C Marcandella, ...
IEEE Transactions on Nuclear Science 54 (6), 2149-2155, 2007
68 2007 Charge enhancement effect in NMOS bulk transistors induced by heavy ion irradiation-comparison with SOI V Ferlet-Cavrois, G Vizkelethy, P Paillet, A Torres, JR Schwank, ...
IEEE transactions on nuclear science 51 (6), 3255-3262, 2004
68 2004 SEU sensitivity of bulk and SOI technologies to 14-MeV neutrons G Gasiot, V Ferlet-Cavrois, J Baggio, P Roche, P Flatresse, A Guyot, ...
IEEE Transactions on Nuclear Science 49 (6), 3032-3037, 2002
66 2002 Effects of angle of incidence on proton and neutron-induced single-event latchup JR Schwank, MR Shaneyfelt, J Baggio, PE Dodd, JA Felix, ...
IEEE transactions on nuclear science 53 (6), 3122-3131, 2006
61 2006 New constraints for plasma diagnostics development due to the harsh environment of MJ class lasers JL Bourgade, V Allouche, J Baggio, C Bayer, F Bonneau, C Chollet, ...
Review of scientific instruments 75 (10), 4204-4212, 2004
61 2004 Diagnostic components in harsh radiation environments: Possible overlap in R&D requirements of inertial confinement and magnetic fusion systems JL Bourgade, AE Costley, R Reichle, ER Hodgson, W Hsing, V Glebov, ...
Review of Scientific Instruments 79 (10), 10F304, 2008
58 2008 Transient optical absorption in pulsed-X-ray-irradiated pure-silica-core optical fibers: Influence of self-trapped holes S Girard, DL Griscom, J Baggio, B Brichard, F Berghmans
Journal of non-crystalline Solids 352 (23-25), 2637-2642, 2006
55 2006 Issues for single-event proton testing of SRAMs JR Schwank, PE Dodd, MR Shaneyfelt, JA Felix, GL Hash, ...
IEEE transactions on nuclear science 51 (6), 3692-3700, 2004
55 2004 Analysis of proton/neutron SEU sensitivity of commercial SRAMs-application to the terrestrial environment test method J Baggio, V Ferlet-Cavrois, H Duarte, O Flament
IEEE transactions on nuclear science 51 (6), 3420-3426, 2004
51 2004 Neutron-induced SEU in bulk SRAMs in terrestrial environment: Simulations and experiments D Lambert, J Baggio, V Ferlet-Cavrois, O Flament, F Saigne, B Sagnes, ...
IEEE transactions on nuclear science 51 (6), 3435-3441, 2004
50 2004 Heavy ion microbeam-and broadbeam-induced transients in SiGe HBTs JA Pellish, RA Reed, D McMorrow, G Vizkelethy, VF Cavrois, J Baggio, ...
IEEE Transactions on Nuclear Science 56 (6), 3078-3084, 2009
49 2009 