Pavel Jelínek
Pavel Jelínek
Institute of Physics, Czech Academy of Sciences, Czech Republic
Adresse e-mail validée de fzu.cz - Page d'accueil
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Chemical identification of individual surface atoms by atomic force microscopy
Y Sugimoto, P Pou, M Abe, P Jelinek, R Pérez, S Morita, O Custance
Nature 446 (7131), 64-67, 2007
7442007
Mechanism of high-resolution STM/AFM imaging with functionalized tips
P Hapala, G Kichin, C Wagner, FS Tautz, R Temirov, P Jelínek
Physical Review B 90 (8), 085421, 2014
3352014
Complex patterning by vertical interchange atom manipulation using atomic force microscopy
Y Sugimoto, P Pou, O Custance, P Jelinek, M Abe, R Perez, S Morita
Science 322 (5900), 413-417, 2008
2782008
Multicenter approach to the exchange-correlation interactions in ab initio tight-binding methods
P Jelínek, H Wang, JP Lewis, OF Sankey, J Ortega
Physical Review B 71 (23), 235101, 2005
2552005
Advances and applications in the FIREBALL ab initio tight‐binding molecular‐dynamics formalism
JP Lewis, P Jelínek, J Ortega, AA Demkov, DG Trabada, B Haycock, ...
physica status solidi (b) 248 (9), 1989-2007, 2011
1782011
Single atomic contact adhesion and dissipation in dynamic force microscopy
N Oyabu, P Pou, Y Sugimoto, P Jelinek, M Abe, S Morita, R Pérez, ...
Physical review letters 96 (10), 106101, 2006
1542006
New insights on atomic-resolution frequency-modulation Kelvin-probe force-microscopy imaging of semiconductors
S Sadewasser, P Jelinek, CK Fang, O Custance, Y Yamada, Y Sugimoto, ...
Physical review letters 103 (26), 266103, 2009
1532009
Mechanism for room-temperature single-atom lateral manipulations on semiconductors using dynamic force microscopy
Y Sugimoto, P Jelinek, P Pou, M Abe, S Morita, R Perez, O Custance
Physical review letters 98 (10), 106104, 2007
1432007
Origin of high-resolution IETS-STM images of organic molecules with functionalized tips
P Hapala, R Temirov, FS Tautz, P Jelínek
Physical review letters 113 (22), 226101, 2014
1422014
Interplay of conductance, force, and structural change in metallic point contacts
M Ternes, C González, CP Lutz, P Hapala, FJ Giessibl, P Jelínek, ...
Physical review letters 106 (1), 016802, 2011
1292011
Optimized atomic-like orbitals for first-principles tight-binding molecular dynamics
MA Basanta, YJ Dappe, P Jelínek, J Ortega
Computational materials science 39 (4), 759-766, 2007
1222007
First-principles simulations of STM images: From tunneling to the contact regime
JM Blanco, C González, P Jelínek, J Ortega, F Flores, R Pérez
Physical Review B 70 (8), 085405, 2004
1082004
‘All-inclusive’imaging of the rutile TiO2 (110) surface using NC-AFM
R Bechstein, C González, J Schütte, P Jelínek, R Pérez, A Kühnle
Nanotechnology 20 (50), 505703, 2009
962009
Forces and currents in carbon nanostructures: are we imaging atoms?
M Ondráček, P Pou, V Rozsíval, C González, P Jelínek, R Pérez
Physical review letters 106 (17), 176101, 2011
922011
Recognition tunneling
S Lindsay, J He, O Sankey, P Hapala, P Jelinek, P Zhang, S Chang, ...
Nanotechnology 21 (26), 262001, 2010
892010
The effect of hydration number on the interfacial transport of sodium ions
J Peng, D Cao, Z He, J Guo, P Hapala, R Ma, B Cheng, J Chen, WJ Xie, ...
Nature 557 (7707), 701-705, 2018
852018
Real topography, atomic relaxations, and short-range chemical interactions in atomic force microscopy: The case of the α− Sn∕ Si (111)−(3× 3) R 30° surface
Y Sugimoto, P Pou, Ó Custance, P Jelinek, S Morita, R Pérez, M Abe
Physical Review B 73 (20), 205329, 2006
852006
First-principles simulations of the stretching and final breaking of Al nanowires: mechanical properties and electrical conductance
P Jelínek, R Pérez, J Ortega, F Flores
Physical Review B 68 (8), 085403, 2003
852003
Theoretical analysis of electronic band structure of 2-to 3-nm Si nanocrystals
P Hapala, K Kůsová, I Pelant, P Jelínek
Physical Review B 87 (19), 195420, 2013
842013
Combined AFM and STM measurements of a silicene sheet grown on the Ag (111) surface
Z Majzik, MR Tchalala, M Švec, P Hapala, H Enriquez, A Kara, AJ Mayne, ...
Journal of Physics: Condensed Matter 25 (22), 225301, 2013
802013
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