Suivre
Jean-Michel VINASSA
Jean-Michel VINASSA
Professor, Bordeaux Institute of Technology
Adresse e-mail validée de ims-bordeaux.fr
Titre
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Année
Behavior and state-of-health monitoring of Li-ion batteries using impedance spectroscopy and recurrent neural networks
A Eddahech, O Briat, N Bertrand, JY Delétage, JM Vinassa
International Journal of Electrical Power & Energy Systems 42 (1), 487-494, 2012
4472012
Hybrid energy storage systems for renewable energy sources integration in microgrids: A review
A Etxeberria, I Vechiu, H Camblong, JM Vinassa
2010 Conference Proceedings IPEC, 532-537, 2010
2332010
Lithium battery aging model based on Dakin’s degradation approach
I Baghdadi, O Briat, JY Delétage, P Gyan, JM Vinassa
Journal of Power Sources 325, 273-285, 2016
2122016
Comparison of three topologies and controls of a hybrid energy storage system for microgrids
A Etxeberria, I Vechiu, H Camblong, JM Vinassa
Energy Conversion and Management 54 (1), 113-121, 2012
1962012
Characterization methods and modelling of ultracapacitors for use as peak power sources
W Lajnef, JM Vinassa, O Briat, S Azzopardi, E Woirgard
Journal of Power Sources 168 (2), 553-560, 2007
1952007
Performance comparison of four lithium–ion battery technologies under calendar aging
A Eddahech, O Briat, JM Vinassa
Energy 84, 542-550, 2015
1912015
Thermal characterization of a high-power lithium-ion battery: Potentiometric and calorimetric measurement of entropy changes
A Eddahech, O Briat, JM Vinassa
Energy 61, 432-439, 2013
1852013
Determination of lithium-ion battery state-of-health based on constant-voltage charge phase
A Eddahech, O Briat, JM Vinassa
Journal of Power Sources 258, 218-227, 2014
1632014
Remaining useful life prediction of lithium batteries in calendar ageing for automotive applications
A Eddahech, O Briat, E Woirgard, JM Vinassa
Microelectronics Reliability 52 (9-10), 2438-2442, 2012
1602012
Embedded fractional nonlinear supercapacitor model and its parametric estimation method
N Bertrand, J Sabatier, O Briat, JM Vinassa
IEEE Transactions on Industrial Electronics 57 (12), 3991-4000, 2010
1602010
Impact of calendar life and cycling ageing on supercapacitor performance
O Briat, JM Vinassa, N Bertrand, E Woirgard
IEEE Transactions on Vehicular Technology 58 (8), 3917-3929, 2009
1472009
Fractional non-linear modelling of ultracapacitors
N Bertrand, J Sabatier, O Briat, JM Vinassa
Communications in Nonlinear Science and Numerical Simulation 15 (5), 1327-1337, 2010
952010
Lithium-ion battery performance improvement based on capacity recovery exploitation
A Eddahech, O Briat, JM Vinassa
Electrochimica Acta 114, 750-757, 2013
922013
Principle, design and experimental validation of a flywheel-battery hybrid source for heavy-duty electric vehicles
O Briat, JM Vinassa, W Lajnef, S Azzopardi, E Woirgard
Iet electric power Applications 1 (5), 665-674, 2007
792007
State of health assessment for lithium batteries based on voltage–time relaxation measure
I Baghdadi, O Briat, P Gyan, JM Vinassa
Electrochimica Acta 194, 461-472, 2016
772016
Strategy for designing accelerated aging tests to evaluate IGBT power modules lifetime in real operation mode
JM Thebaud, E Woirgard, C Zardini, S Azzopardi, O Briat, JM Vinassa
IEEE Transactions on components and packaging technologies 26 (2), 429-438, 2003
752003
D-optimal design of experiments applied to lithium battery for ageing model calibration
R Mathieu, I Baghdadi, O Briat, P Gyan, JM Vinassa
Energy 141, 2108-2119, 2017
682017
Improved supercapacitor floating ageing interpretation through multipore impedance model parameters evolution
R German, P Venet, A Sari, O Briat, JM Vinassa
IEEE Transactions on Power Electronics 29 (7), 3669-3678, 2013
672013
Online parameter identification for real-time supercapacitor performance estimation in automotive applications
A Eddahech, M Ayadi, O Briat, JM Vinassa
International Journal of Electrical Power & Energy Systems 51, 162-167, 2013
642013
Ageing monitoring of lithium-ion cell during power cycling tests
A Eddahech, O Briat, H Henry, JY Delétage, E Woirgard, JM Vinassa
Microelectronics Reliability 51 (9-11), 1968-1971, 2011
632011
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