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Jae Yeon Baek
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Year
High-performance Si microwire photovoltaics
MD Kelzenberg, DB Turner-Evans, MC Putnam, SW Boettcher, RM Briggs, ...
Energy & Environmental Science 4 (3), 866-871, 2011
2422011
Effects of dispersion conditions of single-walled carbon nanotubes on the electrical characteristics of thin film network transistors
SN Barman, MC LeMieux, J Baek, R Rivera, Z Bao
ACS applied materials & interfaces 2 (9), 2672-2678, 2010
562010
Energy Environ. Sci. 4, 866 (2011)
MD Kelzenberg, DB Turner-Evans, MC Putnam, SW Boettcher, RM Briggs, ...
11
Optimization of blended virtual and actual metrology schemes
JYC Baek, CJ Spanos
Metrology, Inspection, and Process Control for Microlithography XXVI 8324 …, 2012
102012
Predicting congressional votes based on campaign finance data
S Smith, JY Baek, Z Kang, D Song, L El Ghaoui, M Frank
2012 11th International Conference on Machine Learning and Applications 1 …, 2012
92012
Optimal training and efficient model selection for parameterized large margin learning
Y Zhou, JY Baek, D Li, CJ Spanos
Advances in Knowledge Discovery and Data Mining: 20th Pacific-Asia …, 2016
82016
Energy & Environ
MD Kelzenberg, DB Turner-Evans, MC Putnam, SW Boettcher, RM Briggs, ...
Sci 4, 866-871, 2011
52011
Real-time inspection system utilizing scatterometry pupil data
JY Baek, P Leray, AL Charley, CJ Spanos
Journal of Micro/Nanolithography, MEMS, and MOEMS 13 (4), 041403-041403, 2014
42014
Enhancing metrology by combining spatial variability and global inference
CJ Spanos, JY Baek
Metrology, Inspection, and Process Control for Microlithography XXVII 8681 …, 2013
32013
Pattern Analysis of Movement Behavior of Medaka (Oryzias latipes): A Decision Tree Approach
S Lee, J Kim, JY Baek, MW Han, S Kim, TS Chon
Computer Analysis of Images and Patterns: 11th International Conference …, 2005
22005
Modeling and Selection for Real-time Wafer-to-Wafer Fault Detection Applications
JY Baek
University of California, Berkeley, 2015
12015
Performance Evaluation of Blended Metrology Schemes Incorporating Virtual Metrology
JY Baek, CJ Spanos
IEEE transactions on semiconductor manufacturing 26 (4), 506-515, 2013
12013
Pattern Classification and Recognition of Movement Behavior of Medaka (Oryzias Latipes) Using Decision Tree
S Lee, J Kim, JY Baek, MW Han, TS Chon
International Conference on Fuzzy Systems and Knowledge Discovery, 186-195, 2005
12005
Movement Analysis of Medaka (Oryzias Latipes) for an Insecticide Using Decision Tree
S Lee, J Kim, JY Baek, MW Han, CW Ji, TS Chon
Discovery Science: 8th International Conference, DS 2005, Singapore, October …, 2005
12005
Detectability of Multiple Slice Breast Cone Beam Computed Tomography Images
M Han, B Kim, J Baek
MEDICAL PHYSICS 44 (6), 3141-3141, 2017
2017
SU‐G‐IeP2‐01: A Method to Reduce Information Loss in JPEG Compressed Medical Images Using Richardson‐Lucy Deconvolution
Y Choi, M Han, J Baek
Medical Physics 43 (6Part26), 3655-3655, 2016
2016
SU‐G‐IeP2‐08: Investigation On Signal Detectability in Volumetric Cone Beam CT Images with Anatomical Background
M Han, J Baek
Medical Physics 43 (6Part26), 3657-3657, 2016
2016
2013 Index IEEE Transactions on Semiconductor Manufacturing Vol. 26
JY Baek, K Bandy, G Bano, H Bartolf, L Benfu, JP Bickford, J Blue, ...
IEEE Transactions on Semiconductor Manufacturing 26 (4), 629, 2013
2013
Effect of Periodic Virtual Metrology Recalibration on Blended Metrology Schemes
JYC Baek
2012
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Articles 1–19