X-ray reflecto-interferometer based on compound refractive lenses S Lyatun, D Zverev, P Ershov, I Lyatun, O Konovalov, I Snigireva, ... Journal of synchrotron radiation 26 (5), 1572-1581, 2019 | 13 | 2019 |
Effect of annealing on structural and optical properties of Cu2ZnSnS4 thin films grown by pulsed laser deposition GD Surgina, VN Nevolin, IP Sipaylo, PE Teterin, SS Medvedeva, ... Thin Solid Films 594, 74-79, 2015 | 13 | 2015 |
Martensitic transformation behavior of Ni2. 44Mn0. 48Ga1. 08 thin glass-coated microwire S Shevyrtalov, A Zhukov, I Lyatun, S Medvedeva, H Miki, V Zhukova, ... Journal of Alloys and Compounds 745, 217-221, 2018 | 5 | 2018 |
Features of the phase formation in Ni-Mn-In Heusler alloy thin films AI Grunin, AY Goikhman, VV Rodionova, SS Medvedeva Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques …, 2015 | 4 | 2015 |
Radial elemental and phase separation in Ni-Mn-Ga glass-coated microwires S Shevyrtalov, A Zhukov, S Medvedeva, I Lyatun, V Zhukova, ... Journal of Applied Physics 123 (17), 2018 | 3 | 2018 |
Optical and structural properties of Cu2ZnSnS4 thin films obtained by pulsed laser deposition in a H2S atmosphere with subsequent annealing in a N2 atmosphere GD Teterina, VN Nevolin, IP Sipaylo, SS Medvedeva, PE Teterin Semiconductors 50, 549-554, 2016 | 3 | 2016 |
Porous membranes on a basis of phase-separated alkali borosilicate glasses that contain PbO and F additives T Antropova, L Ermakova, S Medvedeva, M Sidorova GLASS SCIENCE AND TECHNOLOGY 77, 193-198, 2004 | 3 | 2004 |
X-ray reflecto-interferometer based on compound refractive lenses for thin-films study M Voevodina, S Lyatun, A Barannikov, I Lyatun, D Zverev, I Snigireva, ... AIP Conference Proceedings 2299 (1), 2020 | 1 | 2020 |
X-ray interferometry technique using an x-ray microfocus laboratory source M Voevodina, S Lyatun, A Barannikov, I Lyatun, I Snigireva, A Snigirev Advances in Metrology for X-Ray and EUV Optics IX 11492, 92-97, 2020 | 1 | 2020 |
Martensitic transformation in Cu-doped Ni–Fe-Ga rapidly quenched ribbon S Shevyrtalov, I Lyatun, A Grunin, T Ryba, S Lyatun, K Chichay, ... Physica B: Condensed Matter 583, 412048, 2020 | 1 | 2020 |
Исследование изменения параметров тонкопленочных структур в процессе ионной имплантации ЧПН Медведева С. С., Коива Д. А., Шемухин А. А. Вестник Балтийского федерального университета им. И. Канта. Серия: ФИЗИКО …, 2014 | 1 | 2014 |
Unusual Role of N-Methylmorpholine N-Oxide in the Radical Polymerization of Acrylonitrile RV Toms, SS Medvedeva, AY Gerval’d, NI Prokopov, AV Plutalova, ... Polymer Science, Series B 64 (5), 623-635, 2022 | | 2022 |
Thin layer imaging approach by X-ray amplitude splitting interferometer based on compound refractive lens D Zverev, M Voevodina, S Lyatun, I Snigireva, A Snigirev EUV and X-ray Optics, Sources, and Instrumentation 11776, 43-49, 2021 | | 2021 |
X-ray interferometry technique for thin-films study using an x-ray microfocus laboratory source M Voevodina, S Lyatun, D Zverev, A Barannikov, I Lyatun, I Snigireva, ... EUV and X-ray Optics, Sources, and Instrumentation 11776, 37-42, 2021 | | 2021 |
X-ray Reflecto-Interferometry Technique Using a Microfocus Laboratory Source MA Voevodina, SS Lyatun, AA Barannikov, II Lyatun, II Snigireva, ... Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques …, 2021 | | 2021 |
The influence of beryllium microstructure and impurities on the CRL x-ray optical properties I Lyatun, S Lyatun, I Snigireva, A Snigirev AIP Conference Proceedings 2299 (1), 2020 | | 2020 |
Refractive optics based x-ray reflecto-interferometry S Lyatun, I Lyatun, D Zverev, O Konovalov, I Snigireva, A Snigirev Advances in X-Ray/EUV Optics and Components XV 11491, 57-65, 2020 | | 2020 |
X-ray thin-film interferometry technique using an X-ray microfocus laboratory source M Voevodina, S Lyatun, D Zverev, A Barannikov, I Lyatun, O Konovalov, ... | | 2019 |
On the use of a ZrO x -SiO2 multilayer structure as a test sample for high-resolution X-ray microscopy SS Medvedeva, II Lyatun, PA Ershov, AY Goikhman, II Snigireva, ... Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques …, 2015 | | 2015 |
МНОГОСЛОЙНАЯ СТРУКТУРА ТИПА ZrOx/SiO2 КАК ТЕСТОВЫЙ ОБЪЕКТ ДЛЯ ВЫСОКОРАЗРЕШАЮЩЕЙ РЕНТГЕНОВСКОЙ МИКРОСКОПИИ СС Медведева, ИИ Лятун, ПА Ершов, АЮ Гойхман, ИИ Снигирева, ... Поверхность. Рентгеновские, синхротронные и нейтронные исследования, 29-29, 2015 | | 2015 |