Suivre
Portal Jean-Michel
Portal Jean-Michel
Full Professor Aix-Marseille Université - IM2NP
Adresse e-mail validée de univ-amu.fr
Titre
Citée par
Citée par
Année
Testing the interconnect of RAM-based FPGAs
M Renovell, JM Portal, J Figueras, Y Zorian
IEEE Design & Test of Computers 15 (01), 45-50, 1998
2091998
PAH dissipation in a contaminated river sediment under oxic and anoxic conditions
C Quantin, EJ Joner, JM Portal, J Berthelin
Environmental Pollution 134 (2), 315-322, 2005
1262005
Robust compact model for bipolar oxide-based resistive switching memories
M Bocquet, D Deleruyelle, H Aziza, C Muller, JM Portal, T Cabout, ...
IEEE transactions on electron devices 61 (3), 674-681, 2014
1212014
Synchronous non-volatile logic gate design based on resistive switching memories
W Zhao, M Moreau, E Deng, Y Zhang, JM Portal, JO Klein, M Bocquet, ...
IEEE Transactions on Circuits and Systems I: Regular Papers 61 (2), 443-454, 2013
1052013
Eeprom memory: threshold voltage built in self diagnosis
JM Portal, H Aziza
International Test Conference, 2003. Proceedings. ITC 2003., 23-23, 2003
1002003
EEPROM diagnosis based on threshold voltage embedded measurement
JM Portal, H Aziza, D Née
Journal of Electronic Testing 21 (1), 33-42, 2005
882005
Definition of an innovative filling structure for digital blocks: the DFM filler cell
L Remy, P Coll, F Picot, P Mico, JM Portal
2009 16th IEEE International Conference on Electronics, Circuits and Systems …, 2009
872009
Self-consistent physical modeling of set/reset operations in unipolar resistive-switching memories
M Bocquet, D Deleruyelle, C Muller, JM Portal
Applied Physics Letters 98 (26), 263507, 2011
702011
In-Memory and Error-Immune Differential RRAM Implementation of Binarized Deep Neural Networks
M Bocquet, T Hirztlin, JO Klein, E Nowak, E Vianello, JM Portal, ...
2018 IEEE International Electron Devices Meeting (IEDM), 20.6. 1-20.6. 4, 2018
682018
Study on the mineralization and degradation of isoproturon in three soils
M Pieuchot, C Perrin-Ganier, JM Portal, M Schiavon
Chemosphere 33 (3), 467-478, 1996
641996
IS-FPGA: a new symmetric FPGA architecture with implicit scan
M Renovell, P Faure, JM Portal, J Figueras, Y Zorian
Proceedings International Test Conference 2001 (Cat. No. 01CH37260), 924-931, 2001
622001
SRAM-based FPGA's: testing the LUT/RAM modules
M Renovell, JM Portal, J Figueras, Y Zorian
Proceedings International Test Conference 1998 (IEEE Cat. No. 98CH36270 …, 1998
601998
La pollution de l'eau par les produits phytosanitaires: état et origine
M Schiavon, C Perrin-Ganier, JM Portal
Agronomie 15 (3-4), 157-170, 1995
501995
RRAM-based FPGA for" Normally off, Instantly on" Applications
O Turkyilmaz, S Onkaraiah, M Reyboz, F Clermidy, C Anghel, JM Portal, ...
Proceedings of the 2012 IEEE/ACM International Symposium on Nanoscale …, 2012
482012
Bipolar ReRAM based non-volatile flip-flops for low-power architectures
S Onkaraiah, M Reyboz, F Clermidy, JM Portal, M Bocquet, C Muller, ...
10th IEEE international NEWCAS conference, 417-420, 2012
472012
Test pattern and test configuration generation methodology for the logic of RAM-based FPGA
M Renovell, JM Portal, J Figueras, Y Zorian
Proceedings Sixth Asian Test Symposium (ATS'97), 254-259, 1997
451997
Availability and persistence of isoproturon under field and laboratory conditions
C Perrin-Ganier, C Breuzin, JM Portal, M Schiavon
Ecotoxicology and Environmental Safety 35 (3), 226-230, 1996
441996
Digital biologically plausible implementation of binarized neural networks with differential hafnium oxide resistive memory arrays
T Hirtzlin, M Bocquet, B Penkovsky, JO Klein, E Nowak, E Vianello, ...
Frontiers in neuroscience 13, 1383, 2020
432020
Minimizing the number of test configurations for different FPGA families
M Renovell, JM Portal, J Figuras, Y Zorian
Proceedings Eighth Asian Test Symposium (ATS'99), 363-368, 1999
421999
SRAM-based FPGAs: Testing the embedded RAM modules
M Renovell, JM Portal, J Figueras, Y Zorian
Journal of Electronic Testing 14 (1), 159-167, 1999
381999
Le système ne peut pas réaliser cette opération maintenant. Veuillez réessayer plus tard.
Articles 1–20