Application of hardness-by-design methodology to radiation-tolerant ASIC technologies RC Lacoe, JV Osborn, R Koga, S Brown, DC Mayer
IEEE Transactions on Nuclear Science 47 (6), 2334-2341, 2000
226 2000 CEPPAD: Comprehensive energetic particle and pitch angle distribution experiment on POLAR JB Blake, JF Fennell, LM Friesen, BM Johnson, WA Kolasinski, DJ Mabry, ...
Space Science Reviews 71, 531-562, 1995
216 1995 RF MEMS switch JV Osborn
US Patent 6,426,687, 2002
144 2002 CRRES magnetic electron spectrometer AFGL-701-5A (MEA) AL Vampola, JV Osborn, BM Johnson
Journal of Spacecraft and Rockets 29 (4), 592-595, 1992
116 1992 Total dose hardness of three commercial CMOS microelectronics foundries JV Osborn, RC Lacoe, DC Mayer, G Yabiku
RADECS 97. Fourth European Conference on Radiation and its Effects on …, 1997
93 1997 Radiation Hardness of WM Tong, JJ Yang, PJ Kuekes, DR Stewart, RS Williams, E DeIonno, ...
IEEE Transactions on Nuclear Science 57 (3), 1640-1643, 2010
88 2010 Dose-rate sensitivity of modern nMOSFETs SC Witczak, RC Lacoe, JV Osborn, JM Hutson, SC Moss
IEEE transactions on nuclear science 52 (6), 2602-2608, 2005
84 2005 A method for characterizing a microprocessor's vulnerability to SEU JH Elder, J Osborn, WA Kolasinski, R Koga
IEEE Transactions on Nuclear Science 35 (6), 1678-1681, 1988
72 1988 SEU test techniques for 256 K static RAMs and comparisons of upsets by heavy ions and protons R Koga, WA Kolasinski, JV Osborn, JH Elder, R Chitty
IEEE Transactions on Nuclear Science 35 (6), 1638-1643, 1988
69 1988 Experimental and analytical investigation of single event, multiple bit upsets in poly-silicon load, 64 K* 1 NMOS SRAMs Y Song, KN Vu, JS Cable, AA Witteles, WA Kolasinski, R Koga, JH Elder, ...
IEEE Transactions on Nuclear Science 35 (6), 1673-1677, 1988
67 1988 Total-dose tolerance of the commercial Taiwan Semiconductor Manufacturing Company (TSMC) 0.35-/spl mu/m CMOS process RC Lacoe, JV Osborn, DC Mayer, S Brown, J Gambles
2001 IEEE Radiation Effects Data Workshop. NSREC 2001. Workshop Record. Held …, 2001
52 2001 Reliability enhancement in high-performance MOSFETs by annular transistor design DC Mayer, RC Lacoe, EE King, JV Osborn
IEEE Transactions on Nuclear Science 51 (6), 3615-3620, 2004
47 2004 Microelectromechanical system optical sensor providing bit image data of a viewed image JV Osborn
US Patent 6,861,633, 2005
44 2005 Microelectromechanical system optical sensor providing bit image data of a viewed image JV Osborn
US Patent 6,861,633, 2005
44 2005 Displacement Damage in TiO E DeIonno, MD Looper, JV Osborn, JW Palko
IEEE Transactions on Nuclear Science 60 (2), 1379-1383, 2013
38 2013 Diode isolated thin film fuel cell array addressing method DC Mayer, JV Osborn, SW Janson, PD Fuqua
US Patent 6,403,403, 2002
37 2002 A TID and SEE radiation-hardened, wideband, low-noise amplifier B Mossawir, IR Linscott, US Inan, JL Roeder, JV Osborn, SC Witczak, ...
IEEE Transactions on Nuclear Science 53 (6), 3439-3448, 2006
35 2006 Total-dose radiation tolerance of a commercial 0.35/spl mu/m CMOS process RC Lacoe, JV Osborn, DC Mayer, S Brown, DR Hunt
1998 IEEE Radiation Effects Data Workshop. NSREC 98. Workshop Record. Held …, 1998
35 1998 Radiation effects studies on thin film TiO2 memristor devices E Deionno, MD Looper, JV Osborn, HJ Barnaby, WM Tong
2013 IEEE Aerospace Conference, 1-8, 2013
30 2013 Stroboscopic imaging interferometer for MEMS performance measurement JA Conway, JV Osborn, JD Fowler
Journal of Microelectromechanical Systems 16 (3), 668-674, 2007
28 2007 